Analysis of sub-20nm MOSFET Current-Voltage characteristic curve by oxide thickness (산화막 두께에 따른 20nm 이하 MOSFET의 전류-전압 특성 곡선 분석)
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- Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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- 2009.10a
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- pp.917-919
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- 2009