• Journal of the Korean Crystal Growth and Crystal Technology
• /
• v.19 no.2
• /
• pp.75-78
• /
• 2009

Si-doped GaAs single crystals were grown by vertical gradient freeze using PBN crucibles. The amount of oxide layer $B_{2}O_{3}$ in PBN crucible was changed($0{\sim}0.2wt%$) and measured the concentration of carriers. The segregation coefficients of Si in GaAs melt decreased rapidly from initial 0.1 to 0.01 as the amount of $B_{2}O_{3}$ increases. At the same time, concentration of carriers was shown to decrease. It is likely that the reaction between dopant Si and $B_{2}O_{3}$ in GaAs melt results in the reduction of Si dopants(donor) while increase in the amount of boron(acceptor). The thin layer of $B_{2}O_{3}$ glass in PBN crucible was proved to be a better way to reduce defect formation rather than the total amount of $B_{2}O_{3}$.

• Journal of Welding and Joining
• /
• v.31 no.3
• /
• pp.31-38
• /
• 2013

The transition of serrated grain boundary and its effect on liquation behavior in the simulated weld heat-affected zone (HAZ) have been investigated in a wrought Ni-based superalloy Alloy 263. Recently, the present authors have found that grain boundary serration occurs in the absence of adjacent coarse ${\gamma}^{\prime}$ particles or $M_{23}C_6$ carbides when a specimen is direct-aged with a combination of slow cooling from solution treatment temperature to aging temperature. The present study was initiated to determine the interdependence of the serration and HAZ property with a consideration of this serration as a potential for the use of a hot-cracking resistant microstructure. A crystallographic study indicated that the serration led to a change in grain boundary character as special boundary with a lower interfacial energy as those terminated by low-index {111} boundary planes. It was found that the serrated grain boundaries are highly resistant to boron enrichment, and suppress effectively grain coarsening in HAZ. Furthermore, the serrated grain boundaries showed a higher resistance to susceptibility of liquation cracking. These results was discussed in terms of a significant decrease in interfacial energy of grain boundary by the serration.

• Korean Journal of Materials Research
• /
• v.14 no.12
• /
• pp.829-834
• /
• 2004

Annealing of $Cu(B)/Ti/SiO_2$ in vacuum has been carried out to investigate the effects of Ti underlayer on microstructure in $Cu(B)/Ti/SiO_2$ structures. For comparison, $Cu(B)/Ti/SiO_2$ structures was also annealed in vacuum. Three different temperature dependence of Cu growth can be seen in $Cu(B)/Ti/SiO_2$; B precipitates- pinned grain growth, abnormal grain growth, normal grain growth. The Ti underlayer having a strong affinity for B atoms reacts with the out-diffused B to the Ti surface and forms titanium boride at the Cu-Ti interface. The formation of titanium boride acts as a sink for the out-diffusion of B atoms. The depletion of boron in grain boundaries of Cu films, as results of the rapid diffusion of B along the grain boundaries and the insufficient segregation of B to the grain boundaries, induces grain boundaries to migrate and causes the abnormal grain growth. The increased bulk diffusion coefficient of B within Cu grains can be responsible for the normal grain growth occurring in the annealed $Cu(B)/Ti/SiO_2\;at\;600^{\circ}C$. In contrast, the $Cu/SiO_2$ structures show only the abnormal growth of grains and their sizes increasing as the temperature increases above $400^{\circ}C$.

• Proceedings of the KWS Conference
• /
• 2010.05a
• /
• pp.73-73
• /
• 2010

합금원소가 다량 첨가된 고합금강, 스테인리스강, Ni기 초내열합금 등은 용접시 혹은 후열처리 동안 열영향부 (HAZ: heat-affected-zone)에서 결정립계를 따라서 액화균열이 종종 발생한다. 이러한 액화균열은 급속한 가열시 HAZ의 결정립계가 국부적으로 용융되어 액상필름을 형성하고, 냉각시 수축으로 인한 인장구속응력에 의해 필름을 따라서 균열이 발생하여 생성된다. HAZ 결정립계 액화는 탄화물, 황화물, 인화물, 보론계 화합물 등이 급가열시 기지와의 반응에 의해 표피 액상을 형성하는 조성적 액화 (constitutional liquation)에 의한 액상의 결정립계 침투로 설명되거나, 결정립계 자체의 용융점을 상당량 낮추는 보론(B), 인(P), 황(S)등의 편석에 의한 국부적 입계 용융으로 주로 연관 지어 해석한다. HAZ 액화균열은 고온 입계균열 현상이므로, 결정립계의 특성에 따라 크게 영향을 받으며 결정립계 character 설계에 의해 액화균열 저항성을 개선시킬 수 있음을 유추할 수 있다. 한편, 본 연구자들은 최근 Ni기 초내열합금에 있어 입계 serration 현상을 새롭게 발견하였으며, 이론적 접근법을 통해 serration을 위한 특별한 열처리 방법을 개발하였다. 형성된 파형입계는 결정학적인 관점에서 조밀 {111} 입계면을 갖도록 분해 (dissociation)되어 낮은 계면에너지를 갖게 됨을 확인하였으며, 입계형상 변화뿐만 아니라 탄화물 특성변화까지 유도하여 크리프 수명을 기존대비 약 40% 정도 향상시킴을 확인하였다. 본 연구에서는 이러한 직선형 입계 대비 'special boundary'로 간주되는 파형입계가 도입될 경우, 보론 편석 및 HAZ 액화거동에 미치는 영향을 고찰하고자 하였다. SIMS (secondary ion mass spectrometry)를 이용하여 열처리 직후 결정립계 보론편석 정도를 비교하였다. 파형입계 시편의 경우, 일반직선형 시편에 비해 결정립계에 보론편석 저항성이 우수함을 확인할 수 있었다. 재현 HAZ 열사이클 시험을 통해 미세조직을 정량적으로 분석하였다. 파형입계 시편 및 일반직선형 시편 모두 최고온도 $1060^{\circ}C$이상부터 입계 탄화물이 기지내로 완전 용해되고 입계가 액화되기 시작하였다. 최고온도별로 입계액화비율을 정량적으로 비교한 결과, 파형입계가 직선입계 대비 훨씬 낮음을 확인할 수 있었으며, 때때로 액화된 필름이 입계를 따라 전파되지 않고 부분적으로 단락되어 있음이 관찰되었다. 액화시험 후 투과전자현미경을 이용한 EDS (energy dispersive spectrometry) 분석을 통해 결정립계 액화의 주요원인은 입계 $M_{23}C_6$의 조성적 액화반응 보다는 보론 편석 (원자 및 $M_{23}(CB)_6$)으로 인한 결정립계 국부용융이 더 유력함을 유추할 수 있었다. 따라서 상기 결과로부터 입계구조가 안정되어 계면에너지가 낮은 파형입계가 보론편석에 대한 저항성이 우수하였으며, 이러한 결과는 액화 저항성에 대응되어 영향을 미침을 알 수 있었다. 게다가 파형입계에 액상 필름이 생성되더라도 낮은 계면에너지에 의해 비롯된 상대적으로 낮은 적심성 (wettability)에 의해 필름이 쉽게 전파되지 않음을 'Smith 입계 wetting 이론'을 이용하여 해석할 수 있었다.

• Korean Journal of Materials Research
• /
• v.3 no.5
• /
• pp.553-561
• /
• 1993

In this study, thr effect of $Bi_2O_3$ and BN addition as grain boundary modifiers on sintering and electrical properties of semiconducting PTCR(Positive Temperature Coefficient of Resistivity) mate rial were analyzed using TMA, XRD and Complex Impedance Spectroscopy method. Bismut.h Ox~de and Boron Nitride were added to Y-doped $BaTiO_3$ respectively. Bismuth sesquioxide up to O.lmol%solubil~ ty limit of $Bi_2O_3$ in Y--$BaTiO_3$ ceramics-retarded densification and grain growth, and further addition mitigated these retardation effects. The resistivity at room temperature increased with increasing amount of $Bi_2O_3$ and thus decreased the PTCR effect, probably due to the $Bi_2O_3$ segregation on the grain boundaries. From the complex ~mpedance pattern, it is known that the grain boundary resisitivity is dominant on the whole resistivity of sample. In the result of applying the defect chemistry, $Bi^{3+} \;and \; Bi^[5+}$ are substituted for Ua and Ti site, respectively. Boron nitride decomposed and formed liquid phase among the $BaTiO_3$ grains. The decomposed com~ ponents made the second phase and existed the tr~ple juntion from the result of EPMA. From the complex impendencc pattern, the gram and grain boundary resistivity were small. The grain size increased with increasing BN contents, and decreased grain boundary resistivity enhanced the PTCR effect.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.31 no.1
• /
• pp.6-10
• /
• 2018

Ni germanide (NiGe) is a promising alloy material with small contact resistance at the source/drain (S/D) of Ge MOSFETs. However, it is necessary to reduce the specific contact resistance between NiGe and the doped Ge S/D region in high-performance MOSFETs. In this study, a novel method is proposed to reduce the specific contact resistance between NiGe and p-type Ge (p-Ge) using a Tb interlayer. The specific contact resistance between NiGe and p-Ge was successfully decreased with the introduction of the Tb interlayer. To investigate the mechanism behind the reduction in the specific contact resistance, the elemental distribution and crystalline structure of NiGe were analyzed using secondary ion mass spectroscopy and X-ray diffraction. It is likely that the reduction in specific contact resistance was caused by an increase in the concentration of boron in the space between NiGe and p-Ge due to the influence of the Tb interlayer.