• 제목/요약/키워드: Accumulation layer

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Transmission Line Analysis of Accumulation Layer in IEGT

  • Moon, Jin-Woo;Chung, Sang-Koo
    • Journal of Electrical Engineering and Technology
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    • v.6 no.6
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    • pp.824-828
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    • 2011
  • Transmission line analysis of the surface a cumulation layer in injection-enhanced gate transistor (IEGT) is presented for the first time, based on per-unit-length resistance and conductance of the surface layer beneath the gate of IEGT. Lateral electric field on the accumulation layer surface, as well as the electron current injected into the accumulation layer, is governed by the well-known wave equation, and decreases as an exponential function of the lateral distance from the cathode. Unit-length resistance and conductance of the layer are expressed in terms of the device parameters and the applied gate voltage. Results obtained from the experiments are consistent with the numerical simulations.

Physico-chemical Properties of Disturbed Plastic Film House Soils under Cucumber and Grape Cultivation as Affected by Artificial Accumulation History

  • Han, Kyung-Hwa;Ibrahim, Muhammad;Zhang, Yong-Seon;Jung, Kang-Ho;Cho, Hee-Rae;Hur, Seung-Oh;Sonn, Yeon-Kyu
    • Korean Journal of Soil Science and Fertilizer
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    • v.48 no.2
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    • pp.105-118
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    • 2015
  • This study was carried out to investigate the effects of profile disturbance with different artificial accumulation history on physico-chemical properties of soil under plastic film house. The investigations included soil profile description using soil column cylinder auger F10cm x h110cm, in situ and laboratory measurements of soil properties at five sites each at the cucumber (Site Ic ~ Vc) and grape (Site Ig ~ Vg) plastic film houses with artificial soil accumulation. The sites except sites Ic, IVc, IVg and Vg, belong to ex-paddy area. The types of accumulates around root zone included sandy loam soil for 3 sites, loam soil for 1 site, saprolite for 2 sites, and multi-layer with different accumulates for 3 sites. Especially, Site IIg has mixed plow zone (Ap horizon) with original soil and saprolite, whereas disturbed soil layers of the other sites are composed of only external accumulates. The soil depth disturbed by artificial accumulation ranged from 20 cm, for Site IIg, to whole measured depth of 110 cm, for Site IVc, Vc, and Site IVg. Elapsed time from artificially accumulation to investigation time ranged from 3 months, Site IIc, to more than 20 years, Site Vg, paddy-soil covering over well-drained upland soil during land leveling in 1980s. Disturbed top layer in all sites except Site Vg had no structure, indicating low structural stability. In situ infiltration rate had no correlation with texture or organic matter content, but highest value with highest variability in Site IIIc, the shortest elapsed time since sandy loam soil accumulation. Relatively low infiltration rate was observed in sites accumulated by saprolite with coarse texture, presumably because its low structural stability in the way of weathering process could result in relatively high compaction in agro-machine work or irrigation. In all cucumber sites, there were water-transport limited zone with very low permeable or impermeability within 50 cm under soil surface, but Site IIg, IIIg, and Vg, with relatively weak disturbance or structured soil, were the reverse. We observed the big change in texture and re-increase of organic matter content, available phosphate, and exchangeable cations between disturbed layer and original soil layer. This study, therefore, suggest that the accumulation of coarse material such as saprolite for cultivating cash crop under plastic film house might not improve soil drainage and structural stability, inversely showing weaker disturbance of original soil profile with higher drainage.

Improvement of Hybrid EL Efficiency in Nanoparticle EL Devices by Insertion of the Layers of PVK and BaF2

  • Lee, Jun-Woo;Cho, Kyoung-Ah;Kim, Hyun-Suk;Park, Byoung-Jun;Kim, Sang-Sig;Kim, Sung-Hyun
    • Transactions on Electrical and Electronic Materials
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    • v.6 no.3
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    • pp.101-105
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    • 2005
  • Electroluminescence(EL) and current-voltage(I-V) characteristics of hybrid EL devices containing Pr and Mn co-doped ZnS nanoparticles were investigated in this study. For the insertion of a hole transport layer of poly (N-vinyl carbazole)(PVK), the current level became lower due to the accumulation of electrons at the interface between PVK and nanoparticles. When both PVK and buffer layer $BaF_2$ were simultaneously introduced, the enhanced EL efficiency and improved I-V characteristics were obtained. This results from the additional increase of hole injection owing to the internal field induced by the significant accumulation of electrons at the interface. The presence of buffer layer $BaF_2$ together with PVK makes it possible the charge accumulation enough to induce the sufficient internal field for further hole injection.

Impact of Solution-Processed BCP Buffer Layer on Efficient Perovskite Solar Cells (페로브스카이트 태양전지에서의 저온 용액 공정의 BCP 버퍼층 효과)

  • Jung, Minsu;Choi, In Woo;Kim, Dong Suk
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.34 no.1
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    • pp.73-77
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    • 2021
  • Inorganic-organic hybrid perovskite solar cells have demonstrated considerable improvements, reaching 25.5% of certified power conversion efficiency in 2020 from 3.8% in 2009. In normal structured perovskite solar cells, TiO2 electron-transporting materials require heat treatment process at a high temperature over 450℃ to induce crystallinity. Inverted perovskite solar cells have also been studied to exclude the additional thermal process by using [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) as a non-oxide electron-transporting layer. However, the drawback of the PCBM layer is a charge accumulation at the interface between PCBM and a metal electrode. The impact of bathocuproin (BCP) buffer layer on photovoltaic performance has been investigated herein to solve the problem of PCBM. 2-mM BCP-modified perovskite solar cells were observed to exhibit a maximum efficiency of 12.03% compared with BCP-free counterparts (5.82%) due to the suppression of the charge accumulation at the PCBM-Au interface and the resulting reduction of the charge recombination between perovskite and the PCBM layer.

Studies of Electric Double Layer Capacitors Used For a Storage Battery of Dye Sensitized Solar Cell Energy

  • Kim Hee-Je;Jeon Jin-An;Sung Youl-Moon;Yun Mun-Soo;Choi Jin-Young
    • Journal of Electrical Engineering and Technology
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    • v.1 no.2
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    • pp.251-256
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    • 2006
  • To design the effective usage of electric double layer capacitors (EDLCs) used for a storage device of dye sensitized solar cell (DSC) energy, we first investigated the accumulation state of electrical charges and the charge behavior in the EDLCs. Based on the results, the voltage characteristics of EDLCs connected to DSC energy were evaluated. The results showed that the charge accumulation region concentrated on the central part of the carbonaceous electrode in EDLCs and the required times for charging and discharging were almost the same.

Studies of electric double layer capacitors used for a storage battery of dye sensitized solar cell energy (염료감응형 태양전지의 축전지로 사용되는 전기이중층콘덴서에 대한 연구)

  • Choi, Jin-Young;Lee, Im-Geun;Hong, Ji-Tae;Kim, Hee-Je
    • 한국신재생에너지학회:학술대회논문집
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    • 2005.11a
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    • pp.673-676
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    • 2005
  • To design the effective usage of electric double layer capacitors (EDLCs) used for a storage device of dye sensitized solar cell(DSC) energy, we first investigated the accumulation state of electrical charges and the charge behavior in the EDLCs. Based on the results. the voltage characteristics of EDLCs connected to DSC energy were evaluated. The results showed that the charge accumulation region concentrated on central part of the carbonaceous electrode in EDLCs and the required times for charging and discharging were almost the same.

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A Study on Way of Spatial Composition of Tongdo Temple by Diachronic Analysis (통시적 분석에 의한 통도사의 공간구성 수법에 관한 연구)

  • 강영조
    • Journal of the Korean Institute of Landscape Architecture
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    • v.27 no.3
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    • pp.50-57
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    • 1999
  • This study aim to clarify the way of spatial composition of Tongdo Temple by diachronic analysis. The way of spatial composition was clarified through the analysis of built in architectural system in three periods. The result are as follows; 1. Spatial composition of Tongdo temple was changed in three period that it were establishment period, 1300s, and 1700s by the transition of meaning structure occurring the transition of spatial composition. 2. It was found out that the wat of spatial composition was three through the diachronic analysis the transition of spatial composition in Tongdo temple. 3. Juxtaposition as a way of spatial composition found out through the diachronic analysis is equivalent articulation of three sections; an upper, a middle, and a lower section and polyaxis or polycore in the each sections. Fusion is heterogenetic minglement mingling different kind of buildings and conjugation conjugating different kind of decorations. And accumulation of layer is mutilayer laying different time of layer and multi aspect aligning different kind of aspects since the temple's establishment.

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Si-buffer pinholes in the SEPOX (selective poly oxidation) process (SEPOX (selective poly oxidation) process에서 Si-buffer layer에 발생하는 pinhole 현상에 대한 연구)

  • 윤영섭
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.6
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    • pp.151-157
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    • 1996
  • We propose a mechanism for the formation of pinholes in the Si-buffer layer, through the observations with varying the process- and structure variables in the SEPOX (selective poly-oxidation) process, an isolation method for sub-u DRAMs. Pinholes are formed through the accumulation of Si vacancies generated by the oxidation of Si, in which Si atoms leave the sites (vacancies) at the Si/SiO$_{2}$ interfaces and diffuse into the oxide to be oxidized near interface. In the course of the accumulation of Si-vacancies, the stress induced in the Si-buffer layer affects the migration of vacancies to result in the final size and distribution of pinholes. This paper may be, to our knowledge, the first report about the oxidation-induced pinhole in the Si/SiO$_{2}$ system.

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A Simple Model for Parasitic Resistances of LDD MOSFETS (LDD MOSFET의 기생저항에 대한 간단한 모형)

  • Lee, Jung-Il;Yoon, Kyung-Sik;Lee, Myoung-Bok;Kang, Kwang-Nham
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.27 no.11
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    • pp.49-54
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    • 1990
  • In this paper, a simple model is presented for the gate-voltage dependence of the parasitic resistance in MOSFETs with the lightly-doped drain (LDD) structure. At the LDD region located under the gate electrode, an accumulation layer is formed due to the gate voltage. The parasitic resistance of the source side LDD in the channel is treated as a parallel combination of the resistance of the accumulation layer and that of the bulk LDD, which is approximated as a spreading resistance from the end of the channel inversion layer to the ${n^+}$/LDD junction boundary. Also the effects of doping gradients at the junction are discussed. As result of the model, the LDD resistance decreases with increasing the gate voltage at the linear regime, and increase quasi-linearly with the gate voltage at the saturation regime, considering th velocity saturation both in the channel and in the LDD region. The results are in good agreement with experimental data reported by others.

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Analysis on Cutting Force of Tool in Gear Chamfering Process (기어 챔퍼링 공정에서 공구의 절삭력 해석)

  • Choi, Boo-Rim;Hwang, Kwang-Bok;Bae, Kang-Yul
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.12 no.1
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    • pp.52-62
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    • 2013
  • In order to obtain the relation between the cutting force and the process parameters in the chamfering process for the gear of a gear shaft, analysis of the process was performed with a simplified model instead of considering the whole actual 3-dimensional cutting situation produced between cutting tool and gear. The model divided the actual situation into the accumulation of hundreds of 2-dimensional layers with a small thickness in the direction of the height of gear and derived cutting force at a cutting position by accumulating each cutting force calculated in a layer. With proposed method to analyze the cutting forces in the chamfering process, it was revealed that the cutting position and size were exactly searched to calculate the cutting force in each layer. The total cutting force was the highest in the corner where the cutter encountered the gear first during the relative motion between them. The cutting forces were changed in proportion to the cutting parameters such as feed rate and trajectory.