• Title/Summary/Keyword: Breakdown Structure

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Development of Low-Vgs N-LDMOS Structure with Double Gate Oxide for Improving Rsp

  • Jeong, Woo-Yang;Yi, Keun-Man
    • Transactions on Electrical and Electronic Materials
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    • v.10 no.6
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    • pp.193-195
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    • 2009
  • This paper aims to develop a low gate source voltage ($V_{gs}$) N-LDMOS element that is fully operational at a CMOS Logic Gate voltage (3.3 or 5 V) realized using the 0.35 μm BCDMOS process. The basic structure of the N-LDMOS element presented here has a Low $V_{gs}$ LDMOS structure to which the thickness of a logic gate oxide is applied. Additional modification has been carried out in order to obtain features of an improved breakdown voltage and a specific on resistance ($R_{sp}$). A N-LDMOS element can be developed with improved features of breakdown voltage and specific on resistance, which is an important criterion for power elements by means of using a proper structure and appropriate process modification. In this paper, the structure has been made to withstand the excessive electrical field on the drain side by applying the double gate oxide structure to the channel area, to improve the specific on resistance in addition to providing a sufficient breakdown voltage margin. It is shown that the resulting modified N-LDMOS structure with the feature of the specific on resistance is improved by 31%, and so it is expected that optimized power efficiencies and the size-effectiveness can be obtained.

An analysis of new IGBT(Insulator Gate Bipolar Transistor) structure having a additional recessedwith E-field shielding layer

  • Yu, Seung-Woo;Lee, Han-Shin;Kang, Ey-Goo;Sung, Man-Young
    • Journal of IKEEE
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    • v.11 no.4
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    • pp.247-251
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    • 2007
  • The recessed gate IGBT has a lower on-state voltage drop compared with the DMOS IGBT, because there is no JFET resistance. But because of the electric field concentration in the corner of the gate edge, the breakdown voltage decreases. This paper is about the new structure to effectively improve the Vce(sat) voltage without breakdown voltage drop in 1700V NPT type recessed gate IGBT with p floating shielding layer. For the fabrication of the recessed gate IGBT with p floating shielding layer, it is necessary to perform the only one implant step for the shielding layer. Analysis on the Breakdown voltage shows the improved values compared to the conventional recessed gate IGBT structures. The result shows the improvement on Breakdown voltage without worsening other characteristics of the device. The electrical characteristics were studied by MEDICI simulation results.

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Design of Main Body and Edge Termination of 100 V Class Super-junction Trench MOSFET

  • Lho, Young Hwan
    • Journal of IKEEE
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    • v.22 no.3
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    • pp.565-569
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    • 2018
  • For the conventional power MOSFET (metal-oxide semiconductor field-effect transistor) device structure, there exists a tradeoff relationship between specific on-state resistance (Ron,sp) and breakdown voltage (BV). In order to overcome this tradeoff, a super-junction (SJ) trench MOSFET (TMOSFET) structure with uniform or non-uniform doping concentration, which decreases linearly in the vertical direction from the N drift region at the bottom to the channel at the top, for an optimal design is suggested in this paper. The on-state resistance of $0.96m{\Omega}-cm2$ at the SJ TMOSFET is much less than that at the conventional power MOSFET under the same breakdown voltage of 100V. A design methodology for the edge termination is proposed to achieve the same breakdown voltage and on-state resistance as the main body of the super-junction TMOSFET by using of the SILVACO TCAD 2D device simulator, Atlas.

Breakdown Characteristics of a Punch-through Diode with N+P+P-H+ Structure (N+P+P-N+ 구조를 가진 Punch-through 다이오드의 항복전압 특성)

  • Song, Se-Won;Chung, Sang-Koo;Choi, Yearn-Ik
    • Proceedings of the KIEE Conference
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    • 2002.11a
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    • pp.3-5
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    • 2002
  • Breakdown characteristics of a punch-through diode with n+p+p-n+ structure are analyzed with two-dimensional device simulation. Effects of base doping concentration and profile on the breakdown are presented. An analytical expression of a maximum base doping level for the punch-through breakdown is derived. The diode with a linearly graded base doping shows superior leakage current and capacitance is satisfactory for applications for low-voltage circuits.

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The Modeling of the Element Breakdown Structure(EBS) Applicable to Construction Fields for the Integration of the Construction Information in Apartment (공동주택에서의 건설정보통합을 위한 실무형 부위별 분류체계 구축에 관한 연구)

  • Song Hyuk;Ryu Seong-Ryong;Lee Han-Min;Chung Hwan-Wook;Im Jong-Seong;Go Seong-Seok
    • Korean Journal of Construction Engineering and Management
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    • v.1 no.4 s.4
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    • pp.98-105
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    • 2000
  • The drawing information takes the most essential part of construction information. The management of construction information through drawing information facilitates input, output and search process, thus helping maximize the usage of construction information by effectively sharing construction experience and drawing information. This paper shows how construction information can effectively used to increase the productivity of the construction process as a whole. Construction information was extracted and classified by the elements of building which are the basic and very end components of building, to accumulate information of each construction phase. Based on the result, the Element Breakdown Structure(EBS) was developed for the practical usage of construction information integration.

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Development of safety management manual using Work Breakdown Structure (작업분류체계를 이용한 철도공사 안전관리 매뉴얼 개발)

  • Hong Seon-Ho;Wang Jong-Bae;Cho Yuen-Ok;Hong Yong-Ki;Park Ok-Jung
    • Proceedings of the KSR Conference
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    • 2005.05a
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    • pp.90-96
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    • 2005
  • The existing safety-management manual is confined to list data based on regulations, and only provide ways to prevent accidents/incidents for particular work which accidents occur frequently. As it is difficult to understand the complete process involved the work, we can not expect the manual to function as a guide to prevent unfortunate events. When establishing WBS(work breakdown structure) of railway line engineering, consideration of the characteristics of train operation will enable many benefits. Therefore in this research it is conducted to materialize it in the manual. Main contents in this research are to review the way that change complete work performance process and person in charge of different tasks into WBS(work breakdown structure), and trough the newly developed WBS , the ways to improve roles and functions of the manual which Korean Railroad made are recommended.

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Development of Technical Breakdown Structure Standard in Temporary Works (건설가설공사의 표준기술분류체계 구축)

  • Park, Jun-Mo;Kim, Ok-Kyue;Park, Gil-Bum
    • Proceedings of the Korean Institute of Building Construction Conference
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    • 2013.05a
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    • pp.162-163
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    • 2013
  • A temporary work are lifting equipment that tower crane or lift, and temporary architectures that office building and storage in construction site. And it is main construction work that built and used temporarily like to a scaffolding, a walk plate, and a formwork. This study is to adjust breakdown structure of temporary work to introduce technical tendency. With a site manager, it is collected a detailed statement and compared. As a result to break down a tendency that temporary equipment, additional function, and direct work of temporary technique, first, existing detail technical indexes that group I, group J, group K, and group L are classified. Second, due to set up and manage to main agents in case of existing detail technical indexes that B1, B2, it is not wrong to classify. But, it is somewhat different, and therefore adjust it to same level. Finally, as a technical tendency that temporary equipment, additional function, and direct work of temporary technique, it is adjusted the others.

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A Study on the Novel TIGBT with Trench Collector (트렌치 콜렉터를 가지는 새로운 TIGBT 에 관한 연구)

  • Lee, Jae-In;Yang, Sung-Min;Bae, Young-Seok;Sung, Man-Young
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.23 no.3
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    • pp.190-193
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    • 2010
  • Various power semiconductor devices have been developed and evolved since 1950s. Among them, IGBT is the most developed power semiconductor device which has high breakdown voltage, high current conduction and suitable switching speed which perform trade-offs between each other. In other words, there are trade-offs between a breakdown voltage and on-state voltage drop, and between on-state voltage drop and turn-off time. In this paper, the new structure is proposed to improve a trade-off between a breakdown voltage and on-state voltage drop. The proposed structure has a trench collector and this trench collector induces an accumulation layer at the bottom of an n-drift region during off-state. And this accumulation layer prevents expansion of depletion layer so that trapezoidal electric field distribution is performed in the n-drift region. As a result of this, breakdown voltage is increased without increasing on-state voltage drop. The electrical characteristics of the proposed IGBT is analyzed and optimized by using representative device simulator, TSUPREM4 and MEDICI. After optimization, the electrical characteristics of the proposed IGBT is compared with NPT IGBT which have the same device thickness. As a result of this, it can be confirmed that the proposed structure increases the breakdown voltage of 800 V than that of the conventional NPT IGBT without increasing the on-state voltage drop.

Breakdown Voltage Characteristics of LDMOST with External Field Ring (외부 전계 링을 갖는 LDMOST의 항복전압 특성)

  • Oh Dong-joo;Yeom Kee-soo
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.8 no.8
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    • pp.1719-1724
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    • 2004
  • In this paper, we have proposed a new structure of LDMOST, which has been expected as a next generation RF power device, to improve the BV(Breakdown Voltage) characteristics. The proposed structure, named external field ring, is formed around a drift region by the three dimensional structure. The external field ring relieves the electric field in the drift region and improves the BV characteristics. By the three dimensional TCAD simulations, it was found that the BV of LDMOST was increased by the increase of the junction depth and doping concentration of the external field ring. Therefore, the BV characteristics of the LDMOST can be remarkably improved by addition of external field ring using an existing p+ sinker process.

Study on the Electrical Characteristics of the Multi-RESURF SOI LDMOSFET as a Function of Epi-layer Concentration (에피층 농도 변화에 따른 Multi-RESURF SOI LDMOSFET의 전기적 특성 분석)

  • Kim, Hyoung-Woo;Seo, Kil-Soo;Bahng, Wook;Kim, Ki-Hyun;Kim, Nam-Kyun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.19 no.9
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    • pp.813-817
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    • 2006
  • In this paper, we analyzed the breakdown voltage and on-resistance of the multi-RESURF SOI LDMOSFET as a function of epi-layer concentration. P-/n-epi layer thickness and doping concentration of the proposed structure are varied from $2{\sim}5{\mu}m\;and\;1\{times}10^{15}/cm^{3}^{\sim}9\{times}10^{15}/cm^{3}$ to find optimum breakdown voltage and on-resistance of the proposed structure. The maximum breakdown voltage of the proposed structure is $224\;V\;at\;R_{on}=0.2{\Omega}-mon^{2}\;with\;P_{epi}=3\{times}10^{15}/cm^{3},\;N_{epi}=7\{times}10^{15}/cm^{3}\;and\;L_{epi}=10{\mu}m$. Characteristics of the device are verified by two-dimensional process simulator ATHENA and device simulator ATLAS.