• Journal of the Korean Crystal Growth and Crystal Technology
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• v.14 no.1
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• pp.27-32
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• 2004

The diamond-like carbon (DLC) films were deposited on the Si (100) wafer by a rf-PECVD method as a function of the mixture rate of methane-hydrogen gas and bias voltage. The bonding structure and mechanical properties of these deposited DLC films were investigated using FT-IR, Raman, and nano-indenter. The deposition rates of DLC films increased with increased flow rate of methane in the gas mixtures and increased bias voltage. The $sp^3/sp^2$ bonding ratio of carbon in thin film and the hardness increased with increasing flow rate of hydrogen in the gas mixtures and increasing bias voltage.

• Proceedings of the KIEE Conference
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• 1999.11d
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• pp.870-872
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• 1999

The particles were deposited on silicon wafers at low pressure:1[torr] from $CH_4-H_2$ mixed gas by using RF plasma CVD, and were investigated by SEM and Raman spectroscopy. The results are as following; Diamond particles were synthesized under $CH_4/H_2$ concentration of 1[%], however amorphous cabon particles were synthesized over $CH_4/H_2$ concentration of 2[%]. Growth rate of diamond particle was 2.2 times: $0.8[{\mu}m/h]$ as much as that synthesized at 25[torr].

• The Korean Journal of Ceramics
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• v.3 no.1
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• pp.21-23
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• 1997

Dependences of total photoyields on incident photon energies were measured using synchrotron radiation light for different chemical-vapor-deposited diamond with differently treated surface. Results show that a considerable amount of gap states are presented for as-grown specimens with H-terminated, that negative electron affinity (NEA) is realized for H-plasma-treated specimens, and that sufficient O-treatment to NEA specimens results in positive electron affinity. The observed electron affinity can be explained in terms of differences in strength of the surface dipole layer formed by difference in the electron negativity among C, H and O atoms.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1998.06a
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• pp.289-292
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• 1998

The methastable state diamond films have been deposited on Si substrates using MWPCVD. Effects of each experimental parameters of MWPCVD including CH$_4$ concentrations, Oxygen additions, Operating pressure, deposition time, etc. on the growth rate and crystallinity were investigated. The best crystallinity of the finn at 3% methane concentration addition of oxygen to the CH$_4$-$H_2O$ mixture gave an improved film crystallinity at 50% oxygen concentration. Upon increasing the operating pressure and time, the growth rate and crystallinity were increased simultaneously.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.452-455
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• 2000

Diamond thin films were synthesized on WC-Co substrate at various experimental parameters using 13.56MHz RF PACVD(radio frequency plasma-assisted chemical vapor deposition). In order to increase the nucleation density, the WC-Co substrate was polished with 3$\mu\textrm{m}$ diamond paste. And the WC-Co substrate was pretreated in HNO$_3$: H$_2$O = 1:1 and O$_2$ plasma. In H$_2$-CH$_4$gas mixture, the crystallinity of thin film increased with decreasing CH$_4$concentration at 800W discharge power and 20torr reaction pressure. In H$_2$-CH$_4$-O$_2$gas mixture, the crystallinity of thin film increased with increasing O$_2$concentration at 800W discharge power, 20torr reaction pressure and 4% CH$_4$concentration.

• Journal of the Korean Society for Heat Treatment
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• v.33 no.1
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• pp.20-24
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• 2020

Single crystal diamonds are in great demand in such fields as mechanical, electronic applications and optoelectronics. Large area single crystal diamonds are attracting attention in future industries for mass production and low cost. In this study, hot filament CVD (HFCVD) is used to grow large area single crystal diamond. However, the growth rate of large area single crystal diamond using HFCVD is known to be very low. The goal of this study is to use single crystal diamond substrates in HFCVD with methane-hydrogen gas mixtures to increase the growth rate of single crystal diamond and to optimize the conditions by analysing the effects of deposition conditions for high quality crystallinity. The deposition pressure, the ratio of CH₄/H₂ gas, the substrate temperature and the distance between the filament and the substrate were optimized. The sample used a 4×4 (mm²) size single crystal diamond substrate (100), the CH₄/H₂ gas ratio was fixed at 5%, the substrate temperature was synthesized to about 1000℃. At this time, the deposition pressure was changed to three types of 50, 75, 85 Torr and deposited. Finally, optimization was investigated under pressure conditions to analyse the growth rate and quality of single crystal diamond.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2003.10a
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• pp.54-54
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• 2003

DLC films were deposited on Si(100) substrates by inductively coupled plasma (ICP) assisted chemical vapor deposition (CVD). A mixture of acetylene (C$_2$H$_2$) and argon (Ar) gases was used as the precursor and plasma source, respectively. The structure of the films was characterized by the Raman spectroscopy. Results from the Raman spectroscopy analysis indicated that the property change of the DLC films is due to the sp$^3$ and sp$^2$ ratio in the films under various conditions such as ICP power, working pressure and RF substrate bias. The hydrogen content in the DLC films was determined by an electron recoil detector (ERB). The roughness of the films was measured by atomic force microscope (Am). A microhardness tester was used for the hardness and elastic modulus measurement. The DLC film showed a maximum hardness of 37㎬. In this work, the relationship between deposition parameters and mechanical properties were discussed.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.7-8
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• 2010

The surface conductive layer (SCL) of chemical vapor deposition (CVD) diamonds has attracting much interest. However, neither photoemission electron microscopic (PEEM) nor micro-spectroscopic (PEEMS) information is available so far. Since SCL retains in an ultra-high vacuum (UHV) condition, PEEM or PEEMS study will give an insight of SCL, which is the subject of the present study. The sample was made on a Ib-type HTHP diamond (001) substrate by non-doping CVD growthin a DC-plasma deposition chamber. The SCL properties of the sample in air were; a few tens K/Sq. in sheet resistance, ${\sim}180\;cm^2/vs$ in Hall mobility, ${\sim}2{\times}10^{12}/cm^2$ in carrier concentration. The root-square-mean surface roughness (Rq) of the sample was ~0.2nm as checked by AFM. A $2{\times}1$ LEED pattern and a sheet resistance of several hundreds K/Sq. in UHV were checked in a UHV chamber with an in-situ resist-meter [1]. The sample was then installed in a commercial PEEM/S apparatus (Omicron FOCUS IS-PEEM) which was composed of electro-static-lens optics together with an electron energy-analyzer. The presence of SCL was regularly monitored by measuring resistance between two electrodes (colloidal graphite) pasted on the two ends of sample surface. Figure 1 shows two PEEM images of a same area of the sample; a) is excited with a Hg-lamp and b) with a Xe-lamp. The maximum photon energy of the Hg-lamp is ~4.9 eV which is smaller that the band gap energy ($E_G=5.5\;eV$) of diamond and the maximum photon energy of the Xe-lamp is ~6.2 eV which is larger than $E_G$. The image that appear with the Hg-lamp can be due to photo-excitation to unoccupied states of the hydrogen-terminated negative electron affinity (NEA) diamond surface [2]. Secondary electron energy distribution of the white background of Figs.1a) and b) indeed shows that the whole surface is NEA except a large black dot on the upper center. However, Figs.1a) and 1b) show several features that are qualitatively different from each other. Some of the differences are the followings: the two main dark lines A and B in Fig.1b) are not at all obvious and the white lines B and C in Fig.1b) appear to be dark lines in Fig.1a). A PEEMS analysis of secondary electron energy distribution showed that all of the features A-D have negative electron affinity with marginal differences among them. These differences can be attributed to differences in the details of energy band bending underneath the surface present in SCL [3].

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.27 no.4
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• pp.149-153
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• 2017

Recently, significant amounts of gem-quality colorless HPHT synthetic melee diamond have produced for the jewelry industry. Consequently, there have been reports of cases of fraud in the world diamond business. For example, intentionally selling synthetic diamond as natural diamond or intentionally mixing a natural diamond parcel with a synthetic. As a result, the separation of natural from synthetic melee diamonds has become increasingly critical. At present, 10,000 cubic hinge presses are used for the production of synthetic diamond in China. From among these, reportedly 1,000 presses are used for gem-quality diamond production. One press can produce up to 10ct melee-size diamonds in 24 hours. Randomly occurring pinpoint or flux-metal inclusions are diagnostic identification clues. However, some synthetic diamonds require advanced laboratory method for identification. In order to ensure consumer confidence, it is essential to screen melees so as to distinguish all synthetic goods.

• Korean Journal of Materials Research
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• v.7 no.4
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• pp.322-329
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• 1997

ECR 마이크로 플라즈마 CVD법에 의하여 단결정 Si기판위에서 대면적에 걸쳐 방향성을 가진 다이아몬드박막을 성공적으로 성장시키고, 막 증착공정을 바이어스처리 단계와 성막단계의 2단계로 나누어 실시할 때 바이어스처리 단계에서 여러 공정 매개변수들이 다리아몬드 핵생성밀도에 미치는 효과에 관하여 조사하였다. 기판온도$600^{\circ}C$, 압력 10Pa, 마이크로파 전력 3kW, 기판바이어스 +30V의 조건으로 바아어스 처리할 때, 핵생성에 대한 잠복기간은 5-6분이며, 핵생성이 완료되기 까지의 시간은 약 10분이다. 10분 이후에는 다이아몬드 결정이 아닌 비정질 탄소막이 일단 형성된다. 그러나 성장단계에서 이러한 비정질 탄소막은 에칭되어 제거되고 남아있는 다이다몬드 핵들이 다시 성장하게 된다. 또한 기판온도의 증가는 다이아몬드 막의 결정성을 높이고 핵생성 밀도를 증가시키는 데에 별로 효과가 없다. ECR플라즈마 CVD법에서 바이어스처리 테크닉을 사용하면, 더욱 효과적임을 확인하였다. 총유량 100 sccm의 CH$_{3}$OH(15%)/He(85%)계를 사용하여 가스압력 10Pa, 바이어스전압 +30V마이크로파 전력 3kW, 온도 $600^{\circ}C$의 조건하에서 40분간 바이어스처리한 다음 다이아몬드막을 성장시켰을 때 일시적으로나마 제한된 지역에서 완벽한 다이아몬드의 에피성장이 이루어졌음을 SEM으로 확인하였다. 이것은 Si기판상에서의 다이아몬드의 에피성장이 가능함을 시사하는 것이다. 그밖에 라만분광분석과 catodoluminescence 분석에 의한 다이아몬드의 결정질 조사결과와 산소방전 및 수소방전에 의한 챔버벽의 탄소오염효과 등에 관하여 토의하였다.