• Title/Summary/Keyword: Breakdown lifetime

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e-Learning Education System on Web

  • Choi, Sung;Han, Jung-Lan;Chung, Ji-Moon
    • 한국디지털정책학회:학술대회논문집
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    • 2004.11a
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    • pp.283-294
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    • 2004
  • Within the rapidly changing environment of global economics, the environment of higher education in the universities & companies, also, has been, encountering various changes. Popularization on higher education related to lifetime education system, putting emphasis on the productivity of education services and the acquisition of competitiveness through the market of open education, the breakdown of the ivory tower and the Multiversitization of universities & companies, importance of obtaining information in the universities & companies, and cooperation between domestic and oversea universities, industry and educational system must be acquired. Therefore, in order to adequately cope with these kinds of rapid changes in the education environment, operating E-Learning Education & company by utilizing various information technologies and its fixations such as Internet, E-mail. CD-ROMs. Interactive Video Networks (Video Conferencing, Video on Demand), CableTV etc., which has no time or location limitation, is needed.

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A Study on Fault Detection of Induction Motor Using Current Signal Analysis (전류신호 해석에 의한 유도전동기 결함추출 연구)

  • Han, Sang-Bo;Hwang, Don-Ha;Kang, Dong-Sik;Son, Jong-Duk
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2007.05a
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    • pp.274-279
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    • 2007
  • The fault identification of electrical rotating machinery have been special interests due to one of important elements in the industrial production line. It is directly related with products quality and production costs. The sudden breakdown of a motor will affect to the shut down of the whole processes. Therefore, rotating machines are required to a periodic diagnosis and maintenance for improving its reliability and increasing their lifetime. The objective of this work is to develop the diagnosis system with current signals for the effective identification of healthy and faulty motors using the developed diagnosis algorithm, which consists of the feature calculation, feature extraction, and feature classification procedures.

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High-Speed, High-Reliability Planar-Structure InP/InGaAs Avalanche Photodiodes for 10Gb/s Optical Receivers with Recess Etching (수광영역의 식각을 통한 단일확산 공정의 고속 평판형 InP/InGaAs 10Gb/s 광 검출기의 신뢰성)

  • Jung, Ji-Houn;Kwon, Yong-Hwan;Hyun, Kyung-Sook;Yun, Il-Gu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07b
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    • pp.1022-1025
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    • 2002
  • This paper presents the reliability of planar InP/InGaAs avalanche photodiodes (APD's) with recess etching, which is very crucial for the commercial 10-Gb/s optical receiver application. A versatile design for the planar InP/InGaAs APD's and bias-temperature tests to evaluate long-term reliability at temperature from 200 to $250^{\circ}C$. The reliability is examined by accelerated life tests by monitoring dark current and breakdown voltage. The lifetime of the APD's is estimated by a degradation activation energy. Based on the test results, it is concluded that the planar InP/InGaAs APD's with recess etching shows the sufficient reliability for practical 10-Gb/s optical receivers.

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Trench-gate SOI LIGBT with improved latch-up capability (향상된 Latch-up 특성을 갖는 트렌치 게이트 SOI LIGBT)

  • 이병훈;김두영;유종만;한민구;최연익
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.32A no.1
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    • pp.103-110
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    • 1995
  • Trench-Gate SOI LIGBT with improved latch-up capability has been proposed and verified by MEDICI simulation. The new SOI LIGBT exhibits 6 time larger latch-up capability of the new device is almost preserved independent of lifetime. the large latch-up capability of the new SOI LIGBT may be realized due to the fact that the hole current in the new device would bypass through the shorted cathode contact without passing the p-well region under the n+ cathode. Forward voltage drop is increased by 25% when a epi thickness is 6$\mu$m. However, the increase of the forward voltage is negligible when the epi thickness is increased to 10$\mu$m. It is found that the swithcing time of the new device is almost equal to the conventional devices. Evaluated breakdown voltage of proposed SOILIGBT is 250 V and that of the conventional SOI LIGBT is 240 V, where the thickness of the vuried oxide and n- epi is 3$\mu$m and 6$\mu$m, respectively.

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Design of 4.5kV/1.5kA IGCT (4.5kV/1.5kA급 IGCT 설계 및 특성분석)

  • Kim, Hyoung-Woo;Kim, Sang-Cheol;Seo, Kil-Su;Kim, Eun-Dong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07a
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    • pp.357-360
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    • 2003
  • In this paper, we designed 4.5kV/1.5kA IGCT devices. GCT thyristor has many superior characteristics compared with GTO thyristor, for examples; snubberless turn-off capability, short storage time, high turn-on capability, small turn-off gate charge and low total power loss of the application system containing device and peripheral parts such as anode reactor and snubber capacitance. In this paper we designed GCT thyristor devices, and analyzed static and dynamic characteristics of GCT thyristor depending on the minority carrier lifetime, n-base thickness and doping concentration of n-base region, respectively. Especially, turn-on and turn-off characteristics are very important characteristics for GCT thyristor devices. So, we considered above characteristic for design and analysis of GCT devices.

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The Improvement on Insulation Performance of Underground Distribution Power Cables (지중배전케이블 절연성능 향상 방안)

  • Lee, Jae-Bong;Lee, Byung-Sung;Kim, Sang-Joon;Jang, Sang-Ok;Han, Yong-Huei;Oh, Jae-Hyoung
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2004.05a
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    • pp.497-501
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    • 2004
  • The primary failure causes of underground distribution power cables are water penetration in insulation layer and stress enhancement at inner semi-conductive layer. Accordingly, it is needed to improve the materials and the structure of power cables for extending lifetime and preventing failure. We uses non-flaming PE materials instead of PVC as a covering material and encapsulating structure. We also use super smooth class material as a inner semi-conductive layer. The newly developed cables are improved in AC breakdown voltage after ageing tests.

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Lifetime assessment using Weibull probability distribution according to treeing breakdown (트리잉 파괴에 대한 와이블 확률 분포을 이용한 수명 평가)

  • 신성권;김경민;김탁용;이덕진;박세화;김경환;김재환
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.07a
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    • pp.620-623
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    • 2000
  • 본 논문은 절연재료의 보이드(void)나 크랙(crack)과 같은 결함이 부분방전을 일으킴으로서 절연재료가 열화되어 최종적으로 파괴에 이른다. 특히 부분방전 중에서 트리잉 열화는 절연재료에 매우 치명적이다. 또한 고전압,고전계 기술분야에서 절연파괴전압이나 일정전압 인가시 수명 시간 데이터는 중요하다. 파괴 통계에 주로 많이 사용하는 와이블 확률 분포를 이용하여 트리잉 파괴에 대한 수명을 평가를 시도하였다. 시료의 형태는 침대 평판전극이고 시료는 저밀도 폴리에틸렌이다 인가 전압은 상용 교류 전압 8,10,12[kV]를 인가하였다. 척도 파라메타는 전압이 증가함에 따라 128.7$\longrightarrow$96.4$\longrightarrow$85.4로 감소하고 형상 파라메타는 전압이 증가함에 따라 2.39$\longrightarrow$2.19$\longrightarrow$2.02로 감소한다. 따라서 시료의 추정 수명은 110분, 81.57분, 49.27분으로 전압이 증가함에 따라 수명이 급격히 단축됨을 알 수 있다.

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Dielectric Characteristics of Magnetic Tunnel Junction

  • Kim, Hong-Seog
    • The Journal of Engineering Research
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    • v.6 no.2
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    • pp.33-38
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    • 2004
  • To investigate the reliability of the MTJs on the roughness of insulating tunnel barrier, we prepared two MTJs with the different uniformity of barrier thickness. Namely, the one has uniform insulating barrier thickness; the other has non-uniform insulating barrier thickness as compared to different thing. As to depositing amorphous layer CoZrNb under the pinning layer IrMn, we achieved MTJ with uniform barrier thickness. Toinvestigate the reliability of the MTJs dependent on the bottom electrode, time-dependent dielectric breakdown (TDDB) measurements were carried out under constant voltage stress. The Weibull fit of out data shows clearly that $t_{BD}$ scales with the thickness uniformity of MTJs tunnel barrier. Assuming a linear dependence of log($t_{BD}$) on stress voltages, we obtained the lifetime of $10^4$years at a operating voltage of 0.4 V at MTJs comprising CoNbZr layers. This study shows that the reliabilityof new MTJs structure was improved due to the ultra smooth barrier, because the surface roughness of the bottom electrode influenced the uniformity of tunnel barrier.

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A Threshold based Connectivity Enhancement Scheme for Mobile Ad-hoc Networks (MANET에서 경로 연속성 증대방안에 대한 연구)

  • Jang Yunchul;Park Sangioon;Kim Byunggi
    • Journal of KIISE:Information Networking
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    • v.32 no.2
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    • pp.215-219
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    • 2005
  • Generally, the mobile nodes in MANET have the limited power capacity available for actual communications. Thus, the power management is very important for packet routing or forwarding. Although MTPR, MBCR and MMBCR are proposed to treat the problem of power consumption, there have been few researches resolving the link breakdown that is occurred by the power exhaustion during transmission. In this sense, the reliable scheme should be required to ensure the routing connectivity. In this paper, we propose three schemes to enforce the routing connectivity. If the signal strength is dropped below a signal threshold, the candidate route is previously selected to prepare the link breakdown. Also, on multi-channel, we propose the lifetime increment scheme of a node that it manage its available power to the needed power of a new link. The simulation results show the enforcement of the link connectivity and the performance improvements of the delay time through the effective connection management.