An Accelerated Life Test for Burnout of Tungsten Filament of Incandescent Lamp |
Kim Jin-Woo
(대우일렉트로닉스(주) 품질신뢰성 연구소)
Shin Jae-Chul (대우일렉트로닉스(주) 품질신뢰성 연구소) Kim Myung-Soo (수원대학교 산업정보공학과) Lee Jae-Kook (대우일렉트로닉스(주) 품질신뢰성 연구소) |
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