• Title/Summary/Keyword: Array Probe

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The Study on Reliability Improvement in Eddy Current Inspection by Signal Characteristic Optimization of Multi-coil Array Probe (다중센서 신호특성 최적화를 통한 와전류검사 신뢰성 개선연구)

  • Ahn, Y.S.;Gil, D.S.;Park, S.G.
    • Journal of Power System Engineering
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    • v.14 no.2
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    • pp.60-64
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    • 2010
  • This paper introduces reliability improvement and time saving in eddy current inspection by signal characteristic optimization of multi-coil eddy current array probe. In the past, Multi-coil array probe and single probe were used for the gas turbine rotor surface inspection & defect evaluation. The multi-coil array probe was used for the broad area inspection. But the signal deviations among multi-coil array probe are maximum 28% in commercial probe. This differences were considered to impedance differences among coils, so it is very difficult to evaluate exact defect size. The signal deviations among multi-coil array probe are maximum 28% in commercial probe. So, single coil inspection was used for exact defect sizing. The purpose of this study is to improve signal deviations of multi-coil array probe. The introduced new technology can improves this deviation by adjusting input voltage in each coil. At first, apply same voltage in each coil and collect signal amplitude of each coil. And calculate new input voltage based on signal amplitude of each coil. If the signal amplitude deviation is within 5% among multi-coil array probe, the signal amplitude of multi-coil array probe is reliable. The proposed technology gives 2% signal deviation among multi-coil array probe. The proposed new technology gives reliability improvement and inspection time saving in eddy current inspection.

A Study on Applying Array Probe for Steam Generator Tube Inspection (배열형 탐촉자를 이용한 증기발생기 세관 검사 적용성 검토)

  • Kim, In Chul;Cheon, Keun Young;Lee, Young Ho
    • Transactions of the Korean Society of Pressure Vessels and Piping
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    • v.5 no.1
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    • pp.25-31
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    • 2009
  • Steam Generator(SG) tube is an important component of Nuclear Power Plant(NPP), which comprises of the pressure boundary of primary system. The integrity of SG tube has been confirmed by the eddy current test every outage. In Korea, Bobbin probe and MRPC probe have been generally used for the eddy current test. Meanwhile the usage of Array probe has gradually increased in U.S., Japan and other countries. In this study, we investigated the defect detection capability of the Array probe through its preliminary application to SG tube inspection. The Array probe has the equivalent capability in the defect detection and sizing as the conventional methods. Thus it is desirable that the Array probe is generally applied to SG tube inspection in the domestic NPPs.

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Make Probe Head Module use of Wafer Pin Array Frame (Wafer Pin Array Frame을 이용한 Probe Head Module)

  • Lee, Jae-Ha
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2012.11a
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    • pp.71-71
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    • 2012
  • Memory 반도체 Test공정에서 사용되는 Probe Card의 Probing Area가 넓어지면서 종래에 사용되던 Cantilever제품의 사용이 불가능하게 되고, MEMS공정을 사용한 새로운 형태의 Advanced제품이 시장에 출현을 하였다. MEMS형의 제품은 다수의 Micro Spring을 MLC(Multi Layer Ceramic)위에 MEMS 공정을 사용하여 생성하는 방식으로서 MLC는 좁은 지역에 다수의 Pin을 생성 할 수 있는 공간을 만들어 주며, 또 다른 이유는 전기적 특성인 임피던스를 맞추고 다수의 Pin의 압력에 의하여 생기는 하중을 Ceramic기판으로 지탱하기 위한 목적도 있다. 이에 MLC와 같은 전기적 특성을 임피던스를 맞춘 RF-CPCB를 사용하여 작은 면적에 다수의 Pin접합이 가능한 방법을 마련한 후, 이 RF-PCB를 부착하여 Pin의 하중을 받는 Wafer와 유사한 열팽창을 갖는 Substrate를 사용하여 MLC를 대체하여 다양한 온도 조건에서 사용이 가능하며, 복잡하고 공정비가 많이 드는 MEMS 공정에 의한 일괄 Micro Spring 생성 공정을 전주 도금 또는 2D방식의 도금 Pin으로 대체하였으며, Probe Card의 중요한 물리적 특성인 Pin들의 정렬도를 마련하기 위해 Photo Process를 사용한 Wafer로 만든 Wafer Pin Array Frame을 사용하여 2D 제작 Pin을 일괄 또는 부분 접합이 가능한 방법으로 Probe Array Head를 제작하여 이들을 부착하여 Probe Array Head를 이전의 MEMS공정 방법에 비해 쉽고 빠르게 만들어 probe Card를 제작 할 수 있게 되었다.

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Development of Optical Head Unit for Nano Optical Probe Array (나노 광 프로브 어레이 구현을 위한 광학 헤드 유닛 개발)

  • Kim H.;Lim J.;Kim S.;Han J.;Kang S.
    • Transactions of Materials Processing
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    • v.15 no.1 s.82
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    • pp.21-26
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    • 2006
  • A optical head unit for nano optical probe array was developed. The optical probe array is generated by Talbot effect. The shape and thickness of microlens array(MLA) were designed to minimize the spot size at the foci of MLA. To increase the optical efficiency of the system and obtain the large tolerance for fabrication, aperture size was theoretically optimized. Then microlens illuminated aperture array(MLIAA) as an optical head unit was fabricated using a ultra violet(UV) molding process on aluminum aperture array. In this process, Al aperture array was fabricated separately using the photolithography and reactive ion etching(RIE) process. Optical properties of the generated optical probes were measured and compared at Talbot distance from the aperture array having a diameter of $1{\mu}m$ and MLIAA.

Development of Optical Head Unit for Nano Optical Probe Array (나노 광 프로브 어레이 구현을 위한 광학 헤드 유닛 개발)

  • Kim H.;Lim J.;Kim S.;Han J.;Kang S.
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 2005.09a
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    • pp.29-34
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    • 2005
  • A optical head unit for nano optical probe away was developed. The optical probe array is generated by Talbot effect. The shape and thickness of microlens array(MLA) were designed to minimize the spot size at the foci of MLA. To increase the optical efficiency of the system and obtain the large tolerance for fabrication, aperture size was theoretically optimized. Then microlens illuminated aperture array(MLIAA) as an optical head unit was fabricated using a ultra violet(UV) molding process on aluminum aperture array. In this process, Al aperture array was fabricated separately using the photolithography and reactive ion etching(RIE) process. Optical properties of the generated optical probes were measured and compared at Talbot distance from the aperture array having a diameter of $1{\mu}m$ and MLIAA.

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Defect Signal Analysis of Steam Generator Tube in NPP Using ECT Array Probe (ECT Array Probe를 이용한 원전 SG세관의 결함 신호해석)

  • Lim, Geon-Gyu;Kim, Ji-Ho;Lee, Hyang-Beom
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.772-773
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    • 2008
  • 본 논문에서는 ECT Array Probe를 이용한 원자력 발전소의 SG세관의 결함 신호를 해석하였다. 프로브의 전자기적 특성을 해석하기 위하여 맥스웰 방정식을 이용하여 지배방정식을 유도하였고, 3차원 유한요소법을 이용하여 전자기 수치 해석을 수행하였다. 신호해석을 위해 사용된 결함의 종류는 FBH결함이며, 결함의 깊이는 세관 두께의 40[%] 및 100[%]로 하였다. 시험주파수는 300[kHz], 400[kHz]를 사용하였으며, 각각의 시험주파수에 대한 결과를 비교 분석하였다. 해석결과 결함부위에서 신호의 증가를 확인할 수 있었으며, 주파수 시험변화시 300[kHz]보다 400[kHz]일때 결함 신호가 증가하는 것을 확인할 수 있었다. 또한 획득한 신호를 ASME 표준 시험편을 이용한 ECT Array Probe의 와전류탐상 실험신호와 비교하였다. 본 논문의 결과는 ECT Array Probe를 이용하여 원전 SG세관 검사시 결함신호해석에 도움이 될 것으로 사료된다.

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Eddy Current Signal Analysis for Transmit-Receive Pancake Coil on ECT Array Probe

  • Lee, Hyang-Beom
    • Journal of the Korean Society for Nondestructive Testing
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    • v.26 no.1
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    • pp.25-29
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    • 2006
  • In this paper, the eddy current signals come from a pair oi transmit-receive (T/R) pancake coil on ECT array Probe are analyzed with the variations of the lift-of and of the distance between transmit and receive coils. To obtain the electromagnetic characteristics of the probes, the governing equation describing the eddy current problems is derived from Maxwell's equation and is solved using three-dimensional finite element method. Eddy current signals from T/R coils on ECT array probe have quite different characteristics compared with ones from impedance coil on rotating pancake coil probe. The results in this paper ran be helpful when the field eddy current signals from ECT array probe are evaluated.

Design and Fabrication of Microlens Illuminated Aperture Array for Optical ROM Card System (Optical Card 시스템에서의 마이크로렌즈 조사 광프로브 어레이 설계 및 제작)

  • Kang, Shin-Ill;Kim, Seok-Min;Kim, Hong-Min;Lee, Jee-Seung;Lim, Ji-Seok;Busch, Christopher
    • Transactions of the Society of Information Storage Systems
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    • v.2 no.1
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    • pp.1-6
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    • 2006
  • An optical ROM card system which using an optical probe array generated by Talbot effect was proposed as new robust storage solution. To improve the optical density and to decrease the power consumption of the system, it is very important to make the spot sizes of optical probes smaller as well as to increase the optical efficiency from the light source to optical probes. In this study, a microlens illuminated aperture array for generating high efficiency optical probe away with small beam spot was designed and fabricated using monolithic lithography integration method. The maximum intensity of optical probes of microlens illuminated aperture array increased about 12 times of that of aperture array, and the full width half maximum of the optical probe at Talbot plane generated by microlens illuminated aperture array was $0.77{\mu}m$.

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Acoustic Power Measurement System of Array Probes for Ultrasonic Diagnostic Equipment Using Radiation Force Balance Methods (방사힘 측정법을 이용한 초음파 진단장치용 배열 탐침자의 음향파워 측정시스템)

  • Yun, Yong-Hyeon;Jho, Moon-Jae;Kim, Yong-Tae;Lee, Myoung-Ho
    • The Journal of the Acoustical Society of Korea
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    • v.29 no.6
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    • pp.355-364
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    • 2010
  • Considering biological safety, it is very important to measure acoustic power from ultrasonic array probe for diagnostic ultrasound imaging applications. In this paper, to measure acoustic power from each element on array probe for ultrasonic diagnostic equipment, we reconstruct and automate the acoustic power measurement system. The acoustic power from linear, phased and curved array were measured and analyzed. As a result of measurement, the effects caused by directivity of sound beam from curved array were founded. To remove these effects, we developed and applied the correction model. The proposed system is useful to evaluate characteristics of the acoustical output power of array probe.

The Design of microstrip line-probe feeding patch array antenna (마이크로스트립 라인-프로브 급전 패치 배열 안테나의 설계)

  • 박종렬;이윤경;윤현보
    • Proceedings of the Korea Electromagnetic Engineering Society Conference
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    • 2002.11a
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    • pp.285-289
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    • 2002
  • In this paper, microstrip line-probe feeding patch array antenna with center frequency 5.8㎓ is designed and manufactured. The microstrip line - probe feeding structure has broadband characteristic and be able to modify the array structure for improving antenna gain. In this result, microstrip line-probe feeding patch array antenna has 17.6% bandwidth and 8㏈i antenna gain, respectively.

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