• Title/Summary/Keyword: Au wire

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Simulation of Ultrasonic Stress During Impact Phase in Wire Bonding

  • Mayer, Michael
    • Journal of the Microelectronics and Packaging Society
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    • v.20 no.4
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    • pp.7-11
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    • 2013
  • As thermosonic ball bonding is developed for more and more advanced applications in the electronic packaging industry, the control of process stresses induced on the integrated circuits becomes more important. If Cu bonding wire is used instead of Au wire, larger ultrasonic levels are common during bonding. For advanced microchips the use of Cu based wire is risky because the ultrasonic stresses can cause chip damage. This risk needs to be managed by e.g. the use of ultrasound during the impact stage of the ball on the pad ("pre-bleed") as it can reduce the strain hardening effect, which leads to a softer deformed ball that can be bonded with less ultrasound. To find the best profiles of ultrasound during impact, a numerical model is reported for ultrasonic bonding with capillary dynamics combined with a geometrical model describing ball deformation based on volume conservation and stress balance. This leads to an efficient procedure of ball bond modelling bypassing plasticity and contact pairs. The ultrasonic force and average stress at the bond zone are extracted from the numerical experiments for a $50{\mu}m$ diameter free air ball deformed by a capillary with a hole diameter of $35{\mu}m$ at the tip, a chamfer diameter of $51{\mu}m$, a chamfer angle of $90^{\circ}$, and a face angle of $1^{\circ}$. An upper limit of the ultrasonic amplitude during impact is derived below which the ultrasonic shear stress at the interface is not higher than 120 MPa, which can be recommended for low stress bonding.

Enhancement of Cu Wire Bondability by Increasing the Surface Roughness of Capillary (표면 요철이 발달된 캐필러리 적용에 따른 Cu 와이어의 본딩 특성)

  • Lee, Jong-Hyun;Kim, Ju-Hyung;Kang, Hong-Jeon;Kim, Hak-Bum;Moon, Jung-Tak;Riu, Doh-Hyung
    • Korean Journal of Metals and Materials
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    • v.50 no.12
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    • pp.913-920
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    • 2012
  • In spite of some problems in processability and bondability, Au wires in the microelectronics industry are gradually being replaced by copper wires to reduce the cost of raw material. In this article, the effects of surface roughness enhanced capillaries on thermosonic Cu wire bonding were evaluated. The roughness-enhanced zirconia toughened alumina (ZTA) capillaries were fabricated via a thermal grooving technique. As a result, the shear bond strength of first bonds (ball bonds) bonded using the roughness-enhanced capillary was enhanced by 15% as compared with that of normal bonds due to more effective plastic deformation and flow of a Cu ball. In the pull-out test of second bonds (stitch bonds), processed at two limit conditions on combinations of process parameters, the bond strength of bonds formed using the roughness-enhanced capillary also resulted in values higher by 55.5% than that of normal bonds because of the increase in the bonding area, indicating the expansion of a processing window for Cu wire bonding. These results suggest that the adoption of roughness-enhanced capillaries is a promising approach for enhancing processability and bondability in Cu wire bonding.

Process Capability Optimization of Ball Bonding Using Response Surface Analysis in Light Emitting Diode(LED) Wire Bonding (반응 표면 분석법을 이용한 Light Emitting Diode(LED) wire bonding 용 Ball Bonding 공정 최적화에 관한 연구)

  • Kim, Byung-Chan;Ha, Seok-Jae;Yang, Ji-Kyung;Lee, In-Cheol;Kang, Dong-Seong;Han, Bong-Seok;Han, Yu-Jin
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.18 no.4
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    • pp.175-182
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    • 2017
  • In light emitting diode (LED) chip packaging, wire bonding is an important process that connects the LED chip on the lead frame pad with the Au wire and enables electrical operation for the next process. The wire bonding process is divided by two types: thermo compression bonding and ultrasonic bonding. Generally, the wire bonding process consists of three steps: 1st ball bonding that bonds the shape of the ball on the LED chip electrode, looping process that hangs the wire toward another connecting part with a loop shape, and 2nd stitch bonding that forms and bonds to another electrode. This study analyzed the factors affecting the LED die bonding processes to optimize the process capability that bonds a small Zener diode chip on the PLCC (plastic-leaded chip-carrier) LED package frame, and then applied response surface analysis. The design of experiment (DOE) was established considering the five factors, three levels, and four responses by analyzing the factors. As a result, the optimal conditions that meet all the response targets can be derived.

Wafer Level Package Using Glass Cap and Wafer with Groove-Shaped Via (유리 기판과 패인 홈 모양의 홀을 갖는 웨이퍼를 이용한 웨이퍼 레벨 패키지)

  • Lee, Joo-Ho;Park, Hae-Seok;Shin, Jea-Sik;Kwon, Jong-Oh;Shin, Kwang-Jae;Song, In-Sang;Lee, Sang-Hun
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.56 no.12
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    • pp.2217-2220
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    • 2007
  • In this paper, we propose a new wafer level package (WLP) for the RF MEMS applications. The Film Bulk Acoustic Resonator (FBAR) are fabricated and hermetically packaged in a new wafer level packaging process. With the use of Au-Sn eutectic bonding method, we bonded glass cap and FBAR device wafer which has groove-shaped via formed in the backside. The device wafer includes a electrical bonding pad and groove-shaped via for connecting to the external bonding pad on the device wafer backside and a peripheral pad placed around the perimeter of the device for bonding the glass wafer and device wafer. The glass cap prevents the device from being exposed and ensures excellent mechanical and environmental protection. The frequency characteristics show that the change of bandwidth and frequency shift before and after bonding is less than 0.5 MHz. Two packaged devices, Tx and Rx filters, are attached to a printed circuit board, wire bonded, and encapsulated in plastic to form the duplexer. We have designed and built a low-cost, high performance, duplexer based on the FBARs and presented the results of performance and reliability test.

Optimization of wiring process in semiconductor with 6sigma & QFD (6시그마와 QFD를 활용한 반도체용 wire공법 최적화 연구)

  • Kim, Chang-Hee;Kim, Kwang-Soo
    • Asia-Pacific Journal of Business Venturing and Entrepreneurship
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    • v.7 no.3
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    • pp.17-25
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    • 2012
  • Wire bonding process in making semiconductor needs the most precise control and Critical To Quality(CTQ). Thus, it is regarded to be the most essential step in packaging process. In this process, pure gold wire is used to connect the chip and PCB(substrate or lead frame). However, the price of gold has been skyrocketing continuously for a long period of time and is expected to further increase in the near future. This phenomenon situates us in an unfavorable condition amidst the competitive environment. To avoid this situation, many semiconductor material making companies developed new types of wires: Au.Ag wire is one material followed by many others. This study is aimed to optimize the parameter in wire bonding with the use of 6sigma and QFD(Quality Function Deployment). 6sigma process is a good means to not only solve the problem, but to increase productivity. In order to find the key factor, we focused on VOB(Voice of Business) and VOC(Voice of Customer). The main factors from VOB, VOC are called CTQ. However, there were times when these main factors were far from offering us the correct answer, thus making the situation more difficult to handle. This study shows that QFD aids in deciding which of the accurate factors to undertake. Normally QFD is used in designing and developing products. 6sigma process is held more effective when it used with QFD.

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A Study on the Characteristic and Manufacture Technique for the Gold wire of Phoenix-Shaped Glass Ewer by National Treasure No. 193 (국보 제193호 봉수형유리병 금사의 특성과 제작기법 연구)

  • Hwang, Hyun Sung;Yun, Eun Young
    • Journal of Conservation Science
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    • v.31 no.1
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    • pp.21-27
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    • 2015
  • The Phoenix-shaped Glass Ewer, which is No. 193 National Treasure, was seriously damaged by a unique form of green glass pieces when excavated among a number of burial accessories of Hwangnamdaechong known to have been formed in the 5th century. While it has long been exhibited at the National Museum of Korea since its treatment for conservation treatment at conservation science laboratory in 1984, the existing adhesive materials seriously deteriorated for the 30 years, and the condition was quite unstable. The epoxy resin used as a restorative materials turned yellowing due to the light and heat so much that it was no longer able to exhibit it in a stable and effective manner. As a result, a re-treatment for conservation was conducted lately. This study focuses on the three pieces of Gold wires used to carefully wrap up the handle of the Phoenix-shaped Glass Ewer broken into three pieces, which has not been studied so far. As for the analysis method for Gold wires, SEM-EDS and Stereo Microscope were used for nondestructive analysis. First of all, the result of the SEM-EDS analysis shows that the composition was Au 91.9 wt.%-Au 92.8 w.t% and Ag 5.9 wt.%-Ag 6.5 wt.%, which indicates that it was an alloy made of Au and Ag. The production technique of Gold wires was also observed by means of optical microscopes. In general, Gold wires were manufactured by a drawing process in which a lump of gold was beaten or pulled out of a hole or by a process of twisting a gold plate. However, Gold wires separated from the handle of the Phoenix-shaped Glass Ewer did not involve any trace of twisting on the surface. Rather, fine vertical stripes were observed with the sections filled up. Hence, it is thought that this Ewer went through a drawing process and then was mended. As a result, no certain relation with the golden mending material used for the Phoenix-shaped Glass Ewer was verified. The findings above indicate that most of the existing researches on Gold wires recognized them, not as separate remains, but merely as a component of other golden remains. Thus, there has been little systematic study on the manufacturing techniques of Gold wires. The future study on Gold wires may verify the correlation between the Gold wires used to fix the handle of the Phoenix-shaped Glass Ewer, which is examined in this study, with that of golden remains in the Silla era.

Manufacturing of Metal Micro-wire Interconnection on Submillimeter Diameter Catheter (서브-밀리미터 직경의 카테터 표면 위 금속 마이크로 와이어 접착 공정)

  • Jo, Woosung;Seo, Jeongmin;Kim, Taek-Soo
    • Journal of the Microelectronics and Packaging Society
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    • v.24 no.2
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    • pp.29-35
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    • 2017
  • In this paper, we investigated a manufacturing process of metal micro-wire interconnection on submillimeter diameter catheter. Over the years, flexible electronic researches have focused on flexible plane polymer substrate and micro electrode manufacturing on its surface. However, a curved polymer substrate, such as catheter, is very important for medical application. Among many catheters, importance of submillimeter diameter steerable catheter is increasing to resolve the several limitations of neurosurgery. Steering actuators have been researched for realizing the steerable catheter, but there is no research about practical wiring for driving these actuators. Therefore we developed a new manufacturing process for metal micro-wire interconnection on submillimeter diameter catheter. We designed custom jigs for alignment of the metal micro-wires on the submillimeter diameter catheter. An UV curing system and commercial products were used to reduce the manufacturing time and cost; Au micro-wire, UV curable epoxy, UV lamp, and submillimeter diameter catheter. The assembled catheter was characterized by using an optical microscope, a resistance meter, and a universal testing machine.

A Study on the Reliability of the Au Wire Bonding due to Baking (Baking 처리에 따른 금선 본딩의 신뢰성 연구)

  • Park, Yong-Cheol;Kim, Yeong-Ho
    • Korean Journal of Materials Research
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    • v.8 no.11
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    • pp.982-986
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    • 1998
  • baking 전후의 금선의 접합강도 변화를 연구하였다. 금선을 이용하여 Si 칩의 AI 패드와 은도금된 리드프레임 사이를 thermosonic 방법으로 본딩하였다. 본딩된 금선을 $175^{\circ}C$에서 시간을 변화시키면서 baking 처리하였다. 접합강도는 와이어 풀 테스트, 볼 전단 테스트, stud 풀 테스트로 평가하였다. 와이어 풀 접합강도는 baking 처리를 거쳐도 크게 변화하지 않았지만 파괴 유형이 baking 전에는 볼목 파괴에서 baking 후 스티치 파괴로 바뀌었다. 본딩과 baking 중 금선의 결정립이 크게 성장하였는데 이런 결정립 크기 변화와 금선 접합 부위의 기하학적인 모양에 따라 파괴 유형이 바뀌었다.

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Evaporation characteristics of materials from resistive heating sources(I) (저항가열원에 의한 물질의 증발특성(I))

  • 정재인;임병문;문종호;홍재화;강정수;이영백
    • Journal of the Korean institute of surface engineering
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    • v.24 no.1
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    • pp.25-30
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    • 1991
  • The evaporation characteristics of Ag, Al, Au, Cr. Cu, In, Mg, Mn, Pb, Pd, Si, SiO, Sn, Ti and Zn with the various resistive heating sources have been studied. The employed sources are refractory metal (Mo, Ta and W) boats, W-wire, ceramic (usually Al2O3)-coated and -barriered refractory metal boats, and special boats such as baffled boats and intermetallic boats (nitride compound and graphite). We investigated the melting mode, evaporation rate at a specific power, and lifetime of the sources. A special boat holder is also discussed which is needed to cool the sources at a large heat capacity.

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Determination of Trace Impurities in Gold by Isotope Dilution Inductively Coupled Plasma Mass Spectrometry

  • Lee, Gae-Ho;Yang, Suk-Ran;Park, Chang-Jun;Lee, Kwang-Woo
    • Bulletin of the Korean Chemical Society
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    • v.14 no.6
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    • pp.696-700
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    • 1993
  • Gold bonding wire of 0.076 mm in diameter used in semiconductor industry, is dissoved in aqua regia. The solution is then evaporated to near dryness several times with a few drops of HCl added to prepare the final sample solution in 5% HCl. The gold matrix is separated from trace impurities by controlled potential deposition. The whole electrolysis has been carried out inside a clean bench. An optimum potential is found to be +0.25 V to give more than 99.9% Au matrix removal with better than 90 analytes remaining in the electrolyte solution. Isotope dilution calibration is employed to get the best accuracy and precision. Analytical results are presented with determination limits of the analytical method.