• Title/Summary/Keyword: 응력 초격자

Search Result 12, Processing Time 0.026 seconds

Dielectric properties of PTO/PZO superlattices prepared by RF Magnetron Sputterring (RF Magnetron Sputtering으로 증착된 PTO/PZO 초격자 박막의 유전 특성)

  • 한현자;이병수
    • Proceedings of the Materials Research Society of Korea Conference
    • /
    • 2003.03a
    • /
    • pp.38-38
    • /
    • 2003
  • PTO/PZO 초격자 박막은 박막 계면에 응력이 발생하여 기존의 박막처럼 size effect가 적용되지 않고 두께가 감소해도 높은 유전상수를 갖는다. Antiferroelectric PbZrO$_3$(PZO)와 ferroelectric PbTiO$_3$(PTO)를 적층 성장시킨 초격자는 400도에서 성장한 (100) Pt/SiO$_2$기판 위에 rf magnetron sputtering으로 증착하였다. PTO/PZO의 증착 주기는 30(PTO $_{4unti cells}$/PZO $_{4unti cells}$) 에서 1(PTO $_{125unti cells}$/PZO $_{125unti cells}$)까지 두께의 변화를 주어 준비했고 초격자 박막의 전체두께는 100nm로 고정시켰다. XRD결과, PTO/PZO는 주기에 따라 초격자의 특성인 main peak과 satellite peak을 관찰 할 수 있었다. 초격자의 주기가 감소함에 따라 2$\theta$값이 증가하고 평균 d 값이 감소되면서 PTO층에 뒤틀림이 증가하였다. PTO층의 뒤틀림 증가로 인해 superlattice의 주기가 증가함에 따라 초격자의 유전율이 증가하였고 강유전성이 향상되었다.향상되었다.

  • PDF

Thickness dependent dielectric properties of $BaTiO_3$/Sr$TiO_3$ Nano-structured artificial lattices (나노 구조로 된 $BaTiO_3$/Sr$TiO_3$ 산화물 인공격자의 두께 의존적인 유전특성)

  • 김주호;김이준;정동근;김인우;제정호;이재찬
    • Proceedings of the Materials Research Society of Korea Conference
    • /
    • 2003.11a
    • /
    • pp.56-56
    • /
    • 2003
  • BaTiO$_3$, SrTiO$_3$단일막과 BaTiO$_3$ (BTO)/SrTiO$_3$ (STO) 산화물 인공격자를 pulsed laser deposition (PLD) 법에 의해서 100 nm 두께의 (La,Sr)CoO3 (LSCO) 산화물 전극이 코핑된 MgO 단결정 기판 위에 증착시켰다. 이러한 기판위에서 2 unit cell의 적층 두께를 갖는 BTO/STO 초격자 (=BTO2/STO2)를 100~5 nm까지 변화시켰다. 또한 BTO와 STO 단일막도 같은 두께로 변화시켰다. 이러한 두께 범위에서 BTO, STO 단일막과 초격자의 격자변형에 따른 유전특성을 살펴 보았다. 두께 변화에 따른 단일막과 초격자의 구조 분석은 포항 방사광 가속기의 x-ray 회절에 의해서 이루어졌다. 다양한 두께를 갖는 BTO2/STO2 초격자에서 BTO와 STO 충은 in-plane 방향으로 격자정합을 유지하면서 변형되었다. 두께가 얇아지면서 하부 LSCO영향으로 BTO, STO의 n-plane 격자상수는 LSCO 격자상수 쪽으로 접근하였다. Out-of-plane 방향의 BTO 격자상수는 두께가 얇아지면서 증가하였고 반면에 STO 격자상수는 감소하였다. STO와 BTO 단일막의 격자변형은 두께가 얇아지면서 in-plane 방향으로 압축응력으로 인해 증가하였다. 그러나, 격자부정합도가 큰 BTO격자에서 더 많이 변형되었다. 또한 초격자에서 BTO격자가 BTO 단일막보다 더 많이 변형되었는데 초격자에서는 BTO, STO 두 층의 발달된 변형뿐만 아니라 하부 LSCO/MgO 기판의 영향을 함께 받고 있기 때문이다. 초격자와 단일막의 유전상수를 살펴보면은 두께가 감소하면서 유전상수가 감소하는 size effect을 보이고 있다. 하지만 초격자에서의 유전상수가 단일막보다 우수한 유전특성을 보이고 있다. 이러한 결과로 볼 때 격자변형이 size effect 영향을 끼치는 중요한 요소임을 확인하였다.

  • PDF

Study on Growth Optimization of InAs/GaSb Strained-Layer Superlattice Structures by High-Resolution XRD Analysis (고분해능 XRD 분석에 의한 InAs/GaSb 응력초격자 구조의 성장 최적화 연구)

  • Kim, J.O.;Shin, H.W.;Choe, J.W.;Lee, S.J.;Kim, C.S.;Noh, S.K.
    • Journal of the Korean Vacuum Society
    • /
    • v.18 no.4
    • /
    • pp.245-253
    • /
    • 2009
  • For the growth optimization of InAs/GaSb (8/8-ML) strained-layer superlattice (SLS), the structure has been grown under various conditions and modes and characterized by the high-resolution x-ray diffraction (XRD) analysis. In this study, the strain modulation is induced by changing parameters and modes, such as the growth temperature, the ratio of V/III beam-equivalent-pressure (BEP), and the growth interruption (GI), and the strain variation is analyzed by measuring the angle separation of 0th-order satellite peak in XRD patterns. The XRD results reveal that the growth temperature and the V/III(Sb/Ga) ratio are major parameters to change the crystallineity and the strain modulation in SLS structures, respectively. We have observed that the SLS samples with compressive strain prepared in this study are show a transition to tensile strain with decreasing V/III(Sb/Ga) ratio, and the GI process is a sensitive factor giving rise to strain modulation. These results obtained in this study suggest that optimized growth temperature and V/III(Sb/Ga) ratio are $350^{\circ}C$ and 20, respectively, and the appropriate GI time is approximately 3 seconds just before InAs growth that the crystallineity is maximized and the strain relaxation is minimized.

Fabrication and Device Characteristics of Infrared Photodetector Based on InAs/GaSb Strained-Layer Superlattice (InAs/GaSb 응력초격자를 이용한 적외선검출소자의 제작 및 특성 연구)

  • Kim, J.O.;Shin, H.W.;Choe, J.W.;Lee, S.J.;Kim, C.S.;Noh, S.K.
    • Journal of the Korean Vacuum Society
    • /
    • v.18 no.2
    • /
    • pp.108-115
    • /
    • 2009
  • The superlattice infrared photodetector (SLIP) with an active layer of 8/8-ML InAs/GaSb type-II strained-layer superlattice (SLS) of 150 periods was grown by MBE technique, and the proto-type discrete device was defined with an aperture of $200-{\mu}m$ diameter. The contrast profile of the transmission electron microscope (TEM) image and the satellite peak in the x-ray diffraction (XRD) rocking curve show that the SLS active layer keeps abrupt interfaces with a uniform thickness and a periodic strain. The wavelength and the bias-voltage dependences of responsivity (R) and detectivity ($D^*$) measured by a blackbody radiation source give that the cutoff wavelength is ${\sim}5{\mu}m$, and the maximum Rand $D^*$ ($\lambda=3.25{\mu}m$) are ${\sim}10^3mA/W$ (-0.6 V/13 K) and ${\sim}10^9cm.Hz^{1/2}/W$ (0 V/13 K), respectively. The activation energy of 275 meV analyzed from the temperature dependent responsivity is in good agreement with the energy difference between two SLS subblevels of conduction and valence bands (HH1-C) involving in the photoresponse process.

nBn Based InAs/GaSb Type II Superlattice Detectors with an N-type Barrier Doping for the Long Wave Infrared Detection (InAs/GaSb 제2형 응력 초격자 nBn 장적외선 검출소자 설계, 제작 및 특성평가)

  • Kim, Ha Sul;Lee, Hun;Klein, Brianna;Gautam, Nutan;Plis, Elena A.;Myers, Stephen;Krishna, Sanjay
    • Journal of the Korean Vacuum Society
    • /
    • v.22 no.6
    • /
    • pp.327-334
    • /
    • 2013
  • Long-wave infrared detectors using the type-II InAs/GaSb strained superlattice (T2SL) material system with the nBn structure were designed and fabricated. The band gap energy of the T2SL material was calculated as a function of the thickness of the InAs and GaSb layers by the Kronig-Penney model. Growth of the barrier material ($Al_{0.2}Ga_{0.8}Sb$) incorporated Te doping to reduce the dark current. The full width at half maximum (FWHM) of the $1^{st}$ satellite superlattice peak from the X-ray diffraction was around 45 arcsec. The cutoff wavelength of the fabricated device was ${\sim}10.2{\mu}m$ (0.12 eV) at 80 K while under an applied bias of -1.4 V. The measured activation energy of the device was ~0.128 eV. The dark current density was shown to be $1.0{\times}10^{-2}A/cm^2$ at 80 K and with a bias -1.5 V. The responsivity was 0.58 A/W at $7.5{\mu}m$ at 80 K and with a bias of -1.5 V.

Effects of Interface Soaking on Strain Modulation in InAs/GaSb Strained-Layer Superlattices (계면 흡착에 의한 InAs/GaSb 초격자의 응력변조 효과)

  • Shin, H.W.;Choe, J.W.;Kim, J.O.;Lee, S.J.;Kim, C.S.;Noh, S.K.
    • Journal of the Korean Vacuum Society
    • /
    • v.20 no.1
    • /
    • pp.35-41
    • /
    • 2011
  • In this study, the interface soaking effect in InAs/GaAs strained-layer superlattice (SLS) on crystalline phase modulation has been analyzed by the x-ray diffraction (XRD) curve. The strain variation induced by As and/or Sb soaking was determined by the separation angle between the substrate peak and the 0th-order superlattice satellite peak in the XRD spectra. Contrated that the As/InAs soaking arises minor GaAs-like interfacial layer, the Sb/GaSb soaking induces InSb-like one. The Fourier-transformed curves of the Pendellosung interference oscillation shows that the optimum soaking times of As/InAs and Sb/GaSb are 2 sec and 12 sec, at which the highest crystallineity has, respectively. An anomalous twin-peak phenomenon that a satellite peak splits into two peaks was observed in the SLS structure co-soaked by As and Sb at InAs${\rightarrow}$GaSb interfaces. We suggest that it may be resulted from coexistence of two kinds crystalline phases of InAsSb and GaAsSb due to intermixing of In${\leftrightarrow}$Ga and Sb${\leftrightarrow}$As.

Fabrication of [320×256]-FPA Infrared Thermographic Module Based on [InAs/GaSb] Strained-Layer Superlattice ([InAs/GaSb] 응력 초격자에 기초한 [320×256]-FPA 적외선 열영상 모듈 제작)

  • Lee, S.J.;Noh, S.K.;Bae, S.H.;Jung, H.
    • Journal of the Korean Vacuum Society
    • /
    • v.20 no.1
    • /
    • pp.22-29
    • /
    • 2011
  • An infrared thermographic imaging module of [$320{\times}256$] focal-plane array (FPA) based on [InAs/GaSb] strained-layer superlattice (SLS) was fabricated, and its images were demonstrated. The p-i-n device consisted of an active layer (i) of 300-period [13/7]-ML [InAs/GaSb]-SLS and a pair of p/n-electrodes of (60/115)-period [InAs:(Be/Si)/GaSb]-SLS. FTIR photoresponse spectra taken from a test device revealed that the peak wavelength (${\lambda}_p$) and the cutoff wavelength (${\lambda}_{co}$) were approximately $3.1/2.7{\mu}m$ and $3.8{\mu}m$, respectively, and it was confirmed that the device was operated up to a temperature of 180 K. The $30/24-{\mu}m$ design rule was applied to single pixel pitch/mesa, and a standard photolithography was introduced for [$320{\times}256$]-FPA fabrication. An FPA-ROIC thermographic module was accomplished by using a $18/10-{\mu}m$ In-bump/UBM process and a flip-chip bonding technique, and the thermographic image was demonstrated by utilizing a mid-infrared camera and an image processor.

Zinc Diffusion in InGaAs grown by MOCVD (MOCVD법으로 성장시킨 InGaAs 내에서 Zinc의 확산특성)

  • Yang, Seung-Yeol;Si, Sang-Gi;Kim, Seong-Jun;Park, In-Sik;Yu, Ji-Beom
    • Korean Journal of Materials Research
    • /
    • v.6 no.5
    • /
    • pp.483-488
    • /
    • 1996
  • InP 기판위에 InP와 격자정합된 undoped-InGaAs에서 zine의 확산 특성을 Electrochemical Capacitance-Voltage 법(polaron)과 Secondary Ion Mass Spectrometry(SIMS)로 조사하였다. Metallorganic Chemical Vapor Deposition (MOCVD)를 이용하여 undoped-InGaAs 층을 성장시켰으며 확산방법으로는 Zn3P2 확산원 박막과 Rapid Thermal Annealing (RTA)를 이용하였다. 450-55$0^{\circ}C$온도범위에서 30-300초 동안 확산을 수행한 결과 zinc의 확산계수는 D=Doexp(-$\Delta$E/kT)의 특성을 만족하였으며, Do와 $\Delta$E는 각각 1.3x105$\textrm{cm}^2$/sec와 2.3eV였다. 얻어진 확산계수는 다른 확산방법을 이용한 값들에 비해 매우 큰 값인데, 이것은 RTA 처리시 빠른 온도 증가에 의한 확산원 박막, 보호막, 그리고 InGaAs 에피층이 가지는 열팽창계수의 차이로인한 응력의 효과에 의한 것으로 생각되며, 이를 sealed-ampoule 법을 사용한 경우의 확산특성과 비교를 통하여 확인할 수 있었다.

  • PDF

Analysis of Characteristics of Seismic Source and Response Spectrum of Ground Motions from Recent Earthquake near the Backryoung Island (최근 백령도해역 발생지진의 지진원 및 응답스펙트럼 특성 분석)

  • Kim, Jun-Kyoung
    • Geophysics and Geophysical Exploration
    • /
    • v.14 no.4
    • /
    • pp.274-281
    • /
    • 2011
  • We analysed ground motions form Mw 4.3 earthquake around Backryoung Island for the seismic source focal mechanism and horizontal response spectrum. Focal mechanism of the Backryoung Islands area was compared to existing principal stress orientation of the Korean Peninsula and horizontal response spectrum was also compared to those of the US NRC Regulatory Guide (1.60) and the Korean National Building Code. The ground motions of 3 stations, including vertical, radial, and tangential components for each station, were used for grid search method of moment tensor seismic source. The principal stress orientation from this study, ENE-WSW, is consistent fairly well with that of the Korean Peninsula. The horizontal response spectrum using 30 observed ground motions analysed and then were compared to both the seismic design response spectra (Reg Guide 1.60), applied to the domestic nuclear power plants, and the Korean Standard Design Response Spectrum for general structures and buildings (1997). Response spectrum of 30 horizontal ground motions were used for normalization with respect to the peak acceleration value of each ground motion. The results showed that the horizontal response spectrum revealed higher values for frequency bands above 3 Hz than Reg. Guide (1.60). The results were also compared to the Korean Standard Response Spectrum for the 3 different soil types and showed that the vertical response spectra revealed higher values for the frequency bands below 0.8 second than the Korean Standard Response Spectrum (SD soil condition). However, through the qualitative improvements and quantitative enhancement of the observed ground motions, the conservation of horizontal seismic design response spectrum should be considered more significantly for the higher frequency bands.