• 제목/요약/키워드: Atomic force microscopy (AFM

검색결과 782건 처리시간 0.025초

Scanning Probe Microscopy를 이용한 고해 효과 연구 (Study of Refining Effects on Pulp Fibre by Scanning Probe Microscopy(SPM))

  • 김철환;;안경구
    • 펄프종이기술
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    • 제30권4호
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    • pp.49-58
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    • 1998
  • The SPM could image the most detailed microstructure of a sample in a wet and dry state by measuring the interaction between the atoms on the sample surface and the extremely sharp probe tip. The refined fibre exhibited large wrinkles formed by fibrillar bundles, the disintegrated fibres extensively showed “scale-like features”. By using the Non-Contact Atomic Force Microscopy (NC-AFM) and Contact Atomic Force Microscopy (C-AFM) including Phase Detection Microscopy (PDM) and Force Modulation Microscopy (FMM), it was possible to investigate surface topography, surface roughness and mechanical property (hardness or visco-elasticity) of fibre surface in detail. The PDM and FMM images showed that the disintegrated only fibre displayed uniform mechanical properties, whereas the refined one did not. The surface roughness of pulp fibres was higher in refined fibres than in disintegrated fibres due to the presence of external fibrils. These SPM images would be used to provide visual evidence of morphological change of a single fibre created during mechanical treatments such as refining, drying, calendering and so on.

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원자힘현미경을 이용한 탄소나노튜브소자의 턴형 및 수리 (Modification and Repair of a Carbon Nanotube-based Device Using an Atomic Force Microscope)

  • 박지용;김용선;오영무
    • 한국진공학회지
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    • 제16권1호
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    • pp.33-39
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    • 2007
  • 원자힘현미경(AFM)을 이용하여 탄소나노튜브소자에서 탄소나노튜브를 전기적 또는 기계적으로 조작함으로써 전기적 특성을 변형시키는 연구를 수행하였으며 이를 이용하여 탄소나노튜브의 절단 및 연결을 시연하였다. 조작과 동시에 AFM을 이용한 정전기힘측정법을 적용하여 탄소나노튜브의 절단 및 연결을 시각화할 수도 있음을 밝히고 이를 결합하여 본 연구에서는 AFM을 이용한 탄소나노튜브소자의 극소적인 변형 및 조작이 가능하다는 것을 보였다.

Surface Modification Studies by Atomic Force Microscopy for Ar-Plasma Treated Polyethylene

  • Seo, Eun-Deock
    • Macromolecular Research
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    • 제10권5호
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    • pp.291-295
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    • 2002
  • Atomic force microscopy(AFM) was used to study the polyethylene(PE) surfaces grafted and immobilized with acrylic acid by Ar plasma treatment. The topographical images and parameters including RMS roughness and Rp-v value provided an appropriate means to characterize the surfaces. The plasma grafting and immobilization method were a useful tool for the preparation of surfaces with carboxyl group. However, the plasma immobilization method turned out to have a limitation to use as a means of preparation of PE surface with specific functionalities, due to ablation effect during the Ar plasma treatment process.

폴리머 표면측정을 위한 AFM 팁의 접촉-진동 해석 (Vibro-Contact Analysis of AFM Tip on Polymer Surface)

  • 홍상혁;이수일
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2005년도 춘계학술대회
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    • pp.538-541
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    • 2005
  • In tapping mode atomic force microscopy(TM-AFM). the vibro-contact response of a resonating tip is used to measure the nanoscale topology and other properties of a sample surface. However, the nonlinear tip-surface interact ions can affect the tip response and destabilize the tapping mode control. Especially it is difficult to obtain a good scanned image of high adhesion surfaces such as polymers and biomoleculars using conventional tapping mode control. In this study, theoretical and experimental investigations are made on the nonlinear dynamics and control of TM-AFM. To analyze the complex dynamics and control of the tapping tip, the classical contact models are adopted due to the surface adhesion. Also we report the surface adhesion is an additional important parameter to determine the control stability of TM-AFM. In addition, we prove that it is more adequate to use Johnson-Kendall-Roberts (JKR) contact model to obtain a reasonable tapping response in AFM for the soft and high adhesion samples.

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폴리머 표면측정을 위한 AFM 팁의 나노스케일 접촉-진동 해석 (Nanoscale Vibro-Contact Analysis of AFM Tip on Polymer Surface)

  • 이수일
    • 대한기계학회논문집A
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    • 제30권2호
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    • pp.135-140
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    • 2006
  • In tapping mode atomic force microscopy (TM-AFM), the vibro-contact response of a resonating tip is used to measure the nanoscale topology and other properties of a sample surface. However, the nonlinear tipsurface interactions can affect the tip response and destabilize the tapping mode control. Especially it is difficult to obtain a good scanned image of high adhesion surfaces such as polymers and biomolecules using conventional tapping mode control. In this study, theoretical and experimental investigations are made on the nonlinear dynamics and control of TM-AFM. Also we report the surface adhesion is an additional important parameter to determine the control stability of TM-AFM. In addition, we proved that it was adequate to use Johnson-Kendall-Roberts (JKR) contact model to obtain a reasonable tapping response in AFM for the soft and high adhesion samples.

초음파원자현미경을 이용한 나노스케일 박막 코팅층에 대한 탄성특성 평가 (Evaluation of Elastic Properties for Nanoscale Coating Layers Using Ultrasonic Atomic Force Microscopy)

  • 곽동열;조승범;박익근
    • 한국생산제조학회지
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    • 제24권5호
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    • pp.475-480
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    • 2015
  • Ultrasonic atomic force microscopy (Ultrasonic-AFM) has been used to investigate the elastic property of the ultra-thin coating layer in a thin-film system. The modified Hertzian theory was applied to predict the contact resonance frequency through accurate theoretical analysis of the dynamic characteristics of the cantilever. We coat 200 nm thick Aluminum and Titanium thin films on the substrate using the DC Magnetron sputtering method. The amplitude and phase of the contact resonance frequency of a vibrating cantilever varies in response to the local stiffness constant. Ultrasonic-AFM images were obtained using the variations in the elastic property of the materials. The morphology of the surface was clearly observed in the Ultrasonic-AFM images, but was barely visible in the topography. This research demonstrates that Ultrasonic-AFM is a promising technique for visualizing the distribution of local stiffness in the nano-scale thin coatings.

Modelling and Measurements of Normal and Lateral Stiffness for Atomic Force Microscopy

  • Choi, Jinnil
    • Applied Science and Convergence Technology
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    • 제23권5호
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    • pp.240-247
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    • 2014
  • Modelling and measurements of normal and lateral stiffness for atomic force microscopy (AFM) are presented in this work. Important issues, such as element discretisation, stiffness calibration, and deflection angle are explored using the finite element (FE) model. Elements with various dimension ratios are investigated and comparisons with several mathematical models are reported to verify the accuracy of the model. Investigation of the deflection angle of a cantilever is also shown. Moreover, AFM force measurement experiments with conical and colloid probe tips are demonstrated. The relationships between force and displacement, required for stiffness measurement, in normal and lateral directions are acquired for the conical tip and the limitations of the colloid probe tip are highlighted.

모발의 나노 트라이볼러지 특성해명을 위한 원자현미경(Atomic Force Microscopy) 프로브의 개발 (A New Design of AFM Probe for Nanotribological Characterizations Measurement of Human Hair)

  • 권현규;고언위
    • 반도체디스플레이기술학회지
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    • 제14권4호
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    • pp.1-7
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    • 2015
  • People are always pursuing the aesthetic feeling relentlessly. But some people have such problems with their hairs like alopecia, cancer chemotherapy, burns, and scalp injury. So the synthetic hair has played a very important role to make up for these deficiencies. But long term use can lead to adverse reactions or uncomfortable feeling. This is primarily caused by its properties differ with human hair. In particular, nanotribological characterizations (roughness, friction force and adhesive force) of synthetic hair surface are dissatisfy with the needs of normal hairs. This paper presents the experiments on nanotribological characterizations measurements of human hairs (coloring hair, permed hair and common hair) in shampooing condition or without shampooing condition. Using atomic force microscopy (AFM) to find out a range of synthetic hair nanotribological characterizations which can correspond with natural hair. The measurements of nanotribological characterizations focus on surface roughness, friction force and adhesive force, and a new design of AFM probe was used for measuring the nanotribological characterizations.

Applications of Scanning Electrochemical Microscopy (SECM) Coupled to Atomic Force Microscopy with Sub-Micrometer Spatial Resolution to the Development and Discovery of Electrocatalysts

  • Park, Hyun S.;Jang, Jong Hyun
    • Journal of Electrochemical Science and Technology
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    • 제7권4호
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    • pp.316-326
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    • 2016
  • Development and discovery of efficient, cost-effective, and robust electrocatalysts are imperative for practical and widespread implementation of water electrolysis and fuel cell techniques in the anticipated hydrogen economy. The electrochemical reactions involved in water electrolysis, i.e., hydrogen and oxygen evolution reactions, are complex inner-sphere reactions with slow multi-electron transfer kinetics. To develop active electrocatalysts for water electrolysis, the physicochemical properties of the electrode surfaces in electrolyte solutions should be investigated and understood in detail. When electrocatalysis is conducted using nanoparticles with large surface areas and active surface states, analytical techniques with sub-nanometer resolution are required, along with material development. Scanning electrochemical microscopy (SECM) is an electrochemical technique for studying the surface reactions and properties of various types of electrodes using a very small tip electrode. Recently, the morphological and chemical characteristics of single nanoparticles and bio-enzymes for catalytic reactions were studied with nanometer resolution by combining SECM with atomic force microscopy (AFM). Herein, SECM techniques are briefly reviewed, including the AFM-SECM technique, to facilitate further development and discovery of highly active, cost-effective, and robust electrode materials for efficient electrolysis and photolysis.

원자간격 현미경의 캔틸레버의 정량적 특성평가를 위한 계측 시스템 개발 (Development of Measurement System for Quantitative Measurement of Cantilever in Atomic Force Microscopy)

  • 권현규;남기호
    • 한국기계가공학회지
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    • 제6권2호
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    • pp.22-27
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    • 2007
  • In this study, the two methods of stiffness measurement(Spring constant) of cantilever were proposed for quantitative measurement in Atomic Force Microscopy(AFM). As the 1st method for the measurement of stiffness, the probe method, which is used in the measurement of the semiconductor mechanical and electrical properties, was applied to the measurement of the cantilever. Experiments by the probe method were performed finding the resistance value of cantilever. As the results, the resistance was measured differently along with the dimension and the thickness of cantilever that determined the stiffness(spring constant) of the lever. As the 2nd method, the vibration characteristics(Dunkerley expression) is used to obtain the stiffness of the complex structure which is combined by AFM cantilever and the standard cantilever. We measured the resonant frequency from the complex structure using the micro stages and stereo microscope. As the results, we confirmed that the vibration characteristics(Dunkerley expression) is effected the micro complex structure of AFM cantilever.

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