• Journal of Korean Institute of Industrial Engineers
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• v.14 no.2
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• pp.91-97
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• 1988

In accelerated life testing, a relationship is usually assumed between the stress and a parameter of the lifetime distribution. However, the true relationship is not usually known, and therefore, the experimenter may wish to provide protections against the likely departures from the assumed relationship. This paper considers an accelerated life test in which two stress levels are involved, and the lifetime of each test item at a stress level is assumed to have an independent, identical, exponential distribution. For the case where a first order relationship is assumed while the true one is quadratic, a procedure is developed for allocating test items to stress levels such that the bias and/or the variance of the estimated(log-transformed) mean lifetime at the use condition is minimized.

• Proceedings of the Korean Statistical Society Conference
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• 2000.11a
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• pp.235-240
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• 2000

In this paper a test of fit for exponentiality and we propose the estimator of Kullback-Leibler Information functions using the data from accelerated life tests. This acceleration model is assumed to be a tampered random variable model. The procedure is applicable when the exponential parameter based on the data from accelerated life tests is or is not specified under null hypothesis. Using Simulations, the power of the proposed test based on use condition of accelerated life test under alternatives is compared with that of other standard tests in the small sample.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.29 no.7 s.238
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• pp.921-929
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• 2005

This paper presents an accelerated life test for burnout of tungsten filament of incandescent lamp. From failure analyses of field samples, it is shown that their root causes are local heating or hot spots in the filament caused by tungsten evaporation and wire sag. Finite element analysis is performed to evaluate the effect of vibration and impact for burnout, but any points of stress concentration or structural weakness are not found in the sample. To estimate the burnout life of lamp, an accelerated life test is planned by using quality function deployment and fractional factorial design, where voltage, vibration, and temperature are selected as accelerating variables. We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test and test for common shape parameter of the distribution. Using accelerated life testing software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor.

• Journal of the Korea Safety Management & Science
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• v.2 no.2
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• pp.71-83
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• 2000

This paper presents accelerated life tests for Type I censoring data under probabilistic stresses. Probabilistic stress, $S_j$, is the random variable for stress influenced by test environments, test equipments, sampling devices and use conditions. The hazard rate, ,$theta_j$, is the random variable of environments and the function of probabilistic stress. Also it is assumed that the general stress distribution is uniform, the life distribution for the given hazard rate, $\theta$, is exponential and inverse power law model holds. In this paper, we obtained maximum likelihood estimators of model parameters and the mean life in use stress condition.

• International Journal of Reliability and Applications
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• v.15 no.2
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• pp.125-150
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• 2014

Accelerated life tests (ALTs) are extensively used to determine the reliability of a product in a short period of time. Test units are subject to elevated stresses which yield quick failures. ALT can be carried out using constant-stress, step-stress, progressive-stress, cyclic-stress or random-stress loading and their various combinations. An ALT with linearly increasing stress is ramp-stress test. Much of the previous work on planning ALTs has focused on constant-stress, step-stress, ramp-stress schemes and their various combinations where the stress is generally increased. This paper presents an optimal design of ramp soak-stress ALT model which is based on the principle of Thermal cycling. Thermal cycling involves applying high and low temperatures repeatedly over time. The optimal plan consists in finding out relevant experimental variables, namely, stress rates and stress rate change points, by minimizing variance of reliability function with pre-specified mission time under normal operating conditions. The Burr type XII life distribution and time-censored data have been used for the purpose. Burr type XII life distribution has been found appropriate for accelerated life testing experiments. The method developed has been explained using a numerical example and sensitivity analysis carried out.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1391-1393
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• 2008

In this paper, the long-term reliability for 1.25G transceiver in use of high speed optical access network is investigated. High temperature storage tests and accelerated life tests are used to long-term reliability. Accelerated aging test have been during 3,000 hour of the three accelerated aging conditions by caused high temperature stress. Mean life is assumed to follow the Arrhenius relationship and analysis from the failure data obtained in the accelerated aging conditions.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2004.05a
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• pp.86-89
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• 2004

Recently polymer arresters are being used widely but we don't have appropriate long term characteristics test methods. Therefore we need to develop special test facility to evaluate long term reliability of polymer arresters. It's polymeric housing can be degraded by environmental stress and the interface between housing and inner module can be affected by moisture absorption. This moisture absorption can cause leakage current and tracking in the interface. We developed multi stress accelerated ageing test facility to simulate field conditions including UV, temperature, humidity, voltage, salt fog and rain. In addition, we carried out field exposure test at the outdoor test yard and characteristics analysis of field operated specimens to evaluate accelerating factor of this accelerated aging test.

• Journal of Applied Reliability
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• v.3 no.2
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

• Journal of the Korean Data and Information Science Society
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• v.26 no.1
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• pp.281-288
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• 2015

In this paper, the maximum likelihood estimators and confidence intervals for parameters of Weibull distribution are derived under three level constant stress accelerated life tests and the assumption that a log quadratic relationship exits between stress and the scale parameter ${\theta}$. The compound linear plan proposed by Kim (2006) is used to allocate the test units at each stress level, which performed nearly as good as the optimum quadratic plan and had the advantage of simplicity. Some simulation studies are given.

• Journal of the Korean Data and Information Science Society
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• v.17 no.4
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• pp.1375-1386
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• 2006

In life testing, the lifetimes of test units under the usual conditions are so long that life testing at usual conditions is impractical. Testing units are subjected to conditions of high stress to yield informations quickly. In this paper, the inferences of parameters on the three step-stress accelerated life testing are studied. The two-parameter exponential distribution with a failure rate function that a log-quadratic function of stress and the tempered failure rate model are considered. We obtain the maximum likelihood estimators of the model parameters and their confidence regions. A numerical example will be given to illustrate the proposed inferential procedures.