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http://dx.doi.org/10.9717/kmms.2012.15.4.439

TFT-LCD Defect Detection Using Mean Difference Between Local Regions Based on Multi-scale Image Reconstruction  

Jung, Chang-Do (타이코일렉트로닉스 연구소)
Lee, Seung-Min (경북대학교 수학과)
Yun, Byoung-Ju (경북대학교 전자전기컴퓨터학부)
Lee, Joon-Jae (계명대학교 게임모바일콘텐츠학과)
Choi, Il (경북대학교 기계연구소)
Park, Kil-Houm (경북대학교 전자공학과)
Publication Information
Journal of Korea Multimedia Society / v.15, no.4, 2012 , pp. 439-448 More about this Journal
Abstract
TFT-LCD panel images have non-uniform brightness, noise signal and defect signal. It is hard to divide defect signal because of non-uniform brightness and noise signal, so various divide methods have being developed. In this paper, we suggest method to divide defective regions on TFT-LCD panel image by estimating a menas of two different size of windows, which is suggested by Eikvil et al., and using difference of them. But in this method, the size of detectable defects is restricted by the size of window, hence it has inefficient problem that the size of window have to increase to divide a large defect region. To solve this problem we suggest an algorithm which can divide various size of defects, by using Multi-scale and restrict a detectable size of defects in each scale. To prove an efficiency of suggested algorithm, we show that resulting images of real TFT-LCD panel images and an artificial image with various defects.
Keywords
Segmentation; Multi-scale; Inspection; TFT-LCD;
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Times Cited By KSCI : 1  (Citation Analysis)
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