• Journal of the Korean Crystal Growth and Crystal Technology
• /
• v.8 no.3
• /
• pp.411-418
• /
• 1998

The thickness dependence of stress electric filed oxide currents has been measured in oxides with thicknesses between 10 nm and 80 nm. The oxide currents were shown to be composed of stress current and transient current. The stress current was composed of stress induced leakage current and dc current. The stress current was caused by trap assisted tunneling through the oxide. The transient current was caused by the tunneling charging and discharging of the trap in the interfaces. The stress current was used to estimate to the limitations on oxide thicknesses. The transient current was used to the data retention in memory devices.

• Journal of the Institute of Electronics Engineers of Korea TE
• /
• v.39 no.4
• /
• pp.335-340
• /
• 2002

In this paper, the stress induced leakage currents of thin silicon oxides is investigated in the ULSI implementation with nano structure transistors. The stress and transient currents associated with the on and off time of applied voltage were used to measure the distribution of high voltage stress induced traps in thin silicon oxide films. The stress and transient currents were due to the charging and discharging of traps generated by high stress voltage in the silicon oxides. The transient current was caused by the tunnel charging and discharging of the stress generated traps nearby two interfaces. The stress induced leakage current will affect data retention in electrically erasable programmable read only memories. The oxide current for the thickness dependence of stress current, transient current, and stress induced leakage currents has been measured in oxides with thicknesses between 113.4${\AA}$ and 814${\AA}$, which have the gate area $10^3cm^2$. The stress induced leakage currents will affect data retention and the stress current, transient current is used to estimate to fundamental limitations on oxide thicknesses.

• Journal of the Institute of Electronics and Information Engineers
• /
• v.50 no.8
• /
• pp.285-291
• /
• 2013

In this paper, MOS-Capacitor and MOSFET devices with a Low Level Leakage Current of oxide thickness, channel width and length respectively were to investigate the reliability characterizations mechanism of ultra thin gate oxide films. These stress induced leakage current means leakage current caused by stress voltage. The low level leakage current in stress and transient current of thin silicon oxide films during and after low voltage has been studied from strss bias condition respectively. The stress channel currents through an oxide measured during application of constant gate voltage and the transient channel currents through the oxide measured after application of constant gate voltage. The study have been the determination of the physical processes taking place in the oxides during the low level leakage current in stress and transient current by stress bias and the use of the knowledge of the physical processes for driving operation reliability.

• Proceedings of the Korean Institute of Surface Engineering Conference
• /
• 2018.06a
• /
• pp.29.1-29.1
• /
• 2018

양극산화 표면처리 방법의 일종인 플라즈마 전해산화(PEO, Plasma electrolytic oxidation)는 금속 소재에 양극 전압을 인가하여 고경도의 산화 피막을 금속 표면에 형성시키는 표면처리 기술이다. PEO 공정은 피막의 국부적 유전체 파괴에 의한 아크의 발생을 동반하며, 형성된 산화 피막이 아크 발생에 의한 높은 열에 의해 결정화 되어 일반적인 양극산화 피막보다 우수한 경도와 내마모성을 가진다. 하지만 PEO 공정은 고전압을 필요로 하여 일반적인 양극산화 처리보다 소모되는 전력량이 많으며, 아크 발생에 의해 형성된 피막의 표면 거칠기가 높기 때문에 활용 분야가 제한되거나 후속 연마 공정을 필요로 하는 단점이 존재한다. 본 연구에서는 전류 파형이 알루미늄 합금의 플라즈마 전해산화 피막의 형성 거동에 미치는 영향을 직류 및 펄스전류를 사용하여 연구하였다. NaOH 및 $Na_2SiO_3$가 혼합된 전해액에서 직류 전류 밀도, 전압, 펄스폭을 달리하여 알루미늄 합금에 전류를 인가할 때 발생되는 아크의 거동, 형성된 산화 피막의 두께, 거칠기, 경도, 표면 및 단면 구조를 비교 분석하였다.

• Journal of the Korean Chemical Society
• /
• v.34 no.4
• /
• pp.340-344
• /
• 1990

The pressure effect of voltammetric parameters for the oxidation of Bilirubin in 0.1 M TEAP-DMSO solution at micro Pt electrode has been investigated. With increasing the pressure from 1 to 1,800 bars, the peak potential of oxidation wave shifted to the more positive potential. The peak current becomes considerably smaller with increasing the pressure. The oxidation currents of Bilirubin was found to be diffusion controlled over all pressure ranges. The reversibility of oxidation step did not change with increasing pressure. The linear relationships were observed over all pressure ranges (1-1,800 bars).

• Journal of the Korea Institute of Information and Communication Engineering
• /
• v.20 no.5
• /
• pp.992-997
• /
• 2016

This paper analyzes the deviation of tunneling current for the ratio of top and bottom gate oxide thickness of short channel asymmetric double gate(DG) MOSFET. The ratio of tunneling current for off current significantly increases if channel length reduces to 5 nm. This short channel effect occurs for asymmetric DGMOSFET having different top and bottom gate oxide structure. The ratio of tunneling current in off current with parameters of channel length and thickness, doping concentration, and top/bottom gate voltages is calculated in this study, and the influence of tunneling current to occur in short channel is investigated. The analytical potential distribution is obtained using Poisson equation and tunneling current using WKB(Wentzel-Kramers-Brillouin). As a result, tunneling current is greatly changed for the ratio of top and bottom gate oxide thickness in short channel asymmetric DGMOSFET, specially according to channel length, channel thickness, doping concentration, and top/bottom gate voltages.

• Journal of the Korean Institute of Telematics and Electronics T
• /
• v.35T no.1
• /
• pp.29-32
• /
• 1998

The low level leakage currents in silicon oxides were investigated. The low level leakage currents were composed of a transient component and a do component. The transient component was caused by the tunnel charging and discharging of the stress generated traps nearby two interfaces. The do component was caused by trap assisted tunneling completely through the oxide. The low level leakage current was proportional to the number of traps generated in the oxides. The low level leakage current may be a trap charging and discharging current. The low level leakage current will affect data retention in EEPROM.

• Proceedings of the Korean Institute of Surface Engineering Conference
• /
• 2014.11a
• /
• pp.98-99
• /
• 2014

질산산화법(nitric acid oxidation method)은 저온에서 안정적인 산화막을 형성하는 직접산화공정으로 azeotropic point(68 wt%)인 120도 이하의 온도에서 산화막을 형성한다. 120도에서 형성한 질산산화막은 CVD법으로 형성한 산화막 보다 낮은 누설전류밀도(leakage current density)를 나타낸다. 또한 질산의 농도가 증가함에 따라 형성한 산화막의 누설전류밀도가 감소하며, 이는 열산화법으로 형성한 산화막 보다 낮다. 질산산화의 낮은 누설전류밀도는 형성한 산화막의 높은 원자 밀도와 낮은 계면준위밀도에 의한 것으로 이 특성을 이용하여 게이트 절연막(gate insulator)과 태양전지의 passivation막으로 응용되고 있다.

• Proceedings of the KIEE Conference
• /
• 2005.11a
• /
• pp.3-5
• /
• 2005

Ni/Au 쇼트키 접합의 산화를 통해 항복전압이 증가하고 누설 전류가 감소한 수평방향 GaN 쇼트키 장벽 다이오드를 제작하였다. 산화 과정 후, 턴-온 전압이 미세하게 증가하였으며 높은 애노드 전압하에서 애노드 전류가 증가하였다. 5분과 10분의 산화 과정 후, 누설 전류는 1nA 이하 수준으로 현저히 감소하였다. Edge Termination 방법으로 Floating Metal Ring을 사용하고, 산화 과정을 적용하여 제안된 GaN 쇼트키 장벽 다이오드의 항복전압은 750볼트의 큰 값을 얻을 수 있었다. 상온과 $125^{\circ}C$ 에서 제작한 GaN 쇼트키 장벽 다이오드의 역방향 회복 파형도 측정하였으며, 제작한 소자는 매우 빠른 역방향 회복 특성을 보였다.

• Journal of the Korean Electrochemical Society
• /
• v.16 no.2
• /
• pp.70-73
• /
• 2013

Iridium oxide is well known as an electrocatalyst for the water oxidation. Recently, Dr. Bard's group observed the electrocatalytic behavior of individual nanoparticle of Iridium oxide using the electrochemical amplification method by detecting the single nanoparticle collisions at the ultramicroelectrode (UME). However, the electrocatalytic current is decayed as a function of time. In this study, we investigated that the reason of electrocatalytic current decay of water oxidation at Iridium oxide nanoparticles. We identified it is due to the bubble overpotential because the cyclic current decay and recovery were synchronized to the oxygen bubble growth and coming away from an Iridium disk electrode.