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http://dx.doi.org/10.9725/kstle.2012.28.2.062

Quantitative Measurement of Nano-scale Force using Atomic Force Microscopy  

Chung, Koo-Hyun (School of Mechanical Engineering, University of Ulsan)
Publication Information
Tribology and Lubricants / v.28, no.2, 2012 , pp. 62-69 More about this Journal
Abstract
Atomic force microscopy (AFM) has been widely utilized as a versatile tool not only for imaging surfaces but also for understanding nano-scale interfacial phenomena. By measuring the responses of the photo detector due to bending and torsion of the cantilever, which are caused by the interactions between the probe and the sample surface, various interfacial phenomena and properties can be explored. One of the challenges faced by AFM researchers originates in the physics of measuring the small forces that act between the probe of a force sensing cantilever and the sample. To understand the interactions between the probe and the sample quantitatively, the force calibration is essential. In this work, the procedures used to calibrate AFM instrumentation for nano-scale force measurement in normal and lateral directions are reviewed.
Keywords
AFM cantilever; force calibration; force-distance curve; friction loop;
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1 Binnig, G., Quate, C. F., and Gerber, Ch., "Atomic Force Microscope," Phys. Rev. Lett., Vol. 56, pp. 930-933, 1986.   DOI   ScienceOn
2 Mamin, H. J. and Rugar, D., "Thermomechanical Writing with an Atomic Force Microscope Tip," Appl. Phys. Lett., Vol. 61, pp. 1003-1005, 1992.   DOI
3 Sung, I.H., Yang, J.-C., Kim, D.E., and Shin, B.-S., "Micro/Nano-tribological Characteristics of Self-Assembled Monolayer and Its Application in Nano-Structure Fabrication," Wear, Vol. 255, pp. 808-818, 2003.   DOI
4 Erlandsson, R., McClelland, G.M., Mate, C.M., and Chiang, S., "Atomic Force Microscopy Using Optical Interferometry," J. Vac. Sci. Technol. A, Vol. 6, pp. 266-270, 1988.   DOI
5 Lee, C., Wei, X., Kysar, J.W., and Hone, J., "Measurement of the Elastic Properties and Intrinsic Strength of Monolayer Graphene," Science, Vol. 321, pp. 385-388, 2008.   DOI   ScienceOn
6 Chung, K.-H., Lee, J.-W., and Kim, D.-E., "Nano-mechanical and Tribological Characteristics of Ultra-Thin Amorphous Carbon Film Investigated by AFM," J. Mech. Sci. Technol., Vol. 18, pp. 1772-1781, 2004.   과학기술학회마을
7 Thundat, T., Allison, D. P., and Warmack, R. J., "Stretched DNA Structures Observed with Atomic Force Microscopy," Nucleic Acids Res., Vol. 22, pp. 4224-4228, 1994.   DOI
8 Mahaffy, R. E., Shih, C. K., and MacKintosh, F. C., and Kas, J., "Scanning Probe-Based Frequency-Dependent Microrheology of Polymer Gels and Biological Cells," Phys. Rev. Lett., Vol. 85, pp. 880-883, 2000.   DOI   ScienceOn
9 Chung, K.-H., Bhadriraju, K., Spurlin, T.A., Cook, R., and Plant, A.L., "Nanomechanical Properties of Thin Films of Type I Collagen Fibrils," Langmuir, Vol. 26, pp. 3629-3636, 2010.   DOI
10 Guthold, M., Liu, W., Stephens, B., Lord, S.T., Hantgan, R.R., Erie, D.A., Taylor Jr. R. M., and Superfine, R., "Visualization and Mechanical Manipulations of Individual Fibrin Fibers Suggest that Fiber Cross Section Has Fractal Dimension 1.3," Biophys. J., Vol. 87, pp. 4226-4236, 2004.   DOI
11 Cleveland, J.P., Manne, S., Bocek, D., and Hansma, P.K., "A Nondestructive Method for Determining the Stiffness of Cantilevers for Scanning Force Microscopy," Rev. Sci. Instrum., Vol. 64, pp. 403-405 1995.
12 Higgins, M.J., Proksch, R., Sader, J.E., Polcik, M., Endoo, S. Mc, Cleveland, J. P., and Jarvis, S.P., "Noninvasive Determination of Optical Lever Sensitivity in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 77, pp. 013701, 2006.   DOI
13 Cain, R.G., Biggs, S., and Page, N.W., "Force Calibration in Lateral Force Microscopy," J. Colloid Interface Sci., Vol. 227, pp. 55-65, 2001.
14 Pratt, J.R., Smith, D.T., Newell, D.B., Kramar, J.A., and Whitenton, E., "Progress toward Système International d'Unités traceable force metrology for nanomechanics," J. Mater. Res., Vol. 19, pp. 366-379, 2004.   DOI
15 Ogletree, D. F., Carpick, R. W., and Salmeron, M., "Calibration of Frictional Forces in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 67, pp. 3298-3306, 1996.   DOI   ScienceOn
16 Wagner, K., Cheng, P., and Vezenov, D., "Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy," Langmuir, Vol. 27, pp. 4635-4644, 2011.   DOI
17 Chung, K.-H., Shaw, G.A., and Pratt, J.R., "Accurate Noncontact Calibration of Colloidal Probe Sensitivities in Atomic Force Microscopy Using Electrostatics," Rev. Sci. Instrum., Vol. 80, pp. 065107, 2009.   DOI
18 Cannara, R.J., Eglin, M., and Carpick, R.W., "Lateral Force Calibration in Atomic Force Microscopy: A New Lateral Force Calibration Method and General Guidelines for Optimization," Rev. Sci. Instrum., Vol. 77, pp. 053701, 2006.   DOI
19 Craig, V.S.J. and Neto, C., "In Situ Calibration of Colloid Probe Cantilevers in Force Microscopy:Hydrodynamic Drag on a Sphere Approaching a Wall," Langmuir, Vol. 17, pp. 6018-6022, 2001.   DOI
20 Sader, J.E., "Parallel Beam Approximation for Vshaped Atomic Force Microscope Cantilevers," Rev. Sci. Instrum., Vol. 66, pp. 4583-4587, 1995.   DOI
21 Heim, L.-O., Kappl, M., and Butt, H.-J., "Tilt of Atomic Force Microscope Cantilevers: Effect on Spring Constant and Adhesion Measurements," Langmuir, Vol. 20, pp. 2760-2764, 2004.   DOI
22 Hutter, J.L. and Bechhoefer, J., "Calibration of Atomic Force Microscope Tips," Rev. Sci. Instrum., Vol. 6, pp. 1868-1873, 1993.
23 Butt, H.-J. and Jaschke, M., "Calculation of Thermal Noise in Atomic Force Microscopy," Nanotechnol., Vol. 6, pp. 1-7, 1995.   DOI
24 Proksch, R., Schäffer, T.E., Cleveland, J.P., Callahan, R.C., and Viani, M.B., "Finite Optical Spot Size and Position Corrections in Thermal Spring Constant Calibration," Nanotechnol., Vol. 15, pp. 1344-1350, 2004.   DOI
25 Sader, J.E., Chon, J.W.M., and Mulvaney, P., "Calibration of Rectangular Atomic Force Microscope Cantilevers," Rev. Sci. Instrum., Vol. 70, pp. 3967-3969, 1999.   DOI
26 Chung, K.-H., Lee, Y.-H., and Kim, D.-E., "Characteristics of Fracture during the Approach Process and Wear Mechanism of a Silicon AFM Tip," Ultramicroscopy, Vol. 102, pp. 161-171, 2005.   DOI
27 Torii, A., Sasaki, M., Hane, K., and Okuma, S., "A Method for Determining the Spring Constant of Cantilevers for Atomic Force Microscopy," Meas. Sci. Technol., Vol. 7, pp. 179-184, 1996.   DOI
28 Gates, R.S. and Reitsma, M.G., "Precise Atomic Force Microscope Cantilever Spring Constant Calibration using a Reference Cantilever Array," Rev. Sci. Instrum., Vol. 78, pp. 086101, 2007.   DOI
29 Sader, J.E. and Green, C.P., "In-plane Deformation of Cantilever Plates with Applications to Lateral Force Microscopy," Rev. Sci. Instrum., Vol. 75, pp. 878-883, 2004.   DOI
30 Green, C.P., Lioe, H., Cleveland, J.P., Proksch, R., Mulvaney, P., and Sader, J.E., "Normal and Torsional Spring Constants of Atomic Force Microscope Cantilevers," Rev. Sci. Instrum., Vol. 75, pp. 1988-1996, 2004.   DOI   ScienceOn
31 Feiler, A., Attard, P., and Larson, I., "Calibration of the Torsional Spring Constants and the Lateral Photodiode Response of Frictional Force Microscopes," Rev. Sci. Instrum., Vol. 71, pp. 2746-2750, 2000.   DOI
32 Chung K.-H. and Reitsma, M.G., "Lateral Force Microscope Calibration using Multiple Location Pivot Loading of Rectangular Cantilevers," Rev. Sci. Instrum., Vol. 81, pp. 026104, 2010.   DOI
33 Xie, H., Vitard, J., Haliyo, S., Regnier, S., and Boukallel, M., "Calibration of Lateral Force Measurements in Atomic Force Microscopy with a Piezoresistive Force Sensor," Rev. Sci. Instrum., Vol. 79, pp. 033708, 2008.   DOI
34 Li, Q., Kim, K.-S., and Rydberg, A., "Lateral Force Calibration of an Atomic Force Microscope with a Diamagnetic Levitation Spring System," Rev. Sci. Instrum., Vol. 77, pp. 065105, 2006.   DOI
35 Wang, F. and Zha, X., "Effect of Contact Stiffness on Wedge Calibration of Lateral Force in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 78, pp. 043701, 2007.   DOI
36 Varenberg, M., Etsion, I., and Halperin, G., "An Improved Wedge Calibration Method for Lateral Force in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 74, pp. 3362-3367, 2003.   DOI   ScienceOn
37 Reitsma, M.G., Gates, R.S., Friedman, L.H., and Cook, R.F., "Prototype Cantilevers for Quantitative Lateral Force Microscopy," Rev. Sci. Instrum., Vol. 82, pp. 093706, 2011.   DOI
38 Chung, K.-H., Pratt, J.R., and Reitsma, M. G., "Lateral Force Calibration: Accurate Procedures for Colloidal Probe Friction Measurements in Atomic Force Microscopy," Langmuir, Vol. 26, pp. 1368-1394, 2010.