• 마이크로전자및패키징학회지
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• 제11권4호
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• pp.61-67
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• 2004

알루미늄 유전체의 표면적 증가에 의한 정전용량 값을 증가시키기 위하여, 1 M의 염산 에칭용액에 첨가제를 사용했을 때 나타나는 알루미늄 표면의 에칭특성의 변화를 조사하였다. 에칭액으로서 염산을 사용한 경우 알루미늄 표면에서 생성되는 에치피트의 형상과 단위 면적당 생성밀도가 균일하지 못하였다. 염산용액에 에틸렌글리콜이 첨가된 혼합용액에서 에칭을 실시했을 경우, 알루미늄 기지 표면에 미세하고 균일한 에치피트가 형성되어 표면적 증가의 효과가 크게 나타났다. 에틸렌글리콜이 첨가된 에칭액에서 제조된 유전체는 표면적 증가에 의한 효과로 높은 정전용량 값을 나타냈다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제13권1호
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• pp.15-21
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• 2013

In this paper, a MEMS tunable capacitor was successfully designed and fabricated using an aluminum nitride film and a gold suspended membrane with two air gap structure for commercial RF applications. Unlike conventional two-parallel-plate tunable capacitors, the proposed tunable capacitor consists of one air suspended top electrode and two fixed bottom electrodes. One fixed and the top movable electrodes form a variable capacitor, while the other one provides necessary electrostatic actuation. The fabricated tunable capacitor exhibited a capacitance tuning range of 375% at 2 GHz, exceeding the theoretical limit of conventional two-parallel-plate tunable capacitors. In case of the contact state, the maximal quality factor was approximately 25 at 1.5 GHz. The developed fabrication process is also compatible with the existing standard IC (integrated circuit) technology, which makes it suitable for on chip intelligent transceivers and radios.

• 한국재료학회:학술대회논문집
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• 한국재료학회 2011년도 추계학술발표대회
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• pp.25.2-25.2
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• 2011

Recently, thin film capacitors used for vehicle inverters are small size, high capacitance, fast response, and large capacitance. But its applications were made up of liquid as electrolyte, so its capacitors are limited to low operating temperature range and the polarity. This research proposes using Ni-P alloys by electroless plating as the electrode instead of liquid electrode. Our substrate has a high aspect ratio and complicated shape because of anodic aluminum oxide (AAO). We used AAO because film thickness and effective surface area are depended on for high capacitance. As the metal electrode instead of electrolyte is injected into AAO, the film capacitor has advantages high voltage, wide operating temperature, and excellent frequency property. However, thin film capacitor made by electroless-plated Ni on AAO for full-filling into etched tunnel was limited from optimizing the deposition process so as to prevent open-through pore structures at the electroless plating owing to complicated morphological structure. In this paper, the electroless plating parameters are controlled by temperature in electroless Ni plating for reducing reaction rate. The Electrical properties with I-V and capacitance density were measured. By using nickel electrode, the capacitance density for the etched and Ni electroless plated films was 100 nFcm-2 while that for a film without any etch tunnel was 12.5 nFcm-2. Breakdown voltage and leakage current are improved, as the properties of metal deposition by electroless plating. The synthesized final nanostructures were characterized by scanning electron microscopy (SEM).

• 한국표면공학회지
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• 제26권5호
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• pp.271-279
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• 1993

Experiments on electorchemical etching of aluminum foils with high cubic textures were carried out in this study. Etching behaviours and pit shapes with respect to various conditions of eletrochemical etching were in-vestigated. When HCl and NaCl solutions were used as electrolytes, the highest capacitanes were observed in solutions of 1MHCl and 5M NaCl. It was foundd that capacitance was improved by addition of H2SO4 to HCl so-lution which is considered to be due to the suppression of oxide film formation on the aluminum surface. The homogeneous distribution of each pits obtained in the HCl solution, while the degree of weight loss was lowest in the Nacl solution. The best etching properties in 1M HCl solution were obtained at the etching condi-tions of 0.15 A/$\textrm{cm}^2$, 150sec and$ 90^{\circ}C$.

• 한국진공학회지
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• 제9권2호
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• pp.162-166
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• 2000

플라즈마 화학증착법(Plasma Enhanced Chemical Vapor Deposition, PECVD)을 이용하여 양질의 $Si_3N_4$ 금속-유전막-금속(Metal-Insulator-Metal, MIM) 커패시터를 구현하였다. 유전체인 $Si_3N_4$와 전극인 Al의 계면반응을 억제시키기 위해 티타늄 나이트라이드(TiN)를 확산 장벽으로 사용한 결과 MIM 커패시터의 전극과 유전체 사이의 계면에서는 어떠한 hillock이나 석출물도 관찰되지 않았다. 커패시턴스와 전류전압 특성분석으로부터 양질의 MIM 커패시터 특성을 보이는 $Si_3N_4$의 최소 두께는 500 $\AA$이며, 그 두께 미만에서는 대부분의 커패시터가 전기적으로 단락되어 웨이퍼 수율이 낮아진다는 사실을 알 수 있었다. 투과전자현미경(transmission Electron Microscope, TEM)을 이용한 단면 미세구조 관찰을 통해 $Si_3N_4$층의 두께가 500 $\AA$ 미만인 커패시터의 경우에 TiN과 $Si_3N_4$의 계면에서 형성되는 슬릿형 공동(slit-like void)01 의해 커패시터의 유전특성이 파괴된다는 사실을 알게 되었으며, 열 유기 잔류 응력(thermally-induced residual stress) 계산에 기초하여 공동의 형성 기구를 규명하였다.

• 전력전자학회:학술대회논문집
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• 전력전자학회 2012년도 전력전자학술대회 논문집
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• pp.592-593
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• 2012

Buck converter must operate at fairly high switching frequency for miniaturizing a whole circuit and achieving a fast response. However, at the conditions of low output voltage, high output current, and high switching frequency, the influence of parasitic elements to circuit operation will become extremely obvious. In this paper, it has been shown that these parasitic elements of output capacitor link the ripple of the output voltage. The MCP capacitors and aluminum electrolytic capacitors are applied to the buck converter and observed characteristics and the experimental results were reported.

• 한국기계가공학회지
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• 제19권11호
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• pp.94-101
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• 2020

In the age of industry 4.0, artificial intelligence is being widely used to realize machinery condition monitoring. Due to their excellent performance and the ability to handle large volumes of data, machine learning techniques have been applied to realize the fault diagnosis of different equipment. In this study, we performed the failure mode effect analysis (FMEA) of an aluminum electrolytic capacitor by using deep learning and big data. Several tests were performed to identify the main failure mode of the aluminum electrolytic capacitor, and it was noted that the capacitance reduced significantly over time due to overheating. To reflect the capacitance degradation behavior over time, we employed the Vanilla long short-term memory (LSTM) neural network architecture. The LSTM neural network has been demonstrated to achieve excellent long-term predictions. The prediction results and metrics of the LSTM and Vanilla LSTM models were examined and compared. The Vanilla LSTM outperformed the conventional LSTM in terms of the computational resources and time required to predict the capacitance degradation.

• 한국재료학회지
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• 제10권5호
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• pp.375-381
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• 2000

전해콘텐서용 알루미늄박을 ammonium adipate 용액을 이용하여 $65^{\circ}C$에서 10분간 100V 및 140V로 각각 양극 산화시켜 산화 알루미늄 유전체를 만들었다. 유전층의 두께, 화학양론적 관계, 결정구조 등을 RBS 및 TEM을 이용하여 분석하였고, 알루미늄박의 에칭시 황산 첨가로 인한 표면적의 변화는 임피던스 분석법으로 조사 하였다. 생성된 유전피막은 100V 및 140V의 전압을 사용했을 경우 각각 약 130nm 및 190nm 두께의 비정질로 나타났으며 피막의 알루미늄과 산소원소의 화학양자론적 비는 약 2:3의 비율로 존재했다. 또한 유전피막은 전자빔은 조사에 의해 쉽게 $${\gamma}$-Al_2$$O_3$ 형태의 결정질로 변태 되었다. 염산 에칭욕에 황산 첨가시 나타나는 알루미늄박의 표면변화는 임피던스 분석결과와 정전 용략의 변화가 일치하는 경향을 나타냈다.

• 전력전자학회:학술대회논문집
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• 전력전자학회 2000년도 전력전자학술대회 논문집
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• pp.57-60
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• 2000

An aluminum electrolytic capacitor is used in DC Link of ac motor drive system. In this case it usually has the shortest lifetime in the system and then determines the system lifetime. Therefore life estimation of the electrolytic capacitor is needed for maintenance of th circuit. In this paper a method for life estimation is presented with a ESR(equivalent series resistance) model and a heat transfer model of capacitor that can be used to estimate operating temperature it is investigated through a simple example using ESR and heat transfer.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2000년도 추계종합학술대회 논문집(2)
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• pp.221-224
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• 2000

We have successfully demonstrated metal-ferroel-ectric-insulator-semiconductor (MFIS) devices using Al/LiNbO$_{3}$/SiN/Si structure. The SiN thin films were made into metal -insulator- semiconductor (MIS) devices by thermal evaporation of aluminum source in a dot away on the surface. The interface property of MFIS from 1MHz & quasistatic C-V is good and the memory window width is about 1.5V at 0.2V/s signal voltage sweep rate. The gate leakage current density of MFIS capacitors using a aluminum electrode showed the least value of 1x10$^{-8}$ A/$\textrm{cm}^2$ order at the electric field of 300㎸/cm. And the XRD patterns shows the probability of applications of LN for MFIS devices for FeRAMs on amorphous SiN buffer layer.