• International Journal of Reliability and Applications
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• v.10 no.2
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• pp.101-107
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• 2009

In the accelerated tests, the importance of correct failure analysis must be strongly emphasized. Understanding the failure mechanisms is requisite for designing and conducting successful accelerated life test. Under this presumption, a rational method must be identified to relate the results of accelerated tests quantitatively to the reliability or failure rates in use conditions, using a scientific acceleration transform. Most widely used models for relating the results of accelerated tests quantitatively to the reliability or failure rates in use conditions are an accelerated failure time model and a proportional hazards model. The purpose of this research is to compare the usability of the accelerated failure time model and proportional hazards model in the accelerated life tests.

• Journal of Power Electronics
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• v.17 no.3
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• pp.811-820
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• 2017

The reliability issue of IGBT is a concern for researchers given the critical role the device plays in the safety of operations of the converter system. The reliability of power devices can be estimated from the intermittent life test, which aims to simulate typical applications in power electronics in an accelerated manner to obtain lifetime data. However, the test is time-consuming, as testing conditions are not well considered and only rough provisions have been made in the current standards. Acceleration of the test by changing critical test conditions is controversial due to the activation of unexpected failure mechanisms. Therefore, full investigations were conducted on critical test conditions of intermittent life test. A design optimization process for IGBT intermittent life testing program was developed to save on test times without imposing additional failure mechanisms. The applicability of the process has been supported by a number of tests and failure analysis of the test results. The process proposed in this paper can guide the test process for other power semiconductors.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.19 no.6
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• pp.67-72
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• 2020

Life tests are essential in reducing the catastrophic damage caused by the accidents of large machinery such as aircraft and ships. However, life tests are challenging to implement due to the high costs and time required to test the life of large machinery parts. Therefore, it is advantageous and convenient to apply accelerated life test techniques for key components to reduce costs and time. In fact, extensive research has already been conducted on these techniques. However, recently, there have been cases in which an experimental value was applied to the shape parameter of the Weibull distribution used in the reliability test, but the test time was not significantly reduced. Therefore, in this paper, the shape parameters are estimated from the probability density function of the Weibull distribution for the analysis of an accelerated life test for bladder accumulators, which are core components of military helicopters. The test time was derived based on the number of samples and confidence level by substituting it into the test time equation. Next, the accelerated life test time was calculated using the steady-state test time with an acceleration factor obtained from the Arrhenius model. The steady-state life test required approximately 15,000 H, whereas the accelerated life test time for one sample at 100 ℃ was 34% shorter than that of the steady-state life test.

• Journal of Applied Reliability
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• v.17 no.1
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• pp.22-27
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• 2017

Purpose: The purpose of this study is to estimate the life time of OLED TV panel through electric current ADT(Accelerated Degradation Test). Methods: We performed accelerated degradation test for OLED TV Panel at the room temperature to avoid high temperature impact on the luminance. Results: we got more accurately the life time of the OLED TV when we applied ADT without temperature factor than including both current and temperature. Conclusion: Until now, the ADT of the OLED TV has been conducted with temperature and current at the same time for reducing test time and costs. We estimate incorrect life time when the temperature is adopted as an accelerated factor. Due to the high temperature impact on the luminance of the OLED TV panel. So as to solve this problem, we discard temperature and use electric current only.

• Journal of Applied Reliability
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• v.14 no.1
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• pp.45-51
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• 2014

Thermal shock tests at two stress levels were performed to see the life (cycles) of LPF ASSY (low pass filter assembly) at normal stress level. In this case Coffin-Manson relationship is generally used to describe the relationship between the temperature difference and the life, together with the Weibull distribution describing the life at each stress level. So for given data Coffin-Manson is fitted to predict the life at normal stress level. However, different types of models are appropriate for this type of test. Hence, a more appropriate model such as General log-linear model which can also incorporate the duration at the highest and lowest temperatures and acceleration time will be introduced.

• Journal of Korean Society for Quality Management
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• v.23 no.4
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• pp.13-27
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• 1995

This paper considers the design of life test sampling plans based on Type II censored accelerated life tests. The lifetime distribution of products is assumed to be exponential. An estimator of acceleration factor between use condition stress and an accelerated level of stress higher than use condition stress is assumed to be known. The critical value for lot acceptance and the number of failure before censoring which satisfy the producer's and consumer's risk requirements are determined. The properties of the proposed life test sampling plans are investigated.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.59 no.10
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• pp.1770-1775
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• 2010

An acceleration life test for rubber gasket of pole transformer was performed. The Arrhenius method was applied as an accelerated degradation test. The failure mode was considered as an elongation, and the failure mechanism is counted as a heat. It is found that both the current material(NBR: Nitrile Butadiene Rubber) and recommended alternative material(HNBR: Hydrogenated Nitrile Butadiene Rubber) have the same Weibull distribution as a life characteristic. For life expectation 95% reliability level of characteristic life is used at using temperature. The test results for NBR and HNBR are 7.7 years and 28.0 years on $50^{\circ}C$ of using temperature, respectively.

• Journal of Applied Reliability
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• v.3 no.2
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

• Journal of Applied Reliability
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• v.17 no.1
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• pp.50-57
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• 2017

Purpose : This paper is a comparative analysis results of the fatigue test for dental implants and accelerated life test by using a static type loading device commonly used in Korea and a dynamic type loading device (universal-joint) recommended by FDA. Methods : Fatigue tests of dental implant is based on ISO 14801 and classified into static load test and dynamic load test. The tests were carried out on three test specimens by four load stress steps under each loading device. For analysis on failure mode such as crack, fracture and permanent deformation of test specimens, we used X-ray three-dimensional computed tomography on test specimens before and after the fatigue tests. The design of the accelerated life test was based on the analysis results of the fatigue life data obtained from the dynamic load test and the statistical analysis software (Minitab ver.15) was used to analyze the appropriate life distribution. Results : As a result of the fatigue tests and the accelerated life tests at same acceleration condition under each test method, the fatigue life under the dynamic type loading device (universal-joint) was shorter than when static type loading device was applied. Conclusion : This paper can be used as a reference when the universal-joint type loading device for implants fatigue test is applied as ISO 14801.

• Transactions of The Korea Fluid Power Systems Society
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• v.2 no.2
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• pp.1-7
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• 2005

For the reliability evaluation of the track drive unit(TDU), firstly, we analyzed the major failure modes through FMEA(failure mode & effects analysis), FTA(failure tree analysis), and 2-stage QFD(quality function deployment), and then quantitatively determined the priority order of test items. The Minitab analysis was also performed for prediction of life distribution and parameters of TDU by use of field failure data collected from 430 excavators for two years. In addition, we converted the fluctuation load in field conditions into the equivalent load, and for evaluation of the accelerated lift by the cumulative fatigues, the equivalent load is again divided into the fluctuation load by reference of test time. And then, by use of the test method in this paper, the acceleration factor(AF) of needle bearing inside planetary gear which is the most weakly designed part of TDU is achieved as 5.3. This paper presents the quantitative selection method of test items for reliability evaluation, the determination method of the accelerated life test time, and the method of non-failure test time based on a few of samples. And, we proved the propriety of the proposed methods by experiments using a TDU for a 30 ton excavator.