• 한국전기전자재료학회논문지
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• 제21권3호
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• pp.265-271
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• 2008

TCP(Tape Carrier Package), COG (Chip On Glass), COF(Chip On Film) are three methods for connecting LDI(LCD Driver IC) with LCD panels. Especially COF is growing its portion of market place because of low cost and fine pitch correspondence. But COF has a problem of the lead broken failure in LCD module process and the usage of customer. During PCB (Printed Circuit Board) bonding process, the mismatch of the coefficient of thermal expansion between PCB and D-IC makes stress-concentration in COF lead, and also D-IC bending process during module assembly process makes the level of stress in COF lead higher. As an affecting factors of lead-broken failure, the effects of SR(Solder Resister) coating on the COF lead, surface roughness and grain size of COF lead, PI(Polyimide) film thickness, lead width and the ACF(Anisotropic Conductive Film) overlap were studied, The optimization of these affecting manufacturing processes and materials were suggested and verified to prevent the lead-broken failure.

• 마이크로전자및패키징학회지
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• 제15권2호
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• pp.7-15
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• 2008

본 논문에서는 ACF를 이용한 CCM용 COF 어셈블리의 실장 기술을 연구하고 COF 어셈블리의 신뢰성 분석을 수행하였다. 열팽창계수, 모듈러스, 유리전이온도 등 경화 후 ACF의 열-기계적 물성들을 분석하였으며, ACF의 경화거동 결과를 바탕으로 COF 접합공정 온도 및 시간을 최적화하였으며, 도전입자의 변형 관찰 및 전기적 접촉 저항 측정을 통해 본딩 압력에 대한 최적화를 수행하였다. 또한 ACF 물질 특성이 COF어셈블리의 신뢰성에 미치는 영향을 알아보기 위해 열-싸이클 시험, 고온 유지 시험, 고온고습 시험을 수행하였다. 신뢰성 시험 수행 후 ACF를 이용한 COF 어셈블리의 신뢰성에 가장문제가 되고 있는 점은 열-싸이클 신뢰성 시험에서 나타난 ACF joint의 접촉 저항 증가 문제였고, 이는 ACF 자체의 열-기계적 물성과 밀접한 관계가 있음을 확인하였다.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2002년도 International Symposium
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• pp.21-30
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• 2002

According the difference of flex substrate, (reel tape), there are three kind assembly types of LCD driver IC is COG, TCP and COF, respectively. The TCP is the maturest in these types for stability of raw material supply and other specification. And TCP is the major assembly type of LCD driver IC and the huge demand from Taiwan's large TFT LCD panel house since this spring. But due to its package structure and the raw material applied in this package, there is some limitation in fine pitch application of this package type, (TCP). So, COF will be very potential in compact and portable application comparison with TCP in the future. There are three kinds assembly methods in COF, one is ACF by using the anisotropic conductive film to connect the copper lead of tape and gold bump of IC, another is eutectic bonding by using the thermo-pressure to joint the copper lead of tape and gold bump of IC, and last is NCP by using non-conductive paste to adhere the copper lead of tape and gold bump of IC. To have a global realization, this paper will briefly review the status of Taiwan's large TFT panel house, the internal driver IC design house, and the back-end assembly house in the beginning. The different material property of raw material, PI tape is also compared in the paper. The more detail of three kinds of COF assembly method will be described and compared in this paper.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2011년도 춘계학술대회 논문집
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• pp.45-46
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• 2011

• 반도체디스플레이기술학회지
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• 제4권4호
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• pp.27-31
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• 2005

This article contains the development of FPC bonder that used for repair or trial product. Nowadays, in FPO module process (including PDP) accept the thermo-compress bonding method when attach FPC(Flexible Printed Circuit Board), TCP(Tape Carrier Package) and COF(Chip on the FPC) by ACF(Anisotropic Conductive Film). This system consists of ACF attachment part, pre-bonding part, main bonding part, loading / unloading part. This composition is a stand-alone system, not an in-line system. Hereafter, this composition should be developing into in-line system in all area of FPD industry.

• 한국기계가공학회지
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• 제20권10호
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• pp.112-118
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• 2021

In this study, an inspection method using a color image is proposed to conduct a real-time inspection of covalent organic framework (COF) films to detect defects, if any. The COF film consists of an upper pattern SR and a lower PI. The proposed system detects the defects of more than 20 ㎛ on the SR surface owing to the characteristics of the pattern, whereas on the PI surface, it detects defects of more than 4 ㎛ by utilizing a micro-optical system. In the existing system, it is difficult for the operator to conduct a full inspection through a high-performance microscope. The proposed inspection algorithm performs the inspection by separating each color component using the color contrast of the pattern on the SR side, and on the PI surface it inspects the bonding state of the mounted chip. As a result, it is possible to confirm the exact location of the defects through the SR and PI surface inspections in the implemented inspection.

• 제어로봇시스템학회논문지
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• 제16권2호
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• pp.172-176
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• 2010

Recently, LCD (Liquid Crystal Display) requires various technical challenges; high definition, high quality, big size, and low price. These demands more pixels in the fixed area of the LCD and very fine lead pitch of the driving IC which controls the pixels. Therefore, a new packaging technology is needed to meet such technical requirement. NCP (Non Conductive Paste) is one of the new packaging methods and has excellent characteristics to overcome the problems of the ACF (Anisotropic Conductive Film). In this paper, we analyzed the process of the NCP for COF (Chip on FPCB) and proposed the key design parameters of the NCP process. Through a series of experiments, we obtained the stable values of the design parameters for successful NCP process.

• 한국재료학회지
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• 제22권9호
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• pp.454-458
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• 2012

Various adhesive materials are used in flip chip packaging for electrical interconnection and structural reinforcement. In cases of COF(chip on film) packages, low temperature bonding adhesive is currently needed for the utilization of low thermal resistance substrate films, such as PEN(polyethylene naphthalate) and PET(polyethylene terephthalate). In this study, the effects of anhydride and dihydrazide hardeners on the low-temperature snap cure behavior of epoxy based non-conductive pastes(NCPs) were investigated to reduce flip chip bonding temperature. Dynamic DSC(differential scanning calorimetry) and isothermal DEA(dielectric analysis) results showed that the curing rate of MHHPA(hexahydro-4-methylphthalic anhydride) at $160^{\circ}C$ was faster than that of ADH(adipic dihydrazide) when considering the onset and peak curing temperatures. In a die shear test performed after flip chip bonding, however, ADH-containing formulations indicated faster trends in reaching saturated bond strength values due to the post curing effect. More enhanced HAST(highly accelerated stress test) reliability could be achieved in an assembly having a higher initial bond strength and, thus, MHHPA is considered to be a more effective hardener than ADH for low temperature snap cure NCPs.

• 한국반도체및디스플레이장비학회:학술대회논문집
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• 한국반도체및디스플레이장비학회 2005년도 춘계 학술대회
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• pp.79-83
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• 2005

IT 기술, 반도체 산업 등의 급격한 발전에 힘입어 최근의 첨단 전자, 통신제품은 초경량 초소형화와 동시에 고기능 복합화의 발전 추세를 보이고 있다. 이런 추세에 발맞추어 전자제품, 통신제품의 핵심적인 부품인 IC chip도 소형화되고 있다. IC chip 패키징 기술의 하나인 Filp Chip Package는 Module Substrate 위에 Chip Surface를 Bumping 시킴으로서 최단의 접속길이와 저열저항, 저유전율의 특성도 가지면서 초소형에 높은 수율의 저 원가생산성을 갖는 첨단의 패키징 기술이다. 이런 패키징 기술은 수요증가와 더불어 폭발적으로 늘어나고 있으나 까다로운 공정기술에 의해 아직 여러 회사에서 장비가 출시되고 있지 못한 상태이다. 이에 본 연구에서는 최근 수요가 증가하는 LCD Driver IC용 COF 장비를 위한 Flip chip Bonding 장비 및 시스템을 설계, 제작하였다.

• 대한화학회지
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• 제33권3호
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• pp.287-294
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• 1989

미국 EPA가 주요 유기오염물질로 정한 페놀류들에 대하여 역상 액체 크로마토그래피에서 혼합용액을 등용매 용리법으로 완전히 분리할 수 있는 최적 분리조건과 머무름 거동을 조사하였다. 이때 정지상은 ${\mu}$-Bondapak C18 컬럼을, 이동상은 메탄올-물, 아세토니트릴-물, THF-물을 사용하였다. Statistical simplex system의 삼각형에서 각 조건에서의 크로마토그램을 얻어 COF 값을 비교해 본 결과 메탄올 : 아세토니트릴 : 물의 비율이 7 : 40 : 53 부근에서 가장 분리가 잘 됨을 알았다. 여러가지 물리적 파라미터를 고려하여 폐놀류들의 머무름 거동을 조사한 결과 엔탈피가 증가함에 따라 머무름이 감소하였다. 단, 극성이 큰 치환기를 갖는 경우에는 엔탈피 효과보다 그 시료의 극성도가 머무름에 더 많은 영향을 미치었다. 또한 분배계수로부터 유도된 치환기 상수와 머무름과의 상관관계를 알아본 결과 메탄올 - 물, 아세토니트릴 - 물을 이동상으로 사용한 경우는 페놀류들의 머무름이 분배 메카니즘에 따음을 확인할수 있었다. 그러나 THF-물을 사용한 경우는 이동상의 영향이 크게 작용하여 상관관계가 감소하였다. 소수성을 나타내는 van der Waals 부피와 함께 pi-에너지 효과와 수소결합에너지 효과를 같이 고려하여 머무름 거동을 조사한 결과 이동상으로 아세토니트릴 - 물을 사용한 경우 상관계수 0.9927를 갖는 다음의 직선식을 얻었다. $log^{k'}=2.515{\times}10^{-2}VWV-1.301{\times}10^{-1}E-3.674{\times}10^{-1}$