• Proceedings of the Korea Information Processing Society Conference
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• 2015.04a
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• pp.795-797
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• 2015

태양광발전의 단점 중 하나인 불규칙 전력 생산문제로 인해, 장비 및 패널 결함에 실시간 대응하지 못하는 문제가 발생한다. 태양광패널 결함을 자동 검출하기 위해 기후데이터 및 패널 정보를 이용하여 신경망에 적용하고 역전과 알고리즘을 통해 학습하는 발전량 예측 및 실시간 결함 검출 모델을 제안한다.

• Journal of the Korean Society for Nondestructive Testing
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• v.36 no.6
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• pp.451-459
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• 2016

Crack detection on panels during manufacturing process is an important step for ensuring the product quality. The accuracy and efficiency of traditional crack detection methods, which are performed by eye inspection, are dependent on human inspectors. Therefore, implementation of an on-line and precise crack detection is required during the panel pressing process. In this paper, a regular CCTV camera system is utilized to obtain images of panel products and an image process based crack detection technique is developed. This technique uses a comparison between the base image and a test image using an amplitude mapping of the local image. Experiments are performed in the laboratory and in the actual manufacturing lines to evaluate the performance of the developed technique. Experimental results indicate that the proposed technique could be used to effectively detect a crack on panels with high speed.

• KIPS Transactions on Computer and Communication Systems
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• v.5 no.10
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• pp.353-360
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• 2016

Recently, solar photovoltaic(PV) power generation which generates electrical power from solar panels composed of multiple solar cells, showed the most prominent growth in the renewable energy sector worldwide. However, in spite of increased demand and need for a photovoltaic power generation, it is difficult to early detect defects of solar panels and equipments due to wide and irregular distribution of power generation. In this paper, we choose an optimal machine learning algorithm for estimating the generation amount of solar power by considering several panel information and climate information and develop a defect detection system by using the chosen algorithm generation. Also we apply the algorithm to a domestic solar photovoltaic power plant as a case study.

• Journal of the Korean Society for Industrial and Applied Mathematics
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• v.10 no.1
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• pp.47-60
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• 2006

Due to the uneven illumination of FPD panel surface, it is difficult to detect the defects. The paper proposes a method to find the uneven illumination compensation using wavelets, which are done based on multi-resolution structure. The first step is to decompose the image into multi-resolution levels. Second, elimination of lowest smooth sub-image with highest frequency band removes the high frequency noise and low varying illumination. In particular, the main algorithm was implemented by lifting scheme for realtime inline process.

• Journal of Korea Multimedia Society
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• v.10 no.10
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• pp.1271-1283
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• 2007

To detect defect of FPD(flat panel displays) is very difficult due to uneven illumination on FPD panel image. This paper presents a method to detect various types of defects using the approximated image of the uneven illumination by B-spline. To construct a approximated surface, corresponding to uneven illumination background intensity, while reducing random noises and small defect signal, only the lowest smooth subband is used by wavelet decomposition, resulting in reducing the computation time of taking B-spline approximation and enhancing detection accuracy. The approximated image in lowest LL subband is expanded as the same size as original one by wavelet reconstruction, and the difference between original image and reconstructed one becomes a flat image of compensating the uneven illumination background. A simple binary thresholding is then used to separate the defective regions from the subtracted image. Finally, blob analysis as post-processing is carried out to get rid of false defects. For applying in-line system, the wavelet transform by lifting based fast algorithm is implemented to deal with a huge size data such as film and the processing time is highly reduced.

• Journal of the Korea Computer Graphics Society
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• v.29 no.3
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• pp.79-84
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• 2023

Image generation models have been applied in various fields to overcome data sparsity, time and cost issues. However, it has limitations in generating images from regular pattern images and detecting defects in such data. In this paper, we verified the feasibility of the image generation model to generate pattern images and applied it to data augmentation for defect detection of OLED panels. The data required to train an OLED defect detection model is difficult to obtain due to the high cost of OLED panels. Therefore, even if the data set is obtained, it is necessary to define and classify various defect types. This paper introduces an OLED panel defect data acquisition system that acquires a hypothetical data set and augments the data with an image generation model. In addition, the difficulty of generating pattern images in the diffusion model is identified and a possibility is proposed, and the limitations of data augmentation and defect detection data augmentation using the image generation model are improved.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.4
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• pp.123-130
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• 2014

In TFT-LCD panel images, defects are typically detected by using a large difference in the brightness compared to the background. In this paper, we propose a sequential defect detection algorithm according to defect possibility caused by difference of brightness. By using this method, pixels with high defect probabilities are preferentially detected and defects with a large brightness difference are accurately detected. Also, limited defects with a small brightness difference is detected more reliably, eventually minimizing the degree of over-detection. We have experimentally confirmed that our proposed method showed an excellent detection result for detecting limited defects as well as defects with a large brightness difference.

• Journal of Broadcast Engineering
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• v.18 no.4
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• pp.525-534
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• 2013

Recently, mura defect inspection techniques are receiving attention in LCD production procedure since demands of TFT-LCD are growing. In this paper, we propose an automatic mura defect inspection method using gabor wavelet transform and DCT. First, we generate a reference panel image using DCT based method. For original panel image and generated reference panel image, we apply a gabor wavelet transform to eliminate texture information in images. Then, we extract mura defect regions from the difference image between gabor wavelet transform image of original panel and generated reference panel image. Finally, all mura defect regions are quantified to detect accurate mura defects. Experimental results show that our method is more accurate and efficient than previous methods.

• Journal of Korea Multimedia Society
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• v.15 no.4
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• pp.439-448
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• 2012

TFT-LCD panel images have non-uniform brightness, noise signal and defect signal. It is hard to divide defect signal because of non-uniform brightness and noise signal, so various divide methods have being developed. In this paper, we suggest method to divide defective regions on TFT-LCD panel image by estimating a menas of two different size of windows, which is suggested by Eikvil et al., and using difference of them. But in this method, the size of detectable defects is restricted by the size of window, hence it has inefficient problem that the size of window have to increase to divide a large defect region. To solve this problem we suggest an algorithm which can divide various size of defects, by using Multi-scale and restrict a detectable size of defects in each scale. To prove an efficiency of suggested algorithm, we show that resulting images of real TFT-LCD panel images and an artificial image with various defects.

• 전자공학회논문지 IE
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• v.48 no.2
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• pp.26-31
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• 2011

In this paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. From some experiments results, the proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.5 respectively. Accordingly, in this paper, a possibility of practical implementation of the LCD defect inspection system is finally suggested.