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Implementation of Notch Filter Emulator for Wireless Interference Signal Cancellation under Power Line Communication Environment (전력선 통신 환경에서 무선 간섭 신호를 제거하기 위한 Notch Filter Emulator 구현)

  • Jang, Dong-Won;Lee, Young-Hwan;Lee, Hyun-So;Kim, Kyung-Seok
    • Journal of Korea Multimedia Society
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    • v.12 no.10
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    • pp.1407-1417
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    • 2009
  • Today is the Information age which Internet service acts a most important Information Source. So the Power Line Communication has been achieved to offer Internet service for Last-Mile area. And Research is achieved to frequence range from 30MHz to 80MHz for High-speed communication service. But, Power Line is not suitable for communication, So, electric wave is generated from flow of communication information. And the electric wave is interfered with Wireless Communication Service using the same frequence range. In this paper, a Notch Filter for reduce of interference between Power Line Communication and Wireless Communication Service is proposed. The proposed emulator is developed using TMS320C6416T DSP board of Texas Instruments.

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Joule Heating Effects and Initial Resistance in Electromigration Test (EM시험에서의 Joule Heating 영향 및 초기저항값)

  • Ju, Cheol-Won;Gang, Hyeong-Gon;Han, Byeong-Seong
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.48 no.6
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    • pp.436-441
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    • 1999
  • Joule heating effect in EM(Electromigration) test were performed on a bend test structure. EM test is done under high current densities(1.0-2.5MA/cm2), which leads to joule heating. Since joule heating is added to the controlled oven(stress) temperature, themetal line temperature is higher than the stress temperature. The increase in the stress temperature due to joule heating is important because EM phenomena and metal line failure are related to the stress temperature. In this paper, metal line was stressed with a current density of 1.0 MA/$cm^2$, 1.5MA/$cm^2$, 2.0MA/$cm^2$, 2.5MA/$cm^2$, for 1200 sec and temperature increase due to joule heating was less than $10^{\circ}C$. Also it took 30 minutes for the metal line to equalized with oven temperature. Recommendations are given for the EM test to determine the initial resistance of EM test structure under stress temperature and current density.

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Ultrastructural Changes and Shear Force of Duck Meat during Aging at 0℃

  • Kim, Young-Boong;Jeon, Ki-Hong;Kim, Young-Ho;Lee, Nam-Hyuck;Ku, Su-Kyung;Jang, Ae-Ra
    • Food Science of Animal Resources
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    • v.32 no.5
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    • pp.578-583
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    • 2012
  • The purpose of this study was to evaluate the ultrastructural and shear force changes of duck breast and leg meat during aging at $0^{\circ}C$. Pekin ducks (45 d old) purchased from Greemud Co. were used for this experiment, and were stored at $0^{\circ}C$ for 7 d in order to determine the changes of the meat structure using transmission electron microscopy (TEM) and shear force. At day 0, A-band, I-band, M-line and Z-line of sarcomeres were seen clearly, but sarcomeres started to lose structure and become extended in length from day 2. With extended aging periods, myofibrils were destroyed and symptoms of aging became more obvious. In the duck breast meat, some myofibrils were also destroyed at the Z-line, but were mainly destroyed at the M-line. The change in structure of duck leg meat over time was similar to that of breast meat. After five days and seven days of aging, mitochondria size and quantity were determined to be increased between the myofibrils. Shear force was decreased over time. From this study, aging at $0^{\circ}C$ was found to negatively influence the ultrastructure and shear force of duck meat.

Unbounded Scalar Operators on Banach Lattices

  • deLaubenfels, Ralph
    • Honam Mathematical Journal
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    • v.8 no.1
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    • pp.1-19
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    • 1986
  • We show that a (possibly unbounded) linear operator, T, is scalar on the real line (spectral operator of scalar type, with real spectrum) if and only if (iT) generates a uniformly bounded semigroup and $(1-iT)(1+iT)^{-1}$ is scalar on the unit circle. T is scalar on [0, $\infty$) if and only if T generates a uniformly bounded semigroup and $(1+T)^{-1}$ is scalar on [0,1). By analogy with these results, we define $C^0$-scalar, on the real line, or [0. $\infty$), for an unbounded operator. We show that a generator of a positive-definite group is $C^0$-scalar on the real line. and a generator of a completely monotone semigroup is $C^0$-scalar on [0, $\infty$). We give sufficient conditions for a closed operator, T, to generate a positive-definite group: the sequence < $\phi(T^{n}x)$ > $_{n=0}^{\infty}$ must equal the moments of a positive measure on the real line, for sufficiently many positive $\phi$ in $X^{*}$, x in X. If the measures are supported on [0, $\infty$), then T generates a completely monotone semigroup. On a reflexive Banach lattice, these conditions are also necessary, and are equivalent to T being scalar, with positive projection-valued measure. T generates a completely monotone semigroup if and only if T is positive and m-dispersive and generates a bounded holomorphic semigroup.

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Simulation for characterization of high speed probe for measurement of single flux quantum circuits (단자속양자 회로 측정프로브의 특성 분석을 위한 시뮬레이션)

  • 김상문;김영환;최종현;조운조;윤기현
    • Progress in Superconductivity and Cryogenics
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    • v.4 no.2
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    • pp.11-15
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    • 2002
  • High speed probe for measurement of sin91e flux quantum circuits is comprised of coaxial cables and microstrip lines in order to carry high speed signals without loss. For the impedance matching between coaxial cable and microstrip line, we have determined the dimension of the microstrip line with 50${\Omega}$ impedance by simulation and then have investigated the effect of line width and cross-sectional shape of signal line, dielectric material, thickness of soldering lead at the coaxial-to-microstrip transition Point, and the an91c between dielectric material and end part of the signal line on the characteristics of signal transmission of the microstrip line. From the simulation, we have found that these all parameter's had influenced on the characteristic of signal transmission on the microstrip line and should be reflected in fabricating high speed probe, We have also determined the dimension of coplanar waveguide to fabricate testing sample for performance test of high speed probe.

Synchronization of Chaos Circuit (카오스 회로 동기화)

  • Bae, Young-Chul
    • Proceedings of the KIEE Conference
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    • 2000.07d
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    • pp.2404-2406
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    • 2000
  • Chua's circuit is a simple electronic network which exhibits a variety of bifurcation and attractors. The circuit consists of two capacitors, an inductor, a linear resistor, and a nonlinear resistor. In this paper, a transmitter and a receiver using two identical Chua's circuits are proposed and synchronizations of a T or ${\pi}$ type power line are investigated. Since the synchronization of the power line system is impossible by coupled synchronization, theory having both the drive-response and the coupled synchronization is proposed. As a result, the chaos synchronization has delay characteristics in the power line transmission system caused by the line parameters L and C

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Development of Algorithm to Measure Line constants of Electric Railway System (전기철도 시스템을 위한 선로정수 실측 알고리즘 개발)

  • Lee, H.M.;Kim, G.D.;Oh, S.C.;Park, S.H.;Kim, J.D.
    • Proceedings of the KIEE Conference
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    • 2005.07b
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    • pp.1649-1652
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    • 2005
  • Line constants are composed by impedances and susceptances. We don't need all line constants on electric railway system. Depending on where they are applied, The algorithm to get line constants Is different. We suggest two algorithm to measure them.

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Low Resistivity Ohmic Ni/Si/Ni Contacts to N-Type 4H-SiC (낮은 접촉저항을 갖는 Ni/Si/Ni n형 4H-SiC의 오옴성 접합)

  • Kim C. K.;Yang S. J.;Cho N. I.;Yoo H. J.
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.53 no.10
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    • pp.495-499
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    • 2004
  • Characteristics of ohmic Ni/Si/Ni contacts to n-type 4H-SiC are investigated systematically. The ohmic contacts were formed by annealing Ni/Si/Ni sputtered sequentially The annealings were performed at 950℃ using RTP in vacuum ambient and N₂ ambient, respectively. The specific contact resistivity(p/sub c/), sheet resistance(R/sub s/), contact resistance (R/sub c/) transfer length(L/sub T/) were calculated from resistance(R/sub T/) versus contact spacing(d) measurements obtained from TLM(transmission line method) structure. While the resulting measurement values of sample annealed at vacuum ambient were p/sub c/ = 3.8×10/sup -5/Ω㎠, R/sub c/ = 4.9 Ω and R/sub T/ = 9.8 Ω, those of sample annealed at N₂ ambient were p/sub c/ = 2.29×10/sup -4/Ω㎠, R/sub c/ = 12.9 Ω and R/sub T/ = 25.8 Ω. The physical properties of contacts were examined using XRD 3nd AES. The results showed that nickel silicide was formed on SiC and Ni was migrated into SiC. This result indicates that Ni/Si/Ni ohmic contact would be useful in high performance electronic devices.