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Effect of the thickness of CeO$_2$ buffer layer on the YBCO coated conductor  

Dongqi Shi (Korea Electrotechnology Research Institute)
Ping Ma (Peking University)
Ko, Rock-Kil (Korea Electrotechnology Research Institute)
Kim, Ho-Sup (Korea Electrotechnology Research Institute)
Ha, Hong-Soo (Korea Electrotechnology Research Institute)
Chung, Jun-Ki (Korea Electrotechnology Research Institute)
Kyu-Jeong, Song (Korea Electrotechnology Research Institute)
Park, Chan (Korea Electrotechnology Research Institute)
Moon, Seung-Hyun (Seoul National University)
Publication Information
Progress in Superconductivity and Cryogenics / v.6, no.4, 2004 , pp. 1-4 More about this Journal
Abstract
Three group samples with difference thickness of $CeO_2$ capping layer deposited by PLD were studied. Among them, one group $CeO_2$ films were deposited on stainless steel tape coated with IBAD- YSZ and $CeO_2$ buffer layer ($CeO_2$/IBAD-YSZ/SS); other two groups of $CeO_2 YSZ Y_2O_3$multi-layer were deposited on NiW substrates for fabrication of YBCO coated conductor through RABiTS approach. The pulsed laser deposition (PLD) and DC magnetron sputtering were employed to deposit these buffer layers. On the top of buffer layer, YBCO film was deposited by PLD. The effect of thickness of $CeO_2$ film on the texture of $CeO_2$ film and critical current density ($J_c$) of YBCO film were analyzed. For the case $CeO_2$ on $CeO_2$/IBAD-YSZ/SS, there was a self-epitaxy effect with the increase of $CeO_2$ film. For $YSZ/Y_2O_3$ NiW which was deposited by PLD or DC magnetron sputtering, there is not self-epitaxy effect. However, the capping layer of $CeO_2$ film deposited by PLD improved the quality of buffer layer for $YSZ/Y_2O_3$ which was deposited by DC magnetron sputtering, therefore increased the $J_c$ of YBCO film.
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