• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2007년도 SMT/PCB 기술세미나
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• pp.37-47
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• 2007

Factor : Structure Metal pad & SMO size Board level TC test : - Large SMO size better Board level Drop test : - Large SMO size better Factor : Structure Substrate thickness Board level TC test : - Thick substrate better Board level Drop test : - Substrate thickness is not a significant factor for drop test Factor : Material Solder alloy Board level TC test : - Not so big differences over Pb-free solder and NiAu, OSP finish Board level Drop test : - Ni/Au+SAC105, CuOSP+LF35 are better Factor : Material Pad finish Board level TC test : - NiAu/NiAu is best Board livel Drop test : - CuOSP is best Factor : Material Underfill Board level TC test - Several underfills (reworkable) are passed TCG x500 cycles Board level Drop test : - Underfill lots have better performance than non-underfill lots Factor : Process Multiple reflow Board level TC test : - Multiple reflow is not a significant actor for TC test Board level Drop test : N/A Factor : Process Peak temp Board level TC test : - Higher peak temperature is worse than STD Board level Drop test : N/A Factor : Process Stack method Board level TC test : - No big difference between pre-stack and SMT stack Board level Drop test : - Flux dipping is better than paste dipping but failure rate is more faster

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2004년도 ISMP Pb-free solders and the PCB technologies related to Pb-free solders
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• pp.233-241
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• 2004

A new alloy definition will be presented concerning increasing demands for the board level reliability of miniaturized interconnections. The damage mechanism for LFBGA components on different board finishes is not quite understood. Further demands from mobile phones are the drop test, characterizing interface performance of different package constructions in relation to decreased pad constructions and therefore interfaces. The paper discusses the characterization of interfaces based on SnPb, SnPbXYZ, SnAgCu and SnAgCuInNd ball materials and SnAgCuInNd as solder paste, the stability after accelerated tests and the description of modified interfaces strictly related to the assembly conditions, dissolution behavior of finishes on board side and the influence of intermetallic formation. The type of intermetallic as well as the quantity of intermetallics are observed, primaliry the hardness, E modules describing the ability of strain/stress compensation. First results of board level reliability are presented after TCT-40/+150. Improvement steps from the ball formulation will be discussed in conjunction to the implementation of lead free materials In order to optimize ball materials for area array devices accelareted aging conditions like TCTs were used to analyze the board level reliability of different ball materials for BGA, LFBGA, CSP, Flip Chip. The paper outlines lead-free ball analysis in comparison to conventional solder balls for BGA and chip size packages. The important points of interest are the description of processability related to existing ball attach procedures, requirements of interconnection properties and the knowledge gained the board level reliability. Both are the primary acceptance criteria for implementation. Knowledge about melting characteristic, surface tension depend on temperature and organic vehicles, wetting behavior, electrical conductivity, thermal conductivity, specific heat, mechanical strength, creep and relaxation properties, interactions to preferred finishes (minor impurities), intermetallic growth, content of IMC, brittleness depend on solved elements/IMC, fatigue resistance, damage mechanism, affinity against oxygen, reduction potential, decontamination efforts, endo-/exothermic reactions, diffusion properties related to finishes or bare materials, isothermal fatigue, thermo-cyclic fatigue, corrosion properties, lifetime prediction based on board level results, compatibility with rework/repair solders, rework temperatures of modified solders (Impurities, change in the melting point or range), compatibility to components and laminates.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2004년도 ISMP Pb-free solders and the PCB technologies related to Pb-free solders
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• pp.211-219
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• 2004

A new alloy definition will be presented concerning increasing demands for the board level reliability of miniaturized interconnections. The damage mechanism for LFBGA components on different board finishes is not quite understood. Further demands from mobile phones are the drop test, characterizing interface performance of different package constructions in relation to decreased pad constructions and therefore interfaces. The paper discusses the characterization of interfaces based on SnPb, SnPbXYZ, SnAgCu and SnAgCuInNd ball materials and SnAgCuInNd as solder paste, the stability after accelerated tests and the description of modified interfaces stric시y related to the assembly conditions, dissolution behavior of finishes on board side and the influence of intermetallic formation. The type of intermetallic as well as the quantity of intermetallics are observed, primaliry the hardness, E modules describing the ability of strain/stress compensation. First results of board level reliability are presented after TCT-40/+150. Improvement steps from the ball formulation will be discussed in conjunction to the implementation of lead free materials. In order to optimize ball materials for area array devices accelareted aging conditions like TCTs were used to analyze the board level reliability of different ball materials for BGA, LFBGA, CSP, Flip Chip. The paper outlines lead-free ball analysis in comparison to conventional solder balls for BGA and chip size packages. The important points of interest are the description of processability related to existing ball attach procedures, requirements of interconnection properties and the knowledge gained the board level reliability. Both are the primary acceptance criteria for implementation. Knowledge about melting characteristic, surface tension depend on temperature and organic vehicles, wetting behavior, electrical conductivity, thermal conductivity, specific heat, mechanical strength, creep and relaxation properties, interactions to preferred finishes (minor impurities), intermetallic growth, content of IMC, brittleness depend on solved elements/IMC, fatigue resistance, damage mechanism, affinity against oxygen, reduction potential, decontamination efforts, endo-/exothermic reactions, diffusion properties related to finishes or bare materials, isothermal fatigue, thermo-cyclic fatigue, corrosion properties, lifetime prediction based on board level results, compatibility with rework/repair solders, rework temperatures of modified solders (Impurities, change in the melting point or range), compatibility to components and laminates.

• 마이크로전자및패키징학회지
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• 제18권2호
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• pp.35-41
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• 2011

Recently, board level solder joint reliability performance of IC packages during drop impact becomes a great concern to semiconductor and electronic product manufacturers. The handheld electronic products are prone to being dropped during their useful service life because of their size and weight. The IC packages are susceptible to solder joint failures, induced by a combination of printed circuit board (PCB) bending and mechanical shock during impact. The board level drop testing is an effective method to characterize the solder joint reliability performance of miniature handheld products. In this paper, applying the JEDEC (JESD22-B111) standard present a finite element modeling of the FBGA. The simulation results revealed that maximum stress was located at the outermost solder ball in the PCB or IC package side, which consisted well with the location of crack initiation observed in the failure analysis after drop reliability tests.

• Physical Therapy Rehabilitation Science
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• 제11권4호
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• pp.488-492
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• 2022

Objective: The purpose of this study is to find out the reliability and validity of the newly updated Balancia 2.5 program using Wii balance board through equipment that can measure center of pressure data with the precision. Design: Cross-sectional study Methods: Twenty-seven healthy adults participated in the study. The subjects were assessed for static balance ability by Accusway, and were assessed for static balance ability on Wii balance board connected to theBalancia 2.5 program.To limit postural fluctuations due to stare, the subjects were asked to look at a 15 cm dot drawn 3 m in front of them for 30 seconds with their eyes open. Static balance ability data such as path length and sway velocity were extracted from all measurement tools.Intra-rater and inter-rater reliability and validity were extracted through intraclass correlation coefficient (ICC) and 95% confidence interval (CI). Results: The intra-rater reliability that the same rater shows consistent results through test-retest was a high level at ICC=0.968 (0.926~0.986), and inter-rater reliability that the requires consistent results even when measured by different raters was a high level at ICC=0.943 (0.870~0.975). The validity was a high level at ICC=0.948 (0.881~0.977), which shows whether the measurement tool is properly measuring what it is intended to measure. Conclusions: The Balancia 2.5 program, newly updated through this study, proved to be a program with high reliability and validity in evaluating static balance ability like the existingBalancia 2.0 program.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2002년도 춘계 기술심포지움 논문집
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• pp.138-141
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• 2002

There are continuous efforts in the electronics industry to a reduced electronic package size. Reducing the size of electronic packages can be achieved by a variety of means, and for ball grid array(BGA) packages an effective method is to decrease the pitch between the individual balls. Chip scale package(CSP) and BGA are now one of the major package types. However, a reduced package size has the negative effect of reducing board-level reliability. The reliability concern is for the different thermal expansion rates of the two-substrate materials and how that coefficient CTE mismatch creates added stress to the BGA solder joint when thermal cycled. The point of thermal fatigue in a solder joint is an important factor of BGA packages and knowing at how many thermal cycles can be ran before failure in the solder BGA joint is a must for designing a reliable BGA package. Reliability of the package was one of main issues and underfill was required to improve board-level reliability. By filling between die and substrate, the underfill could enhance the reliability of the device. The effect of underfill on various thermomechanical reliability issues in $\mu$BGA packages is studied in this paper.

• 한국철도학회:학술대회논문집
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• 한국철도학회 2011년도 춘계학술대회 논문집
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• pp.1195-1201
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• 2011

Since the release of safety standard IEC 61508 which defines functional safety of electronic safety-related systems, SIL(Safety Integrity Level) certification for railway systems has gained lots of attention lately. In this paper, we propose a new design technique of the computer board for train control systems with high reliability and safety. The board is designed with TMR(Triple Modular Redundancy) using a certified SIL3 Texas Instrument(TI)'s TMS570 MCU(Micro-Controller Unit) to guarantee safety and reliability. TMR for the control device is implemented on FPGA(Field Programmable Gate Array) which integrates a comparator, a CAN(Controller Area Network) communication module, built-in self-error checking, error discriminant function to improve the reliability of the board. Even if a malfunction of a processing module occurs, the safety control function based on the proposed technique lets the system operate properly by detecting and masking the malfunction. An RTOS (Real Time Operation System) called FreeRTOS is ported on the board so that reliable and stable operation and convenient software development can be provided.

• 마이크로전자및패키징학회지
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• 제15권2호
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• pp.47-54
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• 2008

컴포넌트에서의 비정상적인 금속간화합물 성장이 보드 레벨 기계적 신뢰성에 미치는 영향을 연구하기 위하여, 전기 도금된 Ni/Au UBM과 Sn2.5Ag0.5Cu 솔더의 리플로우 횟수 및 고온 시효 시간에 따른 금속간 화합물 성장거동을 관찰하였다. 각 조건별로 처리된 컴포넌트에서 솔더 접합부의 기계적 특성을 비교하기 위하여, 전단 속도 변화에 따른 볼 전단 시험을 실시하여 전단에너지 값을 측정하였다. 마지막으로, 보드 레벨에서의 기계적 신뢰성 시험을 위하여 조건별로 처리된 컴포넌트를 PCB 보드에 실장하여, 3점 굽힘 시험 및 충격 시험을 실시한 후 파괴모드를 분석하였다.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2008년도 추계학술대회 논문집
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• pp.245-246
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• 2008

• 한국철도학회:학술대회논문집
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• 한국철도학회 2006년도 추계학술대회 논문집
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• pp.947-953
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• 2006

ATC on-board equipment require realtime embedded software with high level of safety and reliability. To satisfy these requirements, many techniques are applied to the development of software during the lifecycle. In case of software modeling, object-oriented methodology is widening its niche replacing traditional structured methodology and modeling in UML using a CASE tool is a growing trend. In this paper, we modeled ATC on-board software in UML using Rhapsody, which is a modeling tool for realtime embedded software. We modeled the behavior of ATC on-board equipment based on state machine diagram and validated the model using the animation feature provided in the tool. According to our study, the CASE tool based on UML showed high level of applicability in modeling and verifying the software with complex behavioral characteristics.