• KSCE Journal of Civil and Environmental Engineering Research
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• v.5 no.2
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• pp.67-73
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• 1985

In Digital Terrain Model(DTM), more accurate data acquisition method is of importance. This paper has the purpose of accuracy analysis of progressive sampling method, one of data acquisition method. Especially, The following in accuracy analysis are compared and analyzed. -Comparison and analysis for position error between the digital contour lines using digital terrain model and the conventional contour lines using A-10 Plotter. -Analysis for height error of interpolation points according to application of progressive sampling method. For above numerical tests, Computer Program related to auto-carto of contour lines was made up. As a result of tests, threshold and sampling criterion have close of mutual relation to accuracy. Particularly, it was found that auto-carto of contour lines-threshold of 1.0 m and standard criterion-almost concurred in conventional contour lines.

• Journal of the Korean Society for Precision Engineering
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• v.22 no.4
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• pp.19-26
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• 2005

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 1998.03a
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• pp.239-244
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• 1998

ESP(Electronic Speckle Pattern Interferometry) is an optical technique to measure deforamtion of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive measuring method, is capable of providing full-field results with high spatial resolution and high speed. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and a shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring. And by this geometric analysis, we performed the electronic speckle contouring experiment. We used 4-frame phase shifting method with PZT for quantitative analysis of contour fringes. Finally, we showed good agreements between the geometric analysis and experimental results.

• Journal of the Korean Society for Precision Engineering
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• v.16 no.12
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• pp.190-197
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• 1999

Electronic speckle contouring(ESC) is the optical method for measuring shape by using fringe-projection techniques in electronic speckle pattern interferometry. It has the advantage of being non-contacting and can also give a field view of the surface under investigation. Fringes in ESC represent the difference in depth along the view direction between the master wavefront and the test component. The contour maps of three-dimensional diffuse objects are obtained by small shifts of optical fiber carrying the dual-object-beams and 4-frame phase shift. We proposed the contouring method by shifting the collimated illumination beams through optical fiber in order to obtain the contour fringe patterns. And also, we performed addition of incremental addition of images and experiments based on it. we obtained both quantitative increment without decorrelation effect and qualitative improvement by reducing the noise of contour fringes.

• Korean Journal of Remote Sensing
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• v.14 no.2
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• pp.129-136
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• 1998

This paper deals with a problem encountered in the course of constructing digital elevation model from a contour map. Deficiencies of widely used linear interpolation method is described, and an interpolation method for internal points of a single closed contour is proposed. Control points not on a plane are searched and interpolated. The method is applied to an artificial contour lines and real contour lines. The result shows natural and accurate reconstruction.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1995.10a
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• pp.397-401
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• 1995

ESPI(Electronic Speckle Pattern Interfermetry) is an optical technique to measure surface deforamtion of engineering components and materials in industrial ares. This optical method is capable of providing full-field results with high spatial resolution, high speed and is the non-contact technique. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The contouring method by modified dual-beam speckle pattern interferometry is proposed. We introduce a shift of the illumination beams through optical fiber in order to obtain the contour fringe patterns. The speckle pattern correlation technique is suitable for providing measurement range from millimeters to several centimeters. The complete geometric analysis of the contoretical and experimental results are obtained.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.10
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• pp.156-164
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• 1998

Electronic Speckle Pattern Interferometry(ESPI) has been used to measure surface deformations of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive technique, is capable of providing full-field results with high spatial resolution and high speed. One of the important application using electronic speckle pattern interferometry is electronic speckle contouring of a diffused object for 3-D shape analysis and topography measurement. Generally the electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and the shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. We also describe formation process of depth contour fringes and grid contour fringes by shifting direction of the two illumination beams. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring, and then, the electronic speckle contouring experiment with various specimens. For quantitative analysis of the contour fringes, we used 4-frame phase shifting method with PZT Finally, good agreement between the geometric analysis and experimetal results is obtained.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.49 no.2
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• pp.8-17
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• 2012

In this paper we proposes a new framework to obtain 3D shape information of thin film rapidly. The conventional equipments based on reflectometry are not suitable for obtaining 3D overall shape information of thin film rapidly since they require more than 30 minutes to measure the absolute thickness for 170 points. The proposed framework is based on an image analysis method that extracts contour lines from interference fringes images using Canny edge detector. The absolute thickness for contour lines are measured and then a height map from the contour lines is obtained by interpolation using Borgefors distance transformation. The extracted height map is visualized using the DirectX 3D terrain rendering method. The proposed framework can provide 3D overall shape information of thin film in about 5 minutes since relatively small number of real measurement for contour lines is required.

• Journal of the Korean Association of Geographic Information Studies
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• v.6 no.3
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• pp.33-42
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• 2003

As airborne laser scanning technique is developed with high vertical accuracy recently, there come many studies on DEM(digital elevation model creation, building extraction, flood risk mapping and 3D virtual city modeling. This study applied point comparative method, contour comparative method and digital map with scale 1/5,000 to calculate RMSE of DEM in according to resolution that was constructed using rawdata being acquired by airborne laser scanning. As a result, point comparative method showed lower DEM standard error than contour comparative method, it is a reason that contour comparative method was not carried out detailed grid calculation for point comparative method. Also, digital map with scale 1/5,000 showed higher DEM standard error than point comparative method and contour comparative method in below 25.4m that is average horizontal distance among contour line, and showed similar result with contour comparative method in over 25.4m.