• Title/Summary/Keyword: AFM(Atomic Force Microscope)

검색결과 530건 처리시간 0.031초

Nature of Surface and Bulk Defects Induced by Epitaxial Growth in Epitaxial Layer Transfer Wafers

  • Kim, Suk-Goo;Park, Jea-Gun;Paik, Un-Gyu
    • Transactions on Electrical and Electronic Materials
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    • 제5권4호
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    • pp.143-147
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    • 2004
  • Surface defects and bulk defects on SOI wafers are studied. Two new metrologies have been proposed to characterize surface and bulk defects in epitaxial layer transfer (ELTRAN) wafers. They included the following: i) laser scattering particle counter and coordinated atomic force microscopy (AFM) and Cu-decoration for defect isolation and ii) cross-sectional transmission electron microscope (TEM) foil preparation using focused ion beam (FIB) and TEM investigation for defect morphology observation. The size of defect is 7.29 urn by AFM analysis, the density of defect is 0.36 /cm$^2$ at as-direct surface oxide defect (DSOD), 2.52 /cm$^2$ at ox-DSOD. A hole was formed locally without either the silicon or the buried oxide layer (Square Defect) in surface defect. Most of surface defects in ELTRAN wafers originate from particle on the porous silicon.

p-Nitroazobenzene을 함유한 Polyamic Acid 단분자층의 Langmuir-Blodgett 막에 관한 연구 (A Study on the Langmuir-Blodgett Films of Polyamic Acid Monolayer Containing p-Nitroazobenzene)

  • 박근호
    • 한국응용과학기술학회지
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    • 제28권2호
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    • pp.213-218
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    • 2011
  • Displacement current measuring technique has been applied on the study of polyamic acid monolayer containing p-nitroazobenzene. The displacement current was generated from monolayer on the water surface by monolayer compression and expansion. Maxwell displacement current(MDC) was generated when the area per molecule was about $200{\AA}^2$ and $70{\AA}^2$. Maxwell displacement currents were investigated in connection with monolayer compression cycles. It was found that the maximum of MDC appeared at the molecular area just before the initial rise of surface pressure in compression cycles. The monolayer surface morphology of the LB film have been measured by Atomic Force Microscope(AFM). As a result, we confirmed that the microscopic properties of LB film by AFM showed the good orientation of monolayer molecules and the thickness of monolayer was 3.5-4.1nm.

구형 및 평면 원자현미경 탐침에 대한 2차원 소재의 마찰 특성 (Frictional Properties of Two-dimensional Materials against Spherical and Flat AFM Tips)

  • ;정구현
    • Tribology and Lubricants
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    • 제35권4호
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    • pp.199-205
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    • 2019
  • Two-dimensional materials such as graphene, h-BN, and $MoS_2$ have attracted increased interest as solid lubricant and protective coating layer for nanoscale devices owing to their superior mechanical properties and low friction characteristics. In this work, the frictional properties of single-layer graphene, h-BN, and $MoS_2$ are experimentally investigated under various normal forces using atomic force microscope (AFM) tips with a spherical and flat end, with the aim to gain a better understanding of frictional behaviors. The nonlinear relationship between friction and normal force friction was clearly observed for single-layer graphene, h-BN, $MoS_2$ specimens slid against the spherical and flat AFM tips. The results also indicate that single-layer graphene, h-BN, $MoS_2$ exhibit low frictional properties (e.g., friction coefficient below 0.1 under 70~100 nN normal force). In particular, graphene is found to be superior to h-BN and $MoS_2$ in terms of frictional properties. However, the friction of single-layer graphene, h-BN, $MoS_2$ against the flat tip is larger than that against the spherical tip, which may be attributed to the relatively large adhesion. Furthermore, it is shown that the fluctuation of friction is more significant for the flat tip than the spherical tip. The resutls of this study may be helpful to elucidate the feasibility of using two-dimensional materials as solid lubricant and protective coating layer for nanoscale devices.

박막트랜지스터 구동회로용 ZnO 박막의 구조적 특성에 관한 연구 (The structural characteristics of ZnO thin films for TFT driver circuit)

  • 손지훈;김상현;김홍승;장낙원
    • Journal of Advanced Marine Engineering and Technology
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    • 제37권1호
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    • pp.72-77
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    • 2013
  • RF 마그네트론 스퍼터링법의 스퍼터링 조건에 따른 TFT 구동회로를 위한 ZnO 박막의 구조적 특성에 관해 연구하였다. ZnO 박막은 RF 파워 및 증착압력을 변화시킴으로서 성장시켰다. 구조적 특성은 X-선 회절 분석기(XRD)와 원자력간 현미경(AFM)에 의해 분석되었다. ZnO 박막은 100W의 RF 파워에서 충분한 결정도를 가졌다. 그러나 RF 파워가 증가함에 따라 ZnO 박막의 표면 거칠기가 증가하였고 증착압력이 5mTorr에서 15mTorr로 증가함에 따라 ZnO(002) 피크의 반치폭(FWHM)이 증가하였다.

나노/마이크로 프로브 기술을 통한 틱소/레오 캐스트의 시효경화 특성 조사 (Investigation on Age-hardening characteristic of thixo and rheocast by using Nano/Micro-probe Technology)

  • 조상현;이창수;강충길
    • 한국소성가공학회:학술대회논문집
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    • 한국소성가공학회 2006년도 춘계학술대회 논문집
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    • pp.322-325
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    • 2006
  • The nano/microstructure and mechanical properties of the eutectic regions in thixo and rheo cast A356 alloy parts were investigated using nano/micro-indentation and mechanical scratching, combined with optical microscopy and atomic force microscope (AFM).Most eutectic Si crystals in the A356 alloy showed a modified morphology as fine-fibers, however Si particles of network in eutectic region was formed quickly with aging time increase in thixo-cast. The aging responses of the eutectic regions in both the thixo and rheo cast A356 alloys aged at $150^{\circ}C$ for different times (0, 2, 4, 8, 10, 16, 24, 36, and 72 h) were investigated. Both Vickers hardness ($H_V$) and indentation ($H_{IT}$) test results showed almost the same trend of aging curves, the peak was obtained at the same aging time of 10 h.

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XPS를 이용한 TiN/Cu의 Grain boundary diffusion 연구 (The study of Grain boundary diffusion effect in Tin/Cu by Xps)

  • 임관용;이연승;정용덕;이경민;황정남;최범식;원정연;강희재
    • 한국진공학회지
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    • 제7권2호
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    • pp.112-117
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    • 1998
  • TiN을 Cu의 확산방지막으로 사용하기 위해 많은 연구가 되어왔는데, 이 연구에서는 특히 X-ray photoelectron spectroscopy(XPS)를 이용하여 TiN박막에서의 Cu의 확산현상을 연구하였다. TiN박막은 일반적으로 columnar grain을 형성하면서 성장을 하는데, 녹는점의 1/3에 해당하는 비교적 낮은 온도에서는 grain들의 경계를 따라 Cu가 확산함을 확인하였다. Atomic force microscopy(AFM)를 이용하여 grain의 모양을 관찰하였고, 이 grain boundary 를 통한 확산 현상을 연구하기 위하여, modified surface accumulation method를 이용하였 다. 연구 결과, TiN박막에서의 Cu의 grain boundary diffusion의 활성화 에너지 $Q_b$는 0.23 eV, Diffusivity $D_{bo}$$5.5\times10^{-12{\textrm{cm}^2$/sec의 값을 얻었다.

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아르곤 저온 플라즈마 처리에 의한 CTA 필름의 접착성 연구 (A Study on Adhesive Properties of Cellulose Triacetate Film by Argon Low Temperature Plasma Treatment)

  • 구강;박영미
    • 한국염색가공학회지
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    • 제16권5호
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    • pp.28-34
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    • 2004
  • The polarizing film application exploits the unique physicochemical properties between PVA(Poly vinyl alcohol) film and CTA(Cellulose triacetate) film. However, hardly any research was aimed at improving the adhesion characteristics of the CTA film by radio frequency(RF) plasma treatment at argon(Ar) gaseous state. In this report, we deal with surface treatment technology for protective CTA film developed specifically for high adhesion applications. After Ar plasma, surface of the films is analyzed by atomic force microscopy(AFM), roughness parameter and peel strength. Furthermore, the wetting properties of the CTA film were studied by contact angle analysis. Results obtained for CTA films treated with a glow discharge showed that this technique is sensitive to newly created physical functions. The roughness and peel strength value increased with an increase in treatment time for initial treatment, but showed decreasing trend for continuous treatment time. The result of contact angle measurement refer that the hydrophilicity of surface was increased. AFM studies indicated that no considerable change of surface morphology occurred up to 3 minutes of treatment time, but a considerable uneven of surface structure resulted from treating time after 5 minutes.

나노스크래치와 HF 식각을 병용한 보로실리케이트 요/철형 구조체 패턴 제작 기술 (Fabrication Technique of Nano/Micro Pattern with Concave and Convex Structures on the Borosilicate Surface by Using Nanoscratch and HF etching)

  • 윤성원;강충길
    • 한국정밀공학회지
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    • 제21권4호
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    • pp.24-31
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    • 2004
  • The objective of this work is to suggest a mastless pattern fabrication technique using the combination of machining by Nanoindenter(equation omitted) XP and HF wet etching. Sample line patterns were machined on a borosilicate surface by constant load scratch (CLS) of the Nanoindenter(equation omitted) XP with a Berkovich diamond tip, and they were etched in HF solution to investigate chemical characteristics of the machined borosilicate surface. All morphological data of scratch traces were scanned using atomic force microscope (AFM).

나노튜브 탐침을 이용한 미세 광소자 측정 개선 (Nanotube-tip AFM for the application of photonic devices)

  • 정기영;송원영;오범환;박병천
    • 한국광학회:학술대회논문집
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    • 한국광학회 2003년도 하계학술발표회
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    • pp.302-303
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    • 2003
  • 원자간력-현미경(Atomic Force Microscope)은 비파괴적인 방법으로 광소자의 단면 형상과 거칠기에 관한 정보를 원자단위의 해상도로 얻어낼 수 있다. 그러나 탐침의 형상에 의해서 공간분해능에 제한을 받는다. 이 문제를 해결하기 위해, 원자간력-현미경 탐침의 끝부분에 나노튜브를 부착하였다. 주사형 전자현미경에 설치한 나노조작기를 사용하여 나노튜브를 탐침에 밀착하도록 이동시킨 후에, 탄화물 증착으로 접착시키는 방법을 사용하였다.

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