• The Journal of the Convergence on Culture Technology
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• v.6 no.2
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• pp.515-520
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• 2020

CMOS used in digital circuit design technology has reached the limit of integration due to quantum tunneling. Quantum-dot cellular automata (QCA), which can replace this, has many advantages such as low power consumption and fast switching speed, so many digital circuits of CMOS have been proposed based on QCA. Among them, the multiplexer is a basic circuit used in various circuits such as D-flip-flops and resistors, and has been studied a lot. However, the existing multiplexer has a disadvantage that space efficiency is not good. Therefore, in this paper, we propose a new multilayered multiplexer using cell interaction and D-latch using it. The multiplexer and D-latch proposed in this paper have improved area, cell count, and delay time, and have excellent connectivity and scalability when designing large circuits. All proposed structures are simulated using QCADesigner to verify operation.

• Journal of the Institute of Electronics and Information Engineers
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• v.53 no.7
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• pp.27-38
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• 2016

This work proposes a 12b 30MS/s 0.18um CMOS SAR ADC based on low-power composite switching with an active die area of $0.16mm^2$. The proposed composite switching employs the conventional $V_{CM}$-based switching and monotonic switching sequences while minimizing the switching power consumption of a DAC and the dynamic offset to constrain a linearity of the SAR ADC. Two equally-divided capacitors topology and the reference scaling are employed to implement the $V_{CM}$-based switching effectively and match an input signal range with a reference voltage range in the proposed C-R hybrid DAC. The techniques also simplify the overall circuits and reduce the total number of unit capacitors up to 64 in the fully differential version of the prototype 12b ADC. Meanwhile, the SAR logic block of the proposed SAR ADC employs a simple latch-type register rather than a D flip-flop-based register not only to improve the speed and stability of the SAR operation but also to reduce the area and power consumption by driving reference switches in the DAC directly without any decoder. The measured DNL and INL of the prototype ADC in a 0.18um CMOS are within 0.85LSB and 2.53LSB, respectively. The ADC shows a maximum SNDR of a 59.33dB and a maximum SFDR of 69.83dB at 30MS/s. The ADC consumes 2.25mW at a 1.8V supply voltage.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.10
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• pp.45-51
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• 2003

In this paper, a scan-based low power BIST (Built-In Self-Test) architecture is proposed. The proposed architecture is based on STUMPS, which uses a LFSR (Linear Feedback Shift Register) as the test generator, a MISR(Multiple Input Shift Register) as the reponse compactor, and SRL(Shift Register Latch) channels as multiple scan paths. In the proposed BIST a degenerate MISR structure is used for every SRL channel; this offers reduced area overheads and has less impact on performance than the STUMPS techniques. The proposed BIST is designed to support both test-per-clock and test-per-scan techniques, and in test-per-scan the total power consumption of the circuit can be reduced dramatically by suppressing the effects of scan data on the circuits. Results of the experiments on ISCAS 89 benchmark circuits show that this architecture is also suitable for detecting path delay faults, when the hamming distance of the data in the SRL channel is considered.

• Journal of Internet of Things and Convergence
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• v.6 no.1
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• pp.97-102
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• 2020

Multi-Channel Switch ICs for IoT have integrated several solid state structure low ON-resistance bi-directional relay MOS switches with level shifter to drive high voltage and they should be independently controlled by external serialized logic control. These devices are designed for using in applications requiring high-voltage switching control by low-voltage control signals, such as medical ultra-sound imaging, ink-jet printer control, bare board open/short and leakage test system using Kelvin 4-terminal measurement method. This paper describes implementation of analog switch control block and its verification using Field programmable Gate Array (FPGA) test pattern generation. Each block has been implemented using Verilog hardware description language then simulated by Modelsim and prototyped in a FPGA board. Compare to conventional IC, The proposed architecture can be applied to fields where multiple entities need to be controlled simultaneously in the IoT environment and the proposed pattern generation method can be applied to test similar types of ICs.