• 한국세라믹학회지
• /
• 제41권6호
• /
• pp.476-480
• /
• 2004

펄스 do 마그네트론 스퍼터링법에 의해 유리 기판 위에 AZO(Al-doped ZnO) 박막을 제조하여 박막의 구조적, 전기적 및 광학적 특성을 조사하였다. 본 연구를 위해 l.0 at% Al이 도핑 된 ZnO세라믹 타켓을 사용하였다. XRD 분석을 통하여 30KHz의 펄스 주파수가 인가되었을 때 c축 배향성이 가장 우수하게 나타났고, 표면 형상 분석을 통하여 매우 치밀한 박막이 성장되었음을 알 수 있었다. 증착율은 펄스 주파수가 증가함에 따라 선형적으로 감소하였고, 30KHz의 펼스 주파수가 인가되었을 때 비저항은 8.67${\times}$$10^{-4}$ $\Omega$-cm의 가장 낮은 비저항을 나타내었으며, UV-vis. 투과율 측정결과, 평균 85% 이상의 높은 투과도를 나타내었다. 이러한 낮은 비저항 및 높은 광 투과도로 볼 때 AZO 박막은 투명 전도성 산화물 박막으로의 응용 가능성을 나타내었다.

• 한국재료학회지
• /
• 제14권5호
• /
• pp.328-333
• /
• 2004

Transparent ZnO:Al conductor films for the optoelectronic devices were deposited by using the capacitively coupled DC magnetron sputtering method. The effect of Al doping concentration and discharge power on the electrical and optical properties of the films was studied. The film resistivity of $8.5${\times}$10^{-4}$ $\Omega$-cm was obtained at the discharge power of 40 W with the ZnO target doped with 2 wt% $Al_2$$_O3$. The transmittance of the 840 nm thick film was 91.7% in the visible waves. Increasing doping concentration of 3 wt% $Al_2$$O_3$ in ZnO target results in significant decrease of film resistivity, which may be due to the formation of $Al_2$$O_3$ particles in the as-deposited ZnO:Al film and the reduced ZnO grain sizes. Increasing DC power from 40 to 60 W increases deposition rate by more than 50%, but can induce high defect density in the film, resulting in higher film resistivity.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2001년도 추계학술대회 논문집
• /
• pp.525-528
• /
• 2001

ZnO:Al thin film can be used as a transparent conducting oxide(TCO) which has low electric resistivity and high optical transmittance for the front electrode of amorphous silicon solar cells and display devices. This study of electrical, crystallographic and optical properties of Al doped ZnO thin films prepared by Facing Targets Sputtering (FTS), where strong internal magnets were contained in target holders to confine the plasma between the targets, is described. Optimal transmittance and resistivity was obtained by controlling flow rate of O$_2$ gas and substrate temperature. When the of gas rate of 0.3 and substrate temperature 200$^{\circ}C$ , ZnO:Al thin film had strongly oriented c-axis and lower resistivity(<10$\^$-4/Ω-cm).

• 한국전기전자재료학회논문지
• /
• 제24권4호
• /
• pp.303-308
• /
• 2011

The Gallium-doped ZnO(GZO) film deposited at a temperature of $200^{\circ}C$ and a pressure of 10 mtorr has an optical transmittance of 89.0% and a resistivity of $2.0\;m{\Omega}{\cdot}cm$ because of its high crystallinity. Effect of $Al_2O_3$ oxide buffer layers on the optical and electrical properties of sputtered ZnO films were intensively investigated for developing the electrodes of opto-electronic devices which demanded high optical transmittance and low resistivity. The use of $Al_2O_3$ buffer layer could increase optical transmittance of GZO film to 90.7% at a wavelength of 550 nm by controlling optical spectrum. Resistivity of deposited GZO films were much dependent on the deposition condition of $O_2/(Ar+O_2)$ flow rate ratio during the buffer layer deposition. It is considered that the $Al_2O_3$ buffer layer could increase the carrier concentration of the GZO films by doping effect of diffused Al atoms through the rough interface.

• 한국세라믹학회:학술대회논문집
• /
• 한국세라믹학회 2003년도 춘계총회 및 연구발표회 초록집
• /
• pp.97.2-97
• /
• 2003

• 한국진공학회지
• /
• 제20권2호
• /
• pp.141-145
• /
• 2011

ZnO:Al 박막을 RF magnetron sputtering 법을 이용하여 초기 압력에 따라 증착하고 박막의 구조적, 광학적, 전기적 특성을 연구하였다. 초기 압력 변화에 의해 ZnO:Al 박막의 특성의 변화를 확인하였고 고품질의 박막을 얻을 수 있었다. 모든 ZnO:Al 박막에서 (002)면의 우선 배향성을 보였으며 가시광선 영역(400~800 nm)에서 85% 이상의 좋은 투과도를 보였다. 초기 압력이 낮아질수록 결정성, 비저항 그리고 성능지수 특성이 향상됨을 확인하였다. 초기 압력에 따른 비저항의 향상은 결정립 크기 변화에 의한 것으로 판단된다.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 1987년도 정기총회 및 창립40주년기념 학술대회 학회본부
• /
• pp.245-247
• /
• 1987

In this thesis, ZnO semiconductor gas sensors doped by the $Al^{3+}$ were fabricated by the miexed oxide method. The specimens were sintered for 5(hr) at $1000-1200^{\circ}C$ and the I-V, sensitivity were investigated in acetone gas or ammonia gas. As a result, I-V curves of specimens as a function of temperature variation showed characteristics of linear resistor that the current was proportional to the, temperature at constant voltage. For the sensitivity of acetone, 1Wt $Al^{3+}$-ZnO has the hight 0.91, ammonia gas, 2Wt $Al^{3+}$-ZnO specimen has the hight 0.90. Hence, the operating temperature of specimens were both $300^{\circ}C$.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
• /
• pp.82-83
• /
• 2008

AI doped ZnO (AZO) films, and intentionally Zn added AZO (ZAZO) films were prepared on Corning glass by rf magnetron sputtering, and the electrical, optical, and structural properties of the as-deposited films together with the air annealed films were investigated. The resistivity of the AZO films increased with increasing substrate temperature and having minimum resistivity at $150^{\circ}C$. At the high temperature, the ZAZO films showed improved electrical properties better than the AZO films due.to increase in both the carrier concentration and.the Hall mobility. Upon air annealing at $500^{\circ}C$, the resistivity of both AZO and ZAZO films increased substantially, but the relative amount of degradation was smaller for films deposited at $450^{\circ}C$ than the films deposited at $150^{\circ}C$.

• 한국자기학회지
• /
• 제15권3호
• /
• pp.181-185
• /
• 2005

반응성 스퍼터링 방법으로 성장시킨 $Zn_{0.09}Cr_{0.01}O$ 묽은 자성반도체 박막의 구조와 전기 수송과 자기 특성에 미치는 Al 첨가 효과를 탐구하였다. Al이 첨가되지 않은 $Zn_{0.09}Cr_{0.01}O$ 박막은 반도체적인 수송 특성과 함께 미약한 강자성 특성을 보였다. Al을 첨가함으로써 n-형 나르개인 전자의 농도 증가와 더불어 금속성 수송 특성을 나타냈으며 포화자기화가 현저하게 증가하고 이력곡선이 뚜렷하게 나타나는 등 자기 특성의 격렬한 변화가 관찰되었다. 이 결과들은 Cr이 첨가된 ZnO에서 나르개에 의한 강자성 질서의 향상을 보여준다.

• 한국재료학회지
• /
• 제15권8호
• /
• pp.518-520
• /
• 2005

Effects of the $O_2/Ar$ flow ratio in the sputtering process on the crystallinity, surface roughness, carrier concentration, carrier mobility, and optical properties of Al-doped ZnO thin films deposited on sapphire (001) substrates by RF magnetron sputtering were investigated. XRD spectra showed a preferred orientation along the c-axis and a minimum FWHM of the (002) XRD intensity peak for the $O_2/Ar$ flow ratio of 0.5. The (101)peak also appeared and the degree of preferred orientation decreased as the $O_2/Ar$ flow ratio increased from 0.5 to 1.0. AFM analysis results showed that the surface roughness was lowest at the $O_2/Ar$ flow ratio of 0.5 and tended to increase owing to the increase of the grain size as the $O_2/Ar$ flow ratio increased further. According to the Hall measurement results the carrier concentration and carrier mobility of the fan decreased and thus the resistivity increased as the $O_2/Ar$ flow ratio increased. The transmittance of the ZnO:Al film deposited on the glass substrate was characteristic of a standing wave. The transmittance increased as the $O_2/Ar$ flow ratio in-RF magnetron sputtering increased up to 0.5. Considering the effects of the $O_2/Ar$ flow ratio on the surface roughness, electrical resistivity and transmittance properties of the ZnO:Al film the optimum $O_2/Ar$ flow ratio was 0.5 in the RF magnetron sputter deposition of the ZnO:Al film.