• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2008년도 춘계학술대회 논문집
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• pp.611-612
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• 2008

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2010년도 추계학술대회 논문집
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• pp.727-728
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• 2010

• 한국세라믹학회지
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• 제40권1호
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• pp.24-30
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• 2003

AFm상의 생성과 전이는 시멘트에서의 수화반응, 경화속도 그리고 내구성에 큰 영향을 미친다. 실험실에서 제조한 3종류의 대표적인 AFm상에 CaC $O_3$, CaC $l_2$ 및 CaS $O_4$.2$H_2O$를 첨가하였을 때의 상변화를 검토를 하였다 AFm상의 상전이는 각 수화물의 용해도적과 밀접한 관계가 있다. 각종 AFm상( $M_{S}$ , $M_{C}$, $M_{Cl}$ )에 CaS $O_4$.2$H_2O$를 첨가한 경우, 모든 경우에서 AFm상은 ettringite로 전이를 하였다. 전이의 순서는 $M_{S}$ 가 가장 빠르게 ettringite로 전이를 하였으며 $M_{Cl}$ 이 가장 늦게 전이를 하였다. CaC $O_3$를 AFm상에 첨가하였을 경우에는 $M_{S}$ 는 보다 안정한 상인 $M_{C}$로 전이를 하였으며, 또 $M_{S}$ 중의 S $O_4$$^{2-}$ 이온이 방출되어 ettringite가 생성된다. $M_{C}$ 및 $M_{Cl}$ 에 CaC $O_3$를 첨가한 경우에는 아무런 상 변화가 일어나지 않았다. CaC $l_2$를 AFm상에 첨가하였을 경우, $M_{S}$ 는 $M_{Cl}$ 로 전이를 하였으며, $M_{S}$ 중의 S $O_4$$^{2-}$ 이온이 방출되어 ettringite가 생성된다. $M_{C}$에 CaC $l_2$를 첨가한 경우 $M_{C}$는 완전히 $M_{Cl}$ 로 전이를 하였다. $M_{Cl}$ 에 CaC $l_2$를 첨가하였을 경우에는 아무런 수화물의 변화는 발생하지 않았다. 따라서 CaS $O_4$.2$H_2O$를 CaC $O_3$및 CaC $l_2$와 반응시켰을 때의 AFm상의 안정성 순서는 $M_{S}$ < $M_{C}$< $M_{Cl}$ 로 된다.

• Biotechnology and Bioprocess Engineering:BBE
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• 제4권1호
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• pp.72-77
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• 1999

An antibody containing a genetically engineered lipid group at the N-termunus and a hexahistidinyl tag at the C-terminus (Lpp-scF-His6) was immobilized in an oriented manner on the surface of liposome. Liposomes, consisting of antibody and phosphatidyl-choline, have been prepared and imaged by AFM. For AFM visualization, the resulting liposomes were bound on the surface of mica by two different mechanisms. The histidine tags present in the antibody molecules of the immonuliposome were anchored to the NiCl2 treated mica surface. Alternatively, the immunoliposomes were immunochemically bound on antigen-coated mica surface. Both approaches yielded liposomes which were clearly imaged without damage by AFM in ambient condition.

• Tribology and Lubricants
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• 제28권2호
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• pp.62-69
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• 2012

Atomic force microscopy (AFM) has been widely utilized as a versatile tool not only for imaging surfaces but also for understanding nano-scale interfacial phenomena. By measuring the responses of the photo detector due to bending and torsion of the cantilever, which are caused by the interactions between the probe and the sample surface, various interfacial phenomena and properties can be explored. One of the challenges faced by AFM researchers originates in the physics of measuring the small forces that act between the probe of a force sensing cantilever and the sample. To understand the interactions between the probe and the sample quantitatively, the force calibration is essential. In this work, the procedures used to calibrate AFM instrumentation for nano-scale force measurement in normal and lateral directions are reviewed.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 추계학술대회 논문집
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• pp.54-54
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• 2009

AFM anodic oxidation has the capability of patterning complex nano-patterns under relatively high speeds and low voltage. We report the fabrication using a atomic force microscopy (AFM) of silicon nano-ribbon and nano-field effect transistors (FETs). The fabricated nano-patterns have great potential characteristics in various fields due to their interesting electronic, optical and other profiles. The results shows that oxide width and the separation between the oxide patterns can be optimally controlled. The subsequently fabricated silicon nano-ribbon and nano-FET working devices were controled by various tip-sample bias-voltages and scan speed of AFM anodic oxidation. The results may be applied for highly integration circuits and sensitive optical sensor applications.

• 대한기계학회논문집A
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• 제30권11호
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• pp.1335-1347
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• 2006

Surface energies calculated from measured contact angles between several solutions and test samples, such as Si wafer, $Al_2O_3$, $SiO_2$, PTFE(Polytertrafluoroethylene), and DLC(Diamond Like Carbon) films, based on geometric mean method and Lewis acid base method. In order to relate roughness to adhesion force, surface roughness of test samples were scanned large area and small by AFM(Atomic Force Microscopy). Roughness was representative of test samples in large scan area and comparable with AFM tip radius in small scan area. Adhesion forces between AFM tip and test samples were matched well with order of roughness rather then surface energy. When AFM tips having different radius were used to measure adhesion force on DLCI film, sharper AFM tip was, smaller adhesion force was measured. Therefore contact area was more important factor to determine adhesion force.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2004년도 추계학술대회 논문집
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• pp.501-504
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• 2004

This paper describes the fabrication method for atomic force microscopy(AFM) tip with multi-walled carbon nanotube(MWNT). For making a carbon nanotube (CNT) modified tips, AC electric field which cause the dielectrophoresis was used for alignment and deposition of CNTs in this research. By dropping the MWNT solution and applying an electric field between an AFM tip and an electrode, MWNTs which were dispersed into a diluted solution were directly assembled onto the apex of the AFM tips due to the attraction by the dielectrophoretic force. In this case, we investigate the effect of the angle between a tip axis and an electrode. Experimental setup were presented, and then CNT attached AFM tips are successfully shown in this paper.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2007년도 춘계학술대회논문집
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• pp.379-382
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• 2007

The proper orthogonal decomposition(POD) is used to the modal analysis of microcantilever of dynamic mode atomic force microscopy(AFM). The proper orthogonal modes(POM) are extracted from vibrating signals of microcantilever when it resonates and taps the sample. The POMs resemble the linear normal modes(LNM) of cantilever vibrating at each resonance frequency. Some of POMs in tapping microcantilever show quite different shapes from the POMs of the resonating microcantilever. Also this POMs can be applied to model for the complex nonlinear behavior of the dynamic mode AFM microcantilevers.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2007년도 춘계학술대회논문집
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• pp.264-268
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• 2007

Proper orthogonal decomposition(POD) is a method for extracting bases for modal decomposition from the ensemble of signals. We verified the connection of the proper orthogonal modes(POMs) and the linear normal modes(LNMs) through MATLAB simulation for the simple cantilever and AFM microcantilever models. Using the POMs, we can analyze and model effectively the dynamic mode of AFM microcantievers.