• Journal of KIISE:Computing Practices and Letters
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• v.11 no.4
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• pp.305-311
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• 2005

Flash memory software running on cellular phones and PDAs need to be tested extensively to cope with abrupt power and media faults. For those tests, we designed and implemented a Flash memory emulator with fault injection features. The fault injection tester has provided a helpful framework for designing fault recovery schemes and also for analyzing fault damages to the FTL (Flash Translation Layer) and file system for a Flash memory based system. In this paper, we discuss Plash memory fault types and fault injection features implemented on this Flash memory emulator. We then discuss in detail a design flaw revealed during fault injection tests. Specifically, it was revealed that a scheme that was believed to improve reliability instead, turned out to be harmful. In addition, we discuss post-fault behaviors of the FTL and the file system.

• Proceedings of the Korean Society of Computer Information Conference
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• 2018.07a
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• pp.357-359
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• 2018

최근 메모리 반도체 시장은 SD(Secure Digital) 메모리 카드, SSD(Solid State Drive)등의 보급률 증가로 메모리 반도체의 시장이 대규모로 증가하고 있다. 메모리 반도체는 개인용 컴퓨터 뿐만 아니라 스마프폰, 테플릿 PC, 교육용 임베디드 보드 등 다양한 산업에서 이용 되고 있다. 또한 메모리 반도체 생산 업체가 대규모로 메모리 반도체 산업에 투자하면서 메모리 반도체 시장은 대규모로 성장되었다. 플래시 메모리는 크게 NAND-Type과 NOR-Type으로 나뉘며 플로팅 게이트 셀의 전압의 따라 SLC(Single Level Cell)과 MLC(Multi Level Cell) 그리고 TLC(Triple Level Cell)로 구분 된다. SLC 및 MLC NAND-Type 플래시 메모리는 많은 연구가 진행되고 이용되고 있지만, TLC NAND-Tpye 플래시 메모리는 많은 연구가 진행되고 있지 않다. 본 논문에서는 기존에 제안된 SLC 및 MLC NAND-Type 플래시 메모리에서 제안된 큐브 패턴을 TLC NAND-Type 플래시 메모리에서 적용 가능한 큐브 패턴 및 알고리즘을 제안한다.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.17 no.4
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• pp.143-148
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• 2017

Flash Memory which is light and strong external shock as storage of small electronics like smartphone, digital camera, car black box has been widely used. Since the operation speed of the read operation and the write operation are different from each other, and the flash memory has the feature that it is not possible to overwrite, the delete operation is added to solve these problems. Wear-leveling must also be considered, since the number of erase times of the flash memory is limited. Many studies have been conducted on the substitutional algorithms of flash memory based on these characteristics of recent flash memories. So, to solve the problem that has existing buffer replacement algorithm this thesis divide page into 6 groups and when proposed algorithm select victim page, it consider reference page frequency and page recency.

• Journal of KIISE
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• v.42 no.8
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• pp.972-978
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• 2015

Non-volatile memory (NVM) supports both byte addressability and non-volatility. These characteristics make it feasible for NVM to be employed at any layer of the memory hierarchy such as cache, memory and disk. An interesting characteristic of NVM is that, even though it supports non-volatility, its retention capability is limited. Furthermore NVM has tradeoff between its retention capability and write latency. In this paper, we propose a novel NVM-based file cache management scheme that makes use of the limited retention capability to improve the cache performance. Experimental results with real-workloads show that our scheme can reduce access latency by up to 31% (24.4% average) compared with the conventional LRU based cache management scheme.

• The Journal of the Convergence on Culture Technology
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• v.9 no.1
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• pp.771-776
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• 2023

Scratchpad memory is a software-controlled on-chip memory designed and used to mitigate the disadvantages of existing cache memories. Existing cache memories have TAG-related hardware control logic, so users cannot directly control cache misses, and their sizes are large and energy consumption is relatively high. Scratchpad memory has advantages in terms of size and energy consumption because it eliminates such hardware overhead, but there is a burden on software to manage data. In this study, data management techniques of scratchpad memory were classified and examined, and ways to maximize the advantages were discussed.

• Journal of the Korea Institute of Information Security & Cryptology
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• v.23 no.5
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• pp.931-938
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• 2013

It is hard to extract original data from encrypted data before getting the password in encrypted data with disk encryption software. This encryption key of disk encryption software can be extract by using physical memory analysis. Searching encryption key time in the physical memory increases with the size of memory because it is intended for whole memory. But physical memory data includes a lot of data that is unrelated to encryption keys like system kernel objects and file data. Therefore, it needs the method that extracts valid data for searching keys by analysis. We provide a method that collect only saved memory parts of disk encrypting keys in physical memory by analyzing Windows kernel virtual address space. We demonstrate superiority because the suggested method experimentally reduces more of the encryption key searching space than the existing method.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.12
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• pp.61-70
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• 2007

The density of Memory has been increased by great challenge for memory technology. Therefore, elements of memory become more smaller than before and the sensitivity to faults increases. As a result of these changes, memory testing becomes more complex. In addition, as the number of storage elements per chip increases, the test cost becomes more remarkable as the cost per transistor drops. Recent development in system-on-chip (SOC) technology makes it possible to incorporate large embedded memories into a chip. However, it also complicates the test process, since usually the embedded memories cannot be controlled from the external environment. Proposed design doesn't need controls from outside environment, because it integrates into memory. In general, there are a variety of memory modules in SOC, and it is not possible to test all of them with a single algorithm. Thus, the proposed scheme supports the various memory testing process. Moreover, it is able to At-Speed test in a memory module. consequently, the proposed is more efficient in terms of test cost and test data to be applied.

• Journal of the Korea Society of Computer and Information
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• v.17 no.7
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• pp.1-11
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• 2012

As process technology scales down, the number of cores integrated into a processor increases dramatically, leading to significant performance improvement. Especially, the GPU(Graphics Processing Unit) containing many cores can provide high computational performance by maximizing the parallelism. In the GPU architecture, the access latency to the main memory becomes one of the major reasons restricting the performance improvement. In this work, we analyze the performance improvement of the 3D GPU architecture compared to the 2D GPU architecture quantitatively and investigate the potential problems of the 3D GPU architecture. In general, memory instructions account for 30% of total instructions, and global/local memory instructions constitutes 60% of total memory instructions. Therefore, the performance of the 3D GPU is expected to be improved significantly compared to the 2D GPU by reducing the delay of memory instructions. However, according to our experimental results, the 3D architecture improves the GPU performance only by 2% compared to the 2D architecture due to the memory bottleneck, since the performance reduction due to memory bottleneck in the 3D GPU architecture increases by 245% compared to the 2D architecture. This paper provides the guideline for suitable memory design by analyzing the efficiency of the memory architecture in 3D GPU architecture.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.2 s.332
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• pp.57-64
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• 2005

In this paper, we develop the common CAD tool that creates the automatically BIST IP by user settings for the convenient test of embedded memory. Previous tools have defect that when memory model is changed, BIST IP must re-designed depending on memory model because existing tools is limited the widely used algorithms. We develop the tool that is created automatic BIST IP. It applies the algorithm according to the memory model which user requests We usually use the multi-port asynchronous SRAM needless to refresh as the embedded memory. However, This work researches on the dual-port SRAM.

• Journal of IKEEE
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• v.21 no.4
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• pp.353-357
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• 2017

In order to maintain numerous server systems used in enterprise and data center environments, the most important thing is to prevent the occurrence of UE (Uncorrectable Error) of each server system. With the recent development of cloud services, more memory modules are being used than ever before, while the operating frequency of server systems has increased and the process of developing memory has continued to shrink, making it more likely to fail. In these environments, there is a way to repair memory defects directly in the server system, but there is no currently available guideline to use it effectively. In this paper, we propose a method to effectively prevent memory failure in a server system based on the observation and analysis of memory failure phenomenon in existing system.