• Journal of Biosystems Engineering
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• v.34 no.5
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• pp.325-330
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• 2009

This study was performed to develop accelerated life test methods for agricultural tractor transmission receiving variable load. To acquire parameters for calculation of accelerated life test, endurance tests were performed under different torque conditions. Test results showed that the shape factor of Weibull distribution was 1.5 and fatigue damage exponent was 5.4. The calculated test time was 5,877 hours under the conditions of average life (MTBF) 3,000 hours and 90% reliability for one test sample. According to the linear cumulative damage rule, test time could be reduced using increased test load. Test time could be reduced by 252 hours when 1.2 times of the rated load compared with 0.67 times of the rated equivalent load calculated by load spectrum of the agricultural tractor. Calculated acceleration coefficient was 23.3.

• Journal of Applied Reliability
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• v.14 no.2
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• pp.93-96
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• 2014

RFID (Radio Frequency IDentification) system is recognition technology which can maintain various object's information. Reliability of RFID tags is the most important factor in RFID system. In this paper, we proposed ALT (Accelerated Life Test) method for UHF RFID tags. Temperature and humidity were adopted as stress factors and the accelerated life tests were conducted in three different conditions. We performed failure analysis for identifying failure mechanism and statistical analysis of test data. In the statistical analysis, we employed Inverse Power law for relationship between tag's life and stress. Through the statistical analysis, we proposed acceleration factor for several levels of temperature-humidity. The reliability qualification test plans were also designed for the tag's target reliability.

• Journal of Applied Reliability
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• v.5 no.4
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• pp.413-425
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• 2005

As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents an accelerated degradation testing for vacuum fluorescent displays (VFDs). The accelerated degradation model is based on Arrhenius-lifetime relationship for cathode temperatures. We compare the results between accelerated degradation test and test at normal use condition. Accelerated degradation test for display devices is observed as an efficient method to warrantee product reliability to customers, as well as a tool to save time and costs.

• Journal of Applied Reliability
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• v.18 no.1
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• pp.8-19
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• 2018

Purpose: This study has developed the accelerated lifetime test method for smps for outdoor lighting LED through two factors of temperature and humidity. Methods: Acceleration condition was confirmed for each stress and model, and acceleration life test model was estimated according to acceleration condition. Results: As a result of confirming the accelerated life test model, in the case of humidity, acceleration was established only in the foreign products. Therefore, it is confirmed that the acceleration condition is insufficient. However, the estimated parameters for temperature are relatively constant. It is therefore suitable for power supply acceleration tests for outdoor lighting LEDs. Conclusion: The SMPS acceleration test for outdoor lighting LED can improve the availability of the product by developing an accelerated life test method that guarantees the reliability of the product.

• The Korean Journal of Applied Statistics
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• v.13 no.2
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• pp.563-573
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• 2000

In this paper, we propose three estimators of Kullback-Leibler Information functions using the data from accelerated life tesb. This acceleration model is assumed to be a tampered random variable model. Some asymptotic properties of proposed estimators are proved. Simulations are performed for comparing the small sample properties of the proposed estimators under use condition of accelerated life test.

• Journal of Korean Society for Quality Management
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• v.17 no.1
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• pp.89-106
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• 1989

For Weibull distributed lifetimes, this paper presents asymptotically optimal accelerated life test plans for practical applications under intermittent inspection and type-I censoring. Computational results show that the asymptotic variance of a low quantile at the design stress as optimal criterion is insensitive to the number of inspections at overstress levels. Sensitivity analyses indicate that optimal plans are robust enough to moderate departures of estimated failure probabilities at the design and high stresses as input parameters to plan accelerated life tests from their true values. Monte Carlo simulation for small sample study on optimal accelerated life test plans developed by the asymptotic maximum likelihood theory is conducted. Simulation results suggest that optimal plans are satisfactory for sample size in practice.

• Journal of Applied Reliability
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• v.5 no.2
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• pp.273-287
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• 2005

Accelerated life test models and procedure are developed to assess the reliability of Refrigerator door switch. The main function of door switch is to operate bulb lamp and fan motor in the refrigerating room. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

• Proceedings of the KIEE Conference
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• 2002.07a
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• pp.536-540
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• 2002

In this paper, accelerated life test (ALT) models and procedures for Magnetic Switch (MS) are developed and applied to assure specified reliability of the products at development phase and guarantee the life of the products. Magnetic contactor that functions with over-current relay is called MS. Magnetic contactor closes and opens the motor load with ON/OFF switch of electronic contactor. It is also used for protecting and controlling the load. Magnetic contactor detects the over-current flow in the load with a over-current relay and disconnects the load by opening its control power. In this study, ALT models for MS are developed using the relationship between stresses and life characteristics of products. Using the ALT models, we performed life tests and analyzed the tests results. The proposed ALT models and procedures may be extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably. Finally the results of this study will contribute to improving reliability of products and strengthening competitiveness of our products in world markets.

• Journal of Korean Society for Quality Management
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• v.25 no.3
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• pp.1-10
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• 1997

In the context of accelerated life tests, procedures are given for estimating the parameters in the modified Arrhenius model and for estimating mean life at a given future stress level. The conditional confidence intervals are obtained by conditioning on ancillary statistics and pivotal quantity. Using the data of Tobias and Trindada(1986), we illustrate conditional confidence interval for parameters under use condition in the modified Arrhenius model.

• Journal of the Korea Safety Management & Science
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• v.4 no.3
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• pp.59-66
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• 2002

This paper presents accelerated life tests for Type I censoring data under probabilistic stresses. Probabilistic stress, S, is the random variable for stress influenced by test environments, test equipments, sampling devices and use conditions. The hazard rate, $\theta$ is a random variable of environments and a function of probabilistic stress. In detail, it is assumed that the hazard rate is linear function of the stress, the general stress distribution is a gamma distribution and the life distribution for the given hazard rate, $\theta$is an exponential distribution. Maximum likelihood estimators of model parameters are obtained, and the mean life in use stress condition is estimated. A hypothetical example is given to show its applicability.