Implementation of Automatic measurement system for a Change of channel etching thickness with a HTS Transistor (고온 초전도 트랜지스터의 채널 식각 두께에 따른 임계 특성 자동 측정장치 구축)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2003.07a
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- pp.561-564
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- 2003