Study on the breakdown characteristics of magnetic tunnel junctions and lifetime predictions for the high-density MRAM devices

Kim Kwang-Seok (Dept. of Materials Science and Engineering, Gwangju Institute of Science and Technoiogy(GIST)) ;
Nam Chung-Hee (Dept. of Materials Science and Engineering, Gwangju Institute of Science and Technoiogy(GIST)) ;
Jang Young-Man (Dept. of Materials Science and Engineering, Gwangju Institute of Science and Technoiogy(GIST)) ;
Lee Ki-Su (Dept. of Materials Science and Engineering, Gwangju Institute of Science and Technoiogy(GIST)) ;
Kim Hyung-Min (Dept. of Materials Science and Engineering, Gwangju Institute of Science and Technoiogy(GIST)) ;
Cho Beong-Ki (Dept. of Materials Science and Engineering, Gwangju Institute of Science and Technoiogy(GIST))