• Title/Summary/Keyword: BOE chemical

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Improved Mechanical Motion in Oxide Wet Etch Process with BOE chemical (BOE 약액을 사용하는 공정의 로봇 동작 개선)

  • Kim, Eung-Do;Son, Won-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.363-363
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    • 2010
  • After oxide wet etch with BOE(Buffered Oxide Etchant), triangle type defect maps were inspected and SEM image showed them unetch of oxide layer. As decreasing design rule, oxide unetch has become a crucial issue and has affected the yield and quality.

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Wet Etching Characteristics of Cu Surface for Cu-Cu Pattern Direct Bonds (Cu-Cu 패턴 직접접합을 위한 습식 용액에 따른 Cu 표면 식각 특성 평가)

  • Park, Jong-Myeong;Kim, Yeong-Rae;Kim, Sung-Dong;Kim, Jae-Won;Park, Young-Bae
    • Journal of the Microelectronics and Packaging Society
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    • v.19 no.1
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    • pp.39-45
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    • 2012
  • Three-dimensional integrated circuit(3D IC) technology has become increasingly important due to the demand for high system performance and functionality. In this work, BOE and HF wet etching of Cu line surfaces after CMP were conducted for Cu-Cu pattern direct bonding. Step height of Cu and $SiO_2$ as well as Cu dishing after Cu CMP were analyzed by the 3D-Profiler. Step height increased and Cu dishing decreased with increasing BOE and HF wet etching times. XPS analysis of Cu surface revealed that Cu surface oxide layer was partially removed by BOE and HF wet etching treatment. BOE treatment showed not only the effective $SiO_2$ etching but also reduced dishing and Cu surface oxide rather than HF treatment, which can be used as an meaningful process data for reliable Cu-Cu pattern bonding characteristics.

The Effect of Surface Roughness on SiC by Wet Chemical Etching (SiC 표면 거칠기에 미치는 습식식각의 영향)

  • Kim, Jae-Kwan;Jo, Young-Je;Han, Seung-Cheol;Lee, Hae-Yong;Lee, Ji-Myon
    • Korean Journal of Metals and Materials
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    • v.47 no.11
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    • pp.748-753
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    • 2009
  • The surface morphology and the surface roughness of n-type SiC induced by wet-treatment using 45% KOH and buffered oxide etchant (BOE-1HF : $6H_2O$) were investigated by atomic force microscopy (AFM). While Si-face of SiC could be etched by alkali solutions such as KOH, acidic solutions such as BOE were hardly able to etch SiC. When the rough SiC samples were used, the surface roughness of etched sample was decreased after wet-treatment regardless of etchant, due to the planarization the of surface by widening of scratches formed by mechanical polishing. It was observed that the initial etching was affected by the energetically unstable sites, such as dangling bond and steps. However, when a relatively smooth sample was used, the surface roughness was rapidly increased after treatment at $180^{\circ}C$ for 1 hr and at room temperature for 4 hr by using KOH solution, resulting from the nano-sized structures such as pores and bumps. This indicates that porous SiC surface can be achieved by using purely chemical treatment.

Development of Multi-Chemical Supply System for Semiconductor Wafer Cleaning Station

  • Chung, Myung-Jin;Song, Young-Wook
    • 제어로봇시스템학회:학술대회논문집
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    • 2005.06a
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    • pp.1309-1312
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    • 2005
  • A multi-chemical supply system is developed and applied to a wet station, which uses the multi-chemical process in one bath. To control the concentration of two chemicals, control logic of a supply pump is programmed using the programable logic controller (PLC). By using the multi-chemical supply system, wet station with single bath is applied to cleaning process using multi chemicals such as buffed oxide etchant (BOE) and standard clean 1 (SC-1). The concentration of each chemical is measured in the bath to verify the multi-chemical supply system. The control range in the each chemical concentration is measured to 1.33weight% in NH4OH and 0.23weight% in H2O2. The multi-chemical supply system can be movable and usable as an independent module of fixed wet station. By simply midifying the PLC, a multi-chemical supply system can be developed for a wet station.

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The Scattering Beam Measurement of the RBC and the Fabrication of the Micro Cell Biochip (적혈구의 산란빔 측정과 마이크로 세포 분석 바이오칩 제작)

  • Byun, In Soo;Kwon, Ki Jin;Lee, Joon Ha
    • Progress in Medical Physics
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    • v.25 no.2
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    • pp.116-121
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    • 2014
  • Next future, The bio technology will be a rapidly developing. This paper is the scattering beam measurement of the red blood cell (RBC) and the fabrication of the micro cell biochip using the bio micro electro mechanical system (Bio-MEMS) process technology. The Major process method of Bio-MEMS technology was used the buffered oxide etchant (BOE), electro chemical discharge (ECD) and ultraviolet sensitive adhesives (UVSA). All experiments were the 10 times according to the process conditions. The experiment and research are required the ultraviolet expose, the micro fluid current, the cell control and the measurement of the output voltage Vpp (peak to peak) waveform by scattering angles. The transmitting and receiving of the laser beam was used the single mode optical fiber. The principles of the optical properties are as follows. The red blood cells were injected into the micro channel. The single mode optical fiber was inserting in the guide channel. The He-Ne laser beam was focusing in the single mode optical fiber. The transmission He-Ne laser beam is irradiating to the red blood cells. The manufactured guide channel consists of the four inputs and the four outputs. The red blood cell was allowed with the cylinder pump. The output voltage Vpp waveform of the scattering beam was measured with a photo detector. The receiving angle of the output optical fiber is $0^{\circ}$, $5^{\circ}$, $10^{\circ}$, $15^{\circ}$. The magnitude of the output voltage Vpp waveform was measured in the decrease according to increase of the reception angles. The difference of the output voltage Vpp waveform is due differences of the light transmittance of the red blood cells.

Nano-Sized Phosphor by Reverse Emulsion Process and Precision Nozzle Phosphor Patterning

  • Park, Lee-Soon;Yoon, Hae-Sang;Han, Yoon-Soo;Im, Moo-Sik;Kwon, Young-Hwan
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.536-539
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    • 2004
  • A novel ink-jet printing method was investigated for fine patterning of phosphor layer in PDP using a precision nozzle printing. A reverse emulsion method was developed for the synthesis of nano-sized phosphor powder that could be formulated in the phosphor ink. The composition of the phosphor ink including charge controlling agents, solvent, dispersant and nano-sized phosphor powder was optimized for the fine patterning of phosphor layer for high resolution PDP.

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Electrophoretic Display by using Microcup Sheet and Charged Particles

  • Park, Lee-Soon;Park, Jin-Woo;Choi, Hae-Yun;Han, Yoon-Soo;Kwon, Young-Hwan;Choi, Hyung-Suk
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.966-970
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    • 2004
  • Electrophoretic display has recently stimulated tremendous interest due to potential commercialization in the filed of information displays including e-books, e-newspapers, and other low-power portable displays. A new transparent soft mold press (TSMP) process developed in this study was found to give a good electrophoretic display panel with prepatterned micropools for the filling of charged particle slurry. It was also found that charged $TiO_2$ particles with 74.09 mV of zeta potential and 3.11 ${\times}$ $10^{-5}$ $cm^2$/Vs of mobility were successfully prepared.

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고굴절률 PECVD SiNx 박막의 성장 및 그 표면특성 분석

  • Chu, Seong-Jung;Jeong, Jae-Uk;Jeong, Ui-Seok;Park, Jeong-Ho
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.121-122
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    • 2011
  • 광도파로 기반 센서의 성능을 개선시키기 위해서는 코어와 클래딩 층의 굴절률 차를 크게 하여 표면감도를 향상시켜야 한다. 이를 위해 센서용 광도파로 코어 층을 위한 고굴절률 SiNx 박막을 플라즈마 화학기상증착(PECVD, plasma enhanced chemical vapor deposition)법을 이용하여 성장한 후 그 표면특성을 분석하였다. 이 때 플라즈마 화학기상증착 공정 조건 중 NH3 가스를 제외하여 Si 성분이 많은 고굴절률 SiNx 박막의 성장을 유도하고 He/SiH4 가스유량비를 0에서 100까지 변화시켜 SiNx 박막의 표면거칠기를 제어하였다. Si기판 위에 SiNx 박막을 10분 성장 후 BOE(buffered oxide etchant)로 선택식각하여 그 박막두께를 alpha step으로 측정하는 방법으로 He/SiH4 가스유량비 조건별 박막성장률을 계산하였다. 그 결과 He/SiH4 가스유량비 증가함에 따라 박막성장률이 33 nm/min에서 19 nm/min으로 선형적인 감소함을 알 수 있었다. 박막두께가 190 nm가 되도록 He/SiH4 가스유량비 조건별 SiNx 박막을 성장한 후 그 표면특성을 AFM (atomic force microscope)으로 관찰하였다. 이를 통해 He/SiH4 가스유량비가 50일 때 SiNx 박막의 표면거칠기가 최소가 됨을 알 수 있었다.

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The Si Microwire Solar Cell Fabricated by Noble Metal Catalytic Etching (Noble metal catalytic etching법으로 제조한 실리콘 마이크로와이어 태양전지)

  • Kim, Jae-Hyun;Baek, Sung-Ho;Choi, Ho-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.11a
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    • pp.278-278
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    • 2009
  • A photovoltaic device consisting of arrays of radial p-n junction wires enables a decoupling of the requirements for light absorption and carrier extraction into orthogonal spatial directions. Each individual p-n junction wire in the cell is long in the direction of incident light, allowing for effective light absorption, but thin in orthogonal direction, allowing for effective carrier collection. To fabricate radial p-n junction solar cells, p or n-type vertical Si wire cores need to be produced. The majority of Si wires are produced by the vapor-liquid-solid (VLS) method. But contamination of the Si wires by metallic impurities such as Au, which is used for metal catalyst in the VLS technique, results in reduction of conversion efficiency of solar cells. To overcome impurity issue, top-down methods like noble metal catalytic etching is an excellent candidate. We used noble metal catalytic etching methods to make Si wire arrays. The used noble metal is two; Au and Pt. The method is noble metal deposition on photolithographycally defined Si surface by sputtering and then etching in various BOE and $H_2O_2$ solutions. The Si substrates were p-type ($10{\sim}20ohm{\cdot}cm$). The areas that noble metal was not deposited due to photo resist covering were not etched in noble metal catalytic etching. The Si wires of several tens of ${\mu}m$ in height were formed in uncovered areas by photo resist. The side surface of Si wires was very rough. When the distance of Si wires is longer than diameter of that Si nanowires are formed between Si wires. Theses Si nanowires can be removed by immersing the specimen in KOH solution. The optimum noble metal thickness exists for Si wires fabrication. The thicker or the thinner noble metal than the optimum thickness could not show well defined Si wire arrays. The solution composition observed in the highest etching rate was BOE(16.3ml)/$H_2O_2$(0.44M) in Au assisted chemical etching method. The morphology difference was compared between Au and Pt metal assisted chemical etching. The efficiencies of radial p-n junction solar Cells made of the Si wire arrays were also measured.

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Optoelectronic properties of p-n hetero-junction array of networked p-CNTs and aligned $n-SnO_2$ nanowires

  • Min, Gyeong-Hun;Yun, Jang-Yeol;Ha, Jeong-Suk
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.274-274
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    • 2010
  • 최근 들어 나노선을 이용한 pn 접합 소자 연구 결과가 매우 활발하게 보고되고 있다. 그러나, 서로 다른 두 종류의 나노선으로 pn 접합 어레이 구조의 소자를 제작할 때, 나노선을 원하는 위치에 정렬하는 기술상의 어려움이 큰 걸림돌이 된다. 본 연구에서는 p-CNT와 n-$SnO_2$ 나노선을 이용한 pn 접합 어레이 구조를 제작할 수 있는 독창적인 공정기술을 제안한다. 먼저 $SiO_2$가 300 nm 성장된 Si 기판을 선택적으로 패터닝하여 BOE (6:1) 용액으로 $SiO_2$ 층을 80 nm 정도 선택적으로 에칭한 후, 선택적으로 에칭된 표면에 슬라이딩 장비를 이용하여 화학기상증착법(chemical vapor deposition: CVD)으로 성장된 n-$SnO_2$ 나노선을 전이시킨다. 그 다음 thermal tape를 이용하여 CVD 법으로 성장된 랜덤 네트워크 형태의 CNT를 $SnO_2$ 나노선이 전이된 기판 위에 전이 시킨다. 이때 성장된 CNT 필름 중 금속성 나노선을 통한 전하 이동을 감소시키기 위해, 촉매로 사용되는 페리틴의 농도를 낮춰서 전체적인 CNT의 농도를 줄이는 방법을 이용하였다. 따라서, 성장된 CNT 필름은 별도의 후처리 없이 p-형의 반도체성을 보였다. 제작된 pn-소자는 정류비가 ~103 인 정류특성을 보였으며, 254 nm 파장의 UV lamp를 조사하여 광전류가 발생하는 것을 확인하였다. 연구결과는 이종의 나노선 접합에 의한 다이오드 응용과 UV 센서응용 가능성을 보여준다.

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