• Title/Summary/Keyword: 플라스틱 볼 그리드 어레이

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A Study on Thermal Stress Analysis of Plastic-Core Solder Balls (플라스틱 핵 솔더볼의 열응력 해석에 관한 연구)

  • Kim, H.D.;Yoon, D.Y.
    • Transactions of the Korean Society of Machine Tool Engineers
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    • v.16 no.6
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    • pp.159-162
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    • 2007
  • Recently, Pb-free solder ball technology, which is getting more significant in miniaturization of electronic equipment, and resolution of recent environmental problems, is necessary to be developed. A plastic-core solder ball is much promising in those considerations. Plastic-core solder balls have the tendency to replace the usual metal-core solder ball from low material cost and superior mechanical properties. The thermal effects, however, are important in manufacturing process, such as deposing micro-sized metal thin film on the spherical polymer surface. Furthermore plastic-core solder balls are easy to be broken due to CTE and elastic coefficient of material property from heat transfer. We propose technical computational investigations for the manufacturing design and the reliability of plastic-core solder ball from thermal stress analysis.

PBGA Packaging Reliability under Satellite Random Vibration (인공위성 임의진동에서의 PBGA 패키징 신뢰성)

  • Lee, Seok-min;Hwang, Do-soon;Kim, Sun Won;Kim, Yeong Kook
    • Journal of the Korean Society for Aeronautical & Space Sciences
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    • v.46 no.10
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    • pp.876-882
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    • 2018
  • The purpose of this research is to verify the feasibility of Plastic Ball Grid Array (PBGA), one of the most popular chip packaging types for commercial electronics, under strong random vibration occurred in satellite during launch. Experiment were performed by preparing daisy chained PCB specimen, where large size PBGA were surface mounted, and the PCB was fixed to an aluminum frame which is commonly used to install the electronics parts to satellite. Then the entire sample was fixed to vibration tester. The random vibration power spectrum density employed in the tests were composed of two steps, the acceptance level of 22.7 Grms, and qualification level of 32.1 Grms with given period of time. The test results showed no solder cracks, which provided the strong structural integrity and feasibility evidences of the PBGA packaging to aerospace electronics. Numerical analyses were also performed to calculate the solder stresses and analyze their development mechanism.