• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.7
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• pp.162-170
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• 1996

A breakdown model of gate oxides under constant current stresses is proposed. This model directly relates the oxide lifetime to the stress current density, and includes statistical nature of oxide breakdown using the concept of "effective oxide thinning". It is shown tha this model can reliably predict the TDDB characteristics for any current stress levels and oxide areas.

• International Journal of Safety
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• v.1 no.1
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• pp.36-42
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• 2002

This paper is aimed at predicting the life of rubber insulating gloves under normal operating stresses from relatively rapid test performed at higher stresses. Specimens of rubber insulating gloves are subject to multiple stress conditions, i.e. combined electrical and thermal stresses. Two modes of electrical stress, step voltage stress and constant voltage stress are used in specimen aging. There are two types of test for electrical stress in this experiment: the one is Breakdown Voltage (BDV) test under step voltage stress and thermal stress and the other is lifetime test under constant voltage stress and temperature stress. The ac breakdown voltage defined as the break-down point of insulation that leakage current excesses a limit value, l0mA in this experiment, is determined. Because the very high variability of aging data requires the application of statistical model, Weibull distribution is used to represent the failure times as the straight line on Weibull probability paper. Weibull parameters are deter-mined by three statistical methods i.e. maximum likelihood method, graphical method and least squares method, which employ SAS package, Weibull probability paper and FORTRAN, respectively. Two chosen models for predicting the life under simultaneous electrical and thermal stresses are inverse power model and exponential model. And the constants of life equation for multistress aging are calculated using numerical method, such as Gauss Jordan method etc.. The completion of life equation enables to estimate the life at normal stress based on the data collected from accelerated aging test. Also the comparison of the calculated lifetimes between the inverse power model and the exponential model is carried out. And the lifetimes calculated by three statistical methods with lower voltage than test voltage are compared. The results obtained from the suggested experimental method are presented and discussed.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07a
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• pp.13-16
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• 2004

The reliability of 1.550m-wavelength InGaAs mesa waveguide photodiodes(WGPDs), which developed for 40-Gbps optical receiver applications, fabricated by metal organic chemical vapor deposition is investigated. Reliability is examined by both high-temperature storage tests and the accelerated life tests by monitoring dark current and breakdown voltage. The median device lifetime and the activation energy of the degradation mechanism are computed for WGPD test structures. From the accelerated life test results, the activation energy of the degradation mechanism and median lifetime of these devices in room temperature are extracted from the log-normal failure model by using average lifetime and the standard deviation of that lifetime in each test temperature. It is found that the WGPD structure yields devices with the median lifetime of much longer than $10^6$ h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gbps optical receiver modules.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.13 no.9
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• pp.758-763
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• 2000

Dielectric strength of insulators made of epoxy composites rapidly decreases due to ageing to interfaces between the matric resin and filler particles. The adhesion variation of interfaces caused by moisture absorption also alters electrical properties that are the basic characteristics of insulators, particularly, in outdoor use. In this paper, electrical properties of epox/SiO$_2$composites were investigated at boiling absorption condition to observe the influences of moisture. In order to analyze the basic physical properties of samples, scanning electron microscopy and DC, AC and impulse voltage dielectric strength were measured. Also, the breakdown time of samples was measured under AC 6[kV] applied voltage, and the variation of lifetime was verified by using Weibull distribution function.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.79-79
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• 2010

In this paper, we present results of the dielectric breakdown test in various 6.9kV power cables used in power plants. The dielectric strength of the different conditioned cables was measured by placing the sliced cable sections in silicone oil bath with needle electrode. The results were analyzed by the Weibull distribution. The shape and scale parameters of the Weibull distribution for each cable sections under test were calculated and evaluated. Collected data base was applied to deterioration trend analysis and lifetime guide was also proposed.

• The Transactions of the Korean Institute of Electrical Engineers
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• v.45 no.4
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• pp.553-557
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• 1996

Heat cycle aging of insulating materials in large generator stator winding has been investigated using both on-line and off-line test methods. On this study, principally, off-line test against actual generator in service was carried out to acquire information about polarization index(PI) and dissipation factor, dissipation factor tip-up, maximum partial discharge for the purpose of remnant breakdown voltage and life assessment. It was found from the tests that both dissipation factor and maximum partial discharge decreased with the increase of operating hours and starting numbers. It was found from off-line tests that the remnant breakdown voltage had a strong relationship with both dissipation factor and maximum partial discharge the remnant breakdown voltage as a results of both operating hours and starting number and the nondestructive tests were proposed as parameters which can predict the remnant lifetime of insulating materials in large generator stator windings. (author). 8 refs., 8 figs., 2 tabs.

• The KIPS Transactions:PartA
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• v.15A no.4
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• pp.211-216
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• 2008

In this paper we fabricated and measured the $0.26{\mu}m$ NMOSFET with wet gate oxide and nitride oxide gate to compare that the charateristics of hot carrier effect, charge to breakdown, transistor Id_Vg curve, charge trapping, and SILC(Stress Induced Leakage Current) using the HP4145 device tester. As a result we find that the characteristics of nitride oxide gate device better than wet gate oxide device, especially hot carrier lifetime(nitride oxide gate device satisfied 30 years, but the lifetime of wet gate oxide was only 0.1 year), variation of Vg, charge to breakdown, electric field simulation and charge trapping etc.

• Transactions on Electrical and Electronic Materials
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• v.17 no.3
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• pp.163-167
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• 2016

Inverter surge resistant enameled wire was prepared with an organic/inorganic hybrid nanocomposite, and the effect of ambient temperature on the insulation lifetime of the enameled wire in the form of twisted pair was studied by a withstanding voltage tester. The organic polymer was Polyesterimide-polyamideimide (EI/AI) and the inorganic material was a Nano-sized silica (average particle size : 15 nm). The enamel thickness was 50 μm and the ambient temperature was 100, 150, 200, and 250, respectively. Transmission electron microscopy (TEM) observation showed that Nano-sized Silica were evenly dispersed in EI/AI. There were many air gaps in a twisted pair, therefore, when voltage was applied to the twisted pair, enamel erosion took place in the air gap area because of partial discharge accordi, ng to Paschen’s law. As ambient temperature increased, insulation lifetime decreased according to Arrhenius relationship, which was explained by the increasing mobility of polymer chains in EI or AI. And insulation breakdown voltage value at 10 kHz was 1,864.5 sec (31.1 min), which is 1.9 times higher than at 20 kHz, 981.6 sec (16.4 min).

• Transactions on Electrical and Electronic Materials
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• v.18 no.3
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• pp.151-154
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• 2017

In this article, we investigated the various influencing factors that degraded the lifetime of suspension insulators in 154 kV transmission lines, and showed the possible solutions to avoid such breakdowns. With respect to achieve safety, reliability and aesthetical considerations, the characteristics of transmission and distribution network power cables should be improved. Suspension insulators are particularly important to study, as they have developed to be the main component of transmission lines due to their ability to withstand the electrical conductivity of high-voltage power transmission. Suspension insulators are mostly made from glass, rubber and ceramic material due to their high resistivity. In Korea, porcelain suspension insulators are typically used in the transmission line system, as they are cheaper and more flexible compared to other types of insulators. This is effective from preventing very high and steep lightening impulse voltages from causing the breakdown of suspension insulators used in power lines. Other influential factors affect the lifetime of suspension insulators that we studied include temperature, water moisture, contamination, mechanical vibration and electrical stress.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.17 no.5
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• pp.149-154
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• 2018

To improve the efficiency and lifetime of filters, we analyze the element distribution at the entrance and exit by using the flow inside a filter, confirming that the internal structure affects the filter efficiency. The flow in the pipe is predicted through computer simulations, and the filtration efficiency of each element is compared through experiments. The efficiency and lifetime of the filter are indirectly improved through the element distribution at the filter outlet according to the internal structure. Because pressure loss from the structure inevitably occurs, the efficiency and lifetime of filters against pressure loss must be considered.