Journal of the Semiconductor & Display Technology (반도체디스플레이기술학회지)

The Korean Society Of Semiconductor & Display Technology (한국반도체디스플레이기술학회)
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A New Design of AFM Probe for Nanotribological Characterizations Measurement of Human Hair

모발의 나노 트라이볼러지 특성해명을 위한 원자현미경(Atomic Force Microscopy) 프로브의 개발

  • Kweon, Hyun Kyu (Department of Mechanical System, Kumoh National Institute of Technology) ;
  • Gao, Yan Wei (Department of Mechanical System, Kumoh National Institute of Technology)
  • 권현규 (금오공과대학교 기계시스템공학과) ;
  • 고언위 (금오공과대학교 기계시스템공학과)
  • Received : 2015.08.31
  • Accepted : 2015.10.30
  • Published : 2015.12.31
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Abstract

People are always pursuing the aesthetic feeling relentlessly. But some people have such problems with their hairs like alopecia, cancer chemotherapy, burns, and scalp injury. So the synthetic hair has played a very important role to make up for these deficiencies. But long term use can lead to adverse reactions or uncomfortable feeling. This is primarily caused by its properties differ with human hair. In particular, nanotribological characterizations (roughness, friction force and adhesive force) of synthetic hair surface are dissatisfy with the needs of normal hairs. This paper presents the experiments on nanotribological characterizations measurements of human hairs (coloring hair, permed hair and common hair) in shampooing condition or without shampooing condition. Using atomic force microscopy (AFM) to find out a range of synthetic hair nanotribological characterizations which can correspond with natural hair. The measurements of nanotribological characterizations focus on surface roughness, friction force and adhesive force, and a new design of AFM probe was used for measuring the nanotribological characterizations.

Keywords

References

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