• Journal of Korean Institute of Industrial Engineers
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• v.14 no.2
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• pp.91-97
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• 1988

In accelerated life testing, a relationship is usually assumed between the stress and a parameter of the lifetime distribution. However, the true relationship is not usually known, and therefore, the experimenter may wish to provide protections against the likely departures from the assumed relationship. This paper considers an accelerated life test in which two stress levels are involved, and the lifetime of each test item at a stress level is assumed to have an independent, identical, exponential distribution. For the case where a first order relationship is assumed while the true one is quadratic, a procedure is developed for allocating test items to stress levels such that the bias and/or the variance of the estimated(log-transformed) mean lifetime at the use condition is minimized.

• Biomolecules & Therapeutics
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• v.10 no.4
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• pp.218-223
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• 2002

This study compared the blood-brain barrier permeability of [$^3H$] taurine in senescence-accelerated mouse (SAM) and normal mouse with common carotid artery perfusion (CCAP) method and intravenous injection technique to establish a possible relation between aging and changes in tissue levels of taurine. The SAM strains show senescence acceleration and age-associated pathological phenotypes similar to geriatric disorders seen in humans. In the result of this experiments, the plasma clearance of [$^3H$]taurine in SAM was almost comparable with that of normal mice by intravenous injection technique, but the brain volume of distribution ($V_{D brain}$) of [$^3H$]taurine in SAM by CCAP method reduced by 85% compared with that in normal mice. These results suggest that aging may have an effect on the brain transport activity of taurine in disease state model animal.

• Journal of Korean Society for Quality Management
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• v.41 no.4
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• pp.659-672
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• 2013

Purpose: The purpose of this study was to estimate life time of halogen lamps and acceleration factors using accelerated life test. Methods: Voltage was selected as an accelerating variable through the technical review about failure mechanism. The test was performed at 14.5V, 15.5V and 16.5 for 4,471 hours. It was assumed that the lifetime of Halogen lamps follow Weibull distribution and the inverse power life-stress relationship models. Results: Mean lifetimes of pin and screw types were 19,477 hours and 6,056 hours, respectively. In addition, acceleration factor of two items are calculated as 4.8 and 2.2 based on 15.5V, respectively. Conclusion: The life-stress relationship, acceleration factor, and MTTF at design condition are estimated by analyzing the accelerated life test data. These results suggest that voltage was very important factor to accelerate life time in the case of halogen lamps and the life time of pin type is three times longer than screw type lamps.

• Journal of Applied Reliability
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• v.12 no.2
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• pp.67-78
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• 2012

An electric double-layer capacitor(EDLC) is an electrochemical capacitor with relatively high energy density, typically hundreds of times greater than conventional electrolytic capacitors. EDLCs are widely used for energy storage rather than as general-purpose circuit components. They have a variety of commercial applications, notably in energy smoothing and momentary-load devices, and energy-storage and kinetic energy recovery system devices used in vehicles, etc. This paper presents an accelerated degradation test of an EDLC with rated voltage 2.7V, capacitance 100F, and usage temperature $-40^{\circ}C{\sim}65^{\circ}C$. The EDLCs are tested at $50^{\circ}C$, $60^{\circ}C$, and $70^{\circ}C$, respectively for 1,750hours, and their capacitances are measured at predetermined times by constant current discharge method. The failure times are predicted from their capacitance deterioration patterns, where the failure is defined as 30% capacitance decrease from the initial one. It is assumed that the lifetime distribution of EDLC follows Weibull and Arrhenius life-stress relationship holds. The life-stress relationship, acceleration factor, and $B_{10}$ life at design condition are estimated by analyzing the accelerated life test data.

• Proceedings of the KSME Conference
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• 2000.04a
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• pp.900-907
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• 2000

The three-dimensional turbulent flow in curved pipes susceptible to flow-accelerated corrosion has been analyzed numerically to predict the pressure and shear stress distributions on the inner surface of the pipes. The analysis employs the body-fitted non-orthogonal curvilinear coordinate system and a standard $ {\kappa}-{\varepsilon}$ turbulence model with wall function method. The finite volume method is used to discretize the governing equations. The convection term is approximated by a high-resolution and bounded discretization scheme. The cell-centered, non-staggered grid arrangement is adopted and the resulting checkerboard pressure oscillation is prevented by the application of a modified version of momentum interpolation scheme. The SIMPLE algorithm is employed for the pressure and velocity coupling. The numerical calculations have been performed for two curved pipes with different bend angles and curvature radii, and discussions have been made on the distributions of the primary and secondary flow velocities, pressure and shear stress on the inner surface of the pipe to examine applicability of the present analysis method. As the result it is seen that the method is effective to predict the susceptible systems or their local areas where the fluid velocity or local turbulence is so high that the structural integrity can be threatened by wall thinning degradation due to flow-accelerated corrosion.

• Journal of Korean Society for Quality Management
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• v.38 no.4
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• pp.504-511
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• 2010

A fuze detonator comprising star shells is an important device so that its failure usually leads to failure of the shells. In this paper, accelerated degradation tests of RD1333 (lead azide) using temperature stress were performed, and then degradation data of explosive power for the detonator were analyzed to predict the storage lifetime of detonator. Degradation data analysis to estimate the storage lifetime is based on a distribution-based degradation process. Statistical distribution parameters of explosive power degradation measures at each time were estimated for each temperature level, and then reliability of the detonator for each accelerated temperature level was estimated using both time-varying distribution parameters and critical level of explosive power. Arrhenius model was applied to estimate storage lifetime of the detonator under the field temperature condition. Accelerated distribution-based degradation analysis to estimate storage lifetime is explained in detail, and estimation results are compared to field data of storage lifetime in this paper.

• Journal of Korean Institute of Industrial Engineers
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• v.28 no.4
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• pp.407-414
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• 2002

The inherent reliability of a product is primarily determined in the design stage, and therefore, design engineers should be able to design reliability into the product in an efficient manner. Especially, the product should be designed such that its reliability is robust to various noise factors encountered in production and field environments. The Taguchi method can be effectively used for this purpose. However, there exist only a few attempts to integrate the Taguchi method with reliability design, and in addition, the existing works do not sufficiently consider the robustness and/or the distinction between noise and acceleration factors. This paper develops a unified approach to robust reliability design assuming that accelerated life tests are conducted at each combination of design and noise conditions. First, an experimental structure for assigning not only acceleration but also noise factors is presented. Second, the reliability at the use condition is estimated using the assumed accelerated life test model. Third, reliabilities are transformed into 'efforts' using an effort function which reflects the degree of difficulty involved in improving the reliability. Finally, an optimal setting of design parameters is determined based on the mean and standard deviation of the effort values. The above approach is illustrated with an example of a paper feeder design.

• International Journal of Reliability and Applications
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• v.13 no.1
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• pp.19-35
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• 2012

This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.

• Journal of the Korea Institute of Military Science and Technology
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• v.19 no.3
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• pp.311-318
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• 2016

This paper shows storage life estimation of next IR(infrared) flare material through accelerated degradation tests. Three temperature conditions for the accelerated degradation tests are 55, 65 and $75^{\circ}C$. Six performances of IR flare material are burning time, IR peak/continuous Intensity, total energy of near/mid-IR and color ratio, and they were measured after the tests. Storage life of the IR flare material was estimated through both analyzing the degradation data of those performances and applying distribution-based degradation models to the data. Over 30 years of storage life at $20^{\circ}C$ is estimated in terms of IR peak intensity with reliability 0.99 and confidence level 99 %. Additionally, 10 years of storage period at $21^{\circ}C$ would be equivalent to 68 days of accelerated test at $65^{\circ}C$ from the activation energy in Arrhenius model.

• Korean Journal of Air-Conditioning and Refrigeration Engineering
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• v.17 no.12
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• pp.1169-1176
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• 2005

In this paper, thermal reliability of a closed type BLDC (Brushless DC) motor for high speed axial fan was analyzed by the accelerated life test. The closed type BLDC (Model No. MB1-8855-J01) motor was controlled by PCB module, which was composed of various electrical components. The failure of the closed type BLDC motor happened in PCB module due to high temperature. Failure mechanism of the closed type BLDC motor appears to be electrolyte dry out of capacitor. The accelerate life test was performed in temperature stress of $85^{\circ}C\;and\;105^{\circ}C$, respectively The failure data from the accelerated life test were analyzed and the life in each stress level was estimated with 960h and 261 h. At last, both life expression according to operating temperature of PCB module and life of the closed type BLBC motor in normal condition $(50^{\circ}C)$ were suggested.