• Journal of KIISE:Computer Systems and Theory
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• v.35 no.6
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• pp.284-292
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• 2008

The density of Memory has been increased by great challenge for memory technology; therefore, elements of memory become more smaller than before and the sensitivity to faults increases. As a result of these changes, memory testing becomes more complex. In addition, as the number of storage elements per chip increases, the test cost becomes more remarkable as the cost per transistor drops. Recent development in system-on-chip(SoC) technology makes it possible to incorporate large embedded memories into a chip. However, it also complicates the test process, since usually the embedded memories cannot be controlled from the external environment. We present a ARM processor-programmable built-in self-test(BIST) scheme suitable for embedded memory testing in the SoC environment. The proposed BIST circuit can be programmed vis an on-chip microprocessor.

• Proceedings of the International Microelectronics And Packaging Society Conference
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• 2001.11a
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• pp.146-150
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• 2001

Microwave model and high-frequency measurement of the ACF flip-chip interconnection was investigated using a microwave network analysis. S-parameters of on-chip and substrate were separately measured in the frequency range of 200 MHz to 20 GHz using a microwave network analyzer HP8510 and cascade probe. And the cascade transmission matrix conversion was performed. The same measurements and conversion techniques were conducted on the assembled test chip and substrate at the same frequency range. Then impedance values in ACF flip-chip interconnection were extracted from cascade transmission matrix. ACF flip chip interconnection has only below 0.1nH, and very stable up to 13 GHz. Over the 13 GHz, there was significant loss because of epoxy capacitance of ACF. However, the addition of SiO$_2$filler to the ACF lowered the dielectric constant of the ACF materials resulting in an increase of resonance frequency up to 15 GHz. High frequency behavior of metal Au stud bumps was investigated. The resonance frequency of the metal stud bump interconnects is higher than that of ACF flip-chip interconnects and is not observed at the microwave frequency band. The extracted model parameters of adhesive flip chip interconnects were analyzed with the considerations of the characteristics of material and the design guideline of ACA flip chip for high frequency applications was provided.

• Journal of the Korean Wood Science and Technology
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• v.26 no.1
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• pp.70-75
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• 1998

In this paper, the relationships between volumetric mixing ratio of rubber chip and physical and mechanical properties of wood/rubber composite panel was examined in order to investigate the mixture characteristics of wood and rubber chip. Because of the specific gravity of rubber differed from wood chip, physical properties of wood/rubber composite panel was shown very different values by mixing rate of chip element. Specific gravity in air-dry of composite panel was increased rapidly as volumetric percent of rubber chip was increased. Moisture content of composite panel was decreased as volumetric percent of rubber chip element was increased. This results was considered that wood weight is light and porosity material for moisture absorption. Compressive strength and modulus of rupture in bending test were decreased as volumetric percent of rubber chip increased. By mixing ratio control of chip elements, various wood/rubber composite panel can be applicable to every interior materials such as subfloor, playground, and exterior materials such as road blocks for recreational facilities in garden and forest and city parks.

• Journal of the Microelectronics and Packaging Society
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• v.10 no.3
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• pp.9-17
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• 2003

In this paper, thermo-mechanical and rheological properties of NCPs (Non-Conductive Pastes) depending on silica filler contents and diluent contents were investigated. And then, thermal cycling (T/C) reliability of flip chip assembly using selected NCPs was verified. As the silica filler content increased, thermo-mechanical properties of NCPs were changed. The higher the silica filler content was added, glass transition temperature ($T_g$) and storage modulus at room temperature became higher. While, coefficient of thermal expansion (CTE) decreased. On the other hand, rheological properties of NCPs were significantly affected by diluent content. As the diluent content increased, viscosity of NCP decreased and thixotropic index increased. However, the addition of diluent deteriorated thermo-mechanical properties such as modulus, CTE, and $T_g$. Based on these results, three candidates of NCPs with various silica filler and diluent contents were selected as adhesives for reliability test of flip chip assemblies. T/C reliability test was performed by measuring changes of NCP bump connection resistance. Results showed that flip chip assembly using NCP with lower CTE and higher modulus exhibited better T/C reliability behavior because of reduced shear strain in NCP adhesive layer.

• Journal of the Korean Society for Precision Engineering
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• v.27 no.7
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• pp.7-12
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• 2010

In this paper, chip-on-glass(COG) interconnection with anisotropic conductive film(ACF) using lateral thermosonic bonding technology is considered. In general, thermo-compression bonding which is used in practice for flip-chip bonding suffers from the low productivity due to the long bonding time. It will be shown that the bonding time can be improved by using lateral thermosonic bonding in which lateral ultrasonic vibration together with thermo-compression is utilized. By measuring the internal temperature of ACF, the fast curing of ACF thanks to lateral ultrasonic vibration will be verified. Moreover, to prove the reliability of the lateral thermosonic bonding, observation of pressured mark by conductive particles, shear test, and water absorption test will be conducted.

• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.4
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• pp.203-211
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• 2013

UHF RFID tag designers usually ndde the chip impedance and read power sensitivity value obtained when a tag chip is mounted on a chip pad. The chip impedance, however, is not able to be supplied by chip manufacturer, since the chip impedance is varied according to tag designs and fabrication processes. Instead, the chip makers mostly supply the chip impedances measured on the bare dies. This study proposes a chip impedance and read power sensitivity evaluation method which requires a few simple auxiliary and some RF measuring equipment. As it is impractical to measure the chip impedance directly at mounted chip terminals, some form test fixture is employed and the effect of the fixture is modeled and de-embeded to determine the chip impedance and the read power sensitivity. Validity and accuracy of the proposed de-embed method are examined by using commercial RFID tag chips as well as a capacitor and a resistor the value of which are known.

• Journal of the Korean Society for Precision Engineering
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• v.17 no.12
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• pp.163-168
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• 2000

Once the chip has developed a mixed mode of side-curl and up-curl, it would generally curl to strike the tool flank. The development of the bending stresses and sheat in the chip would ultimately lead to chip failure. This paper approach this problem from a mechanics-based approach, by treating the chip as a 3-D elastic curved beam, and applying appropriate constraints and forces. The expressions for bending, shear and direct stresses are developed through an energy-based criterion. The location of the maximum stresses is also identified and explained for simulated test conditions.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.5
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• pp.203-211
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• 1996

This paper describes CAD tools for the construction of image database in IC chip analysis CAD system. For IC chip analysis by high-resolution microscopy, the image database is essential to manage more than several thousand images. But manual database construction is error-prone and time-consuming. In order to solve this problem, we develop a set of CAD toos that include image grabber to capture chip images, image editor to make the whole chip image database from the grabbed images, and image divider to reconstruct the database that consists of evenly overlapped images for efficient region search. we also develop an interactive pattern matching method for user-friendly image editing, and a heuristic region search method for fast image division. The tools are developed with a high-performance graphic hardware with JPEG image comparession chip to process the huge color image data. The tools are under the field test and experimental resutls show that the database construction time can be redcued in 1/3 compared to manual database construction.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2000.05a
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• pp.730-734
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• 2000

Once the Chip has developed a mixed mode of side-curl and up-curl, it would generally curl to strike the too] flank. The development of the bending stresses and shear in the chip would ultimately lead to chip failure. This paper attacks this problem from a mechanics-based approach. by treating the chip as a 3-D elastic curved beam, and applying appropriate constraints and forces. The expressions for bending. shear and direct stresses are developed through an energy-based criterion. The location of the maximum stresses is also identified and explained for simulated test conditions.

• Journal of Welding and Joining
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• v.20 no.4
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• pp.498-504
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• 2002

Fluxless flip chip bonding process using plasma treatment instead of flux was investigated. The effect of plasma process parameters on tin-oxide etching characteristics were estimated with Auger depth profile analysis. The die shear test was performed to evaluate the adhesion strength of the flip chip bonded after plasma treatment. The thickness of oxide layer on tin surface was reduced after Ar+H2 plasma treatment. The addition of H2 improved the oxide etching characteristics by plasma. The die shear strength of the plasma-treated Sn-Pb solder flip chip was higher than that of non-treated one but lower than that of fluxed one. The difference of the strength between plasma-treated specimen and non-treated one increased with increase in bonding temperature. The plasma-treated flip chip fractured at solder/TSM interface at low bonding temperature while the fracture occurred at solder/UBM interface at higher bonding temperature.