• 생체재료학회지
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• 제22권4호
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• pp.346-351
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• 2018

Background: Carbonate apatite ($CO_3Ap$) and silica-calcium phosphate composite (SCPC) are bone substitutes with good prospect for dental application. SCPC creates a hydroxyapatite surface layer and stimulate bone cell function while, $CO_3Ap$ induce apatite crystal formation with good adaptation providing good seal between cement and the bone. Together, these materials will add favorable properties as a pulp capping material to stimulate mineral barrier and maintain pulp vitality. The aim of this study is to investigate modification of $CO_3Ap$ cement combined with SCPC, later term as $CO_3Ap-SCPC$ cement (CAS) in means of its chemical (Calcium release) and physical properties (setting time, DTS and pH value). Methods: The study consist of three groups; group 1 (100% calcium hydroxide, group 2 $CO_3Ap$ (60% DCPA: 40% vaterite, and group 3 CAS (60% DCPA: 20% vaterite: 20% SCPC. Distilled water was employed as a solution for group 1, and $0.2mol/L\;Na_3PO_4$ used for group 2 and group 3. Samples were evaluated with respect to important properties for pulp capping application such as pH, setting time, mechanical strength and calcium release evaluation. Results: The fastest setting time was in $CO_3Ap$ cement group without SCPC, while the addition of 20% SCPC slightly increase the pH value but did not improved the cement mechanical strength, however, the mechanical strength of both $CO_3Ap$ groups were significantly higher than calcium hydroxide. All three groups released calcium ions and had alkaline pH. Highest pH level, as well as calcium released level, was in the control group. Conclusion: The CAS cement had good mechanical and acceptable chemical properties for pulp capping application compared to calcium hydroxide as a gold standard. However, improvements and in vivo studies are to be carried out with the further development of this material.

• 폴리머
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• 제29권6호
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• pp.593-598
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• 2005

Layer-by-layer(LbL) 자기 조립법에 의한 poly(ethylene-alt-maleic anhydride)(PEMAh)/poly(4-vinyl pyridine)(P4VP) 다층막의 염료 흡착 거동 및 pH 변화에 의한 염료 방출 거동을 Rodamine 6G(R6G)를 지시제로 사용하여 조사하였다. UV-vis 분광 분석을 이용하여 (PEMAh/P4VP)n 다층막의 두께 및 R6G의 흡착 및 방출 거동을 조사하였다. 다층막에 흡착되는 R6G의 흡착량은 필름의 두께 증가에 따라 선형적으로 증가하였다. (PEMAhAh/P4VP)n 다층막의 투과성은 pH 조건에 민감한 거동을 보였으며, 방출액의 pH가 감소할수록 R6G 방출 속도와 방출량은 증가하였다. PEMAh/poly(ethyleneimine)(PEI) capping layer를 (PEMAh/P4VP)n 다층막에 추가로 적층함으로써 흡착된 R6G의 방출 속도를 조절할 수 있었다.

• 한국초전도ㆍ저온공학회논문지
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• 제6권4호
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• pp.1-4
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• 2004

Three group samples with difference thickness of $CeO_2$ capping layer deposited by PLD were studied. Among them, one group $CeO_2$ films were deposited on stainless steel tape coated with IBAD- YSZ and $CeO_2$ buffer layer ($CeO_2$/IBAD-YSZ/SS); other two groups of $CeO_2 YSZ Y_2O_3$multi-layer were deposited on NiW substrates for fabrication of YBCO coated conductor through RABiTS approach. The pulsed laser deposition (PLD) and DC magnetron sputtering were employed to deposit these buffer layers. On the top of buffer layer, YBCO film was deposited by PLD. The effect of thickness of $CeO_2$ film on the texture of $CeO_2$ film and critical current density ($J_c$) of YBCO film were analyzed. For the case $CeO_2$ on $CeO_2$/IBAD-YSZ/SS, there was a self-epitaxy effect with the increase of $CeO_2$ film. For $YSZ/Y_2O_3$ NiW which was deposited by PLD or DC magnetron sputtering, there is not self-epitaxy effect. However, the capping layer of $CeO_2$ film deposited by PLD improved the quality of buffer layer for $YSZ/Y_2O_3$ which was deposited by DC magnetron sputtering, therefore increased the $J_c$ of YBCO film.

• 한국재료학회지
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• 제2권3호
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• pp.180-190
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• 1992

ZMR공정에서 발생하기 쉬운 폴리실리콘의 엉김현상(agglomeration), 슬림, 그리고 실리콘기판이 국부적으로 녹는 현상 등을 방지하기 위한 방법과 재결정화된 박막의 질을 향상시키기 위하여 폴리실리콘과 보호 산화막(capping oxide)두계를 변화시킨 실험 결과를 서술한다. 폴리실리콘의 엉김현상은 폴리실리콘과 보호 산화막 그리고 폴리실리콘과 매몰 산화막(buried oxide)의 계면에서의 wetting각과 관계되는데, 엉김현상을 방지하기 위해서는 암모니아 가스 분위기에서 $1100^{\circ}$C, 3시간 동안 열처리하여 폴리실리콘과 보호 산화막 그리고 폴리실리콘과 매몰 산화막의 계면에 질소를 주입시키면 된다. 실리콘 기판의 뒷면이 국부적으로 녹아 SOI구조가 파괴되는 현상과 슬립은 실리콘 기판의 뒷면을 모래타격(sandblast)하여 약 $20{\mu}m$의 거칠기를 가지도록 했을때 방지할 수 있었다. 재결정화된 폴리실리콘의 두께가 두꺼워짐에 따라 재결정화된 박막에서 subboundary의 간격은 넓어지고, 재결정화된 실리콘 두께의 균일성은 보호 산화막이 두꺼울수록 향상된다. 폴리실리콘의 두께를 $1{\mu}m$로 하였을때 subboundary의 간격은 약 $70-120{\mu}m$정도였고 폴리실리콘의 두께가 $1{\mu}m$이고 보호산화막의 두께가 $2.5{\mu}m$일때, 재결정화 후 실리콘의 두게 균일도는 약 ${\pm}200{\AA}$정도였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 추계학술대회 논문집 Vol.15
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• pp.167-170
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• 2002

The influence of Si surface damage on Ni-silicide with TiN Capping layer and the effect of $H_2$ anneal are characterized. Si surface is intentionally damaged using Ar Sputtering. The sheet resistance of NiSi formed on damaged silicon increased rapidly as Ar sputtering time increased. However, the thermal stability of Ni-Si on the damage silicon was more stable than that on at undamaged Si, which means that damaged region retards the formation of NiSi. It was shown that $H_2$ anneal and TiN capping is highly effective in reducing NiSi sheet resistance.

• 한국자기학회:학술대회 개요집
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• 한국자기학회 2007년도 The 1st International Symposium on Advanced Magnetic Materials
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• pp.308.2-308.2
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• 2007

• 한국자기학회:학술대회 개요집
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• 한국자기학회 2007년도 The 1st International Symposium on Advanced Magnetic Materials
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• pp.35.1-35.1
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• 2007

• 한국진공학회:학술대회논문집
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• 한국진공학회 2004년도 제26회 학술발표회 초록집
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• pp.172-172
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• 2004

• 한국진공학회:학술대회논문집
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• 한국진공학회 2011년도 제40회 동계학술대회 초록집
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• pp.2-2
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• 2011

Single-walled carbon nanotubes (SWNTs) have been considered as a promising candidate for nextgeneration electronics due to its extraordinary electrical properties associated with one-dimensional structure. Since diversity in electronic structure depends on geometrical features, the major concern has been focused on obtaining the diameter, chirality, and density controlled SWNTs. Despite huge efforts, the controlled synthesis of SWNTs has not been achieved. There have been various approaches to synthesize controlled SWNTs by preparation of homogeneously sized catalyst because the SWNTs diameter highly depends on catalyst nanoparticles size. In this study, geometrically controlled SWNTs were synthesized using designed catalytic layers: (a) morphologically modified Al2O3 supporting layer (Fe/Al2O3/Si), (b) Mo capping layer (Mo/Fe/Al/Si), and (c) heat-driven diffusion and subsequent evaporation process of Fe catalytic nanoparticles (Al2O3/Fe/Al2O3/Si). These results clearly revealed that (a) the grain diameter and RMS roughness of Al2O3 supporting layer play a key role as a diffusion barrier for obtaining Fe nanoparticles with a uniform and small size, (b) a density and diameter of SWNTs can be simultaneously controlled by adjusting a thickness of Mo capping layer on Fe catalytic layer, and (c) SWNTs diameter was successfully controlled within a few A scale even with its fine distribution. This precise control results in bandgap manipulation of the semiconducting SWNTs, determined by direct comparison of Raman spectra and theory of extended tight binding Kataura plot. We suggest that these results provide a simple and possible way for the direct growth of diameter, density, and bandgap controlled SWNTs by precise controlling the formation of catalytic films, which will be in demand for future electronic applications.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 하계학술대회 논문집
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• pp.288-291
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• 2002

Application of metal silicides such as TiSi$_2$ and CoSi$_2$ as contacts and gate electrodes are being studied. However, TiSi$_2$ due to the linewidth-dependance, and CoSi$_2$ due to the excessive Si consumption during silicidation cannot be applied to the deep-submicron MOSFET device. NiSi shows no such problems and can be formed at the low temperature. But, NiSi shows thermal instability. In this investigation, NiSi was formed with a Ti-capping layer to improve the thermal stability. Ni and Ti films were deposited by the thermal evaporator. The samples were then annealed in the N$_2$ ambient at 300-800$^{\circ}C$ in a RTA (rapid thermal annealing) system. Four point probe, FESEM, and AES were used to study the thermal properties of Ti-capped NiSi layers. The Ti-capped NiSi was stable up to 700$^{\circ}C$ for 100 sec. RTA, while the uncapped NiSi layers showed high sheet resistance after 600$^{\circ}C$. The AES results revealed that the Ni diffusion further into the Si substrate was retarded by the capping layer, resulting in the suppression of agglomeration of NiSi films.