• Title/Summary/Keyword: 도플러 스펙트럼

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The Study of Aliasing and Incidence Angle Dependence of Doppler Image on Humeral Artery (상완동맥 Doppler 영상의 입사각 의존성과 Aliasing에 관한 연구)

  • Kim, Sang-Jin;Ji, Tae-Jeong
    • Journal of radiological science and technology
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    • v.31 no.4
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    • pp.379-387
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    • 2008
  • Among methods to eliminate aliasing effects, the method of increasing velocity scale gradually eliminated the phenomenon in which the direction of the blood flow appeared in reverse. It was done by increasing the velocity scale while maintaining other parameters in the same state. The method of setting the Doppler angle to $0^{\circ}$ did not show significant changes in the wave pattern of the spectrum according to the angle. In actual ultrasonography tests, more accurate tests are expected to be carried out by applying variations to the velocity scale under the considerations of speed, accuracy, and convenience of the examination. The results showed that blood flow velocity increases exponentially according to the Doppler Angle. When the angle goes over $70^{\circ}$, the velocity value increases to an unmeasurable state. This indicates that in blood flow velocity measurements, the blood flow velocity is very dependent on the Doppler Angle. It also shows that the error increases when the incidence angle to the direction of blood flow exceeds $60^{\circ}$, and when the angle exceeds $70^{\circ}$, the error becomes even greater. In addition, he experiment results showed that an angle below $60^{\circ}$ is appropriate and for blood flow velocity measurements in extremity vessels, the most appropriate Doppler Angle is from $45^{\circ}$ to $60^{\circ}$.

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Investigation of Various Radiation Proton Energy Effect on n, p Type Silicon by Positron Annihilation Method (양전자 소멸 측정법으로 양성자 조사에너지 변화에 대한 n, p형 실리콘 구조 특성)

  • Lee, Chong Yong
    • Journal of the Korean Vacuum Society
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    • v.22 no.6
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    • pp.341-347
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    • 2013
  • The n-type and p-type silicon samples were exposed by 40.0, 3.98 MeV proton beams ranging between 0 to $20.0{\times}10^{13}protons/cm^2$. Coincidence Doppler Broadening Positron Annihilation Spectroscopy (CDBPAS) were applied to study of defect characteristics of p type and n type silicon samples. In this investigation the numerical analysis of the spectra was employed to the determination of the shape parameter, S, defined as the ratio between the amount of counts in a central portion of the gamma spectrum and the total counts of whole gamma spectrum. The S-parameter values strongly depend on the irradiated proton beam that indicated the defects generate more, rather than the energy intensity. 40 MeV irradiated proton beam in the n-type silicon at $20.0{\times}10^{13}protons/cm^2$ was larger defects than 3.98 MeV irradiated proton beam. It was analysis between the proton irradiation beams and the proton intensities of the irradiation. Because of the Bragg peak, SRIM results shows mainly in a certain depth of the sample to form the defect by the proton irradiation, rather than the defects to appear for the entire sample.

The Defect Characterization of Luminescence Thin Film by the Positron Annihilation Spectroscopy (양전자 소멸 측정을 이용한 발광 박막 구조 결함 특성)

  • Lee, Kwon Hee;Bae, Suk Hwan;Lee, Chong Yong
    • Journal of the Korean Vacuum Society
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    • v.22 no.5
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    • pp.250-256
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    • 2013
  • It is described that the proton beam induces micro-size defects and electronic deep levels in luminescence Thin Film. Coincidence Doppler Broadening Positron Annihilation Spectroscopy (CDBPAS) and Positron lifetime Spectroscopy were applied to study of characteristics of a poly crystal samples. In this investigation the numerical analysis of the Doppler spectra was employed to the determination of the shape parameter, S-parameter value. The samples were exposed by 3.0 MeV proton beams with the intensities ranging between 0 to ${\sim}10^{14}$ particles. The S-parameter values decreased as increased the proton beam, that indicates the protons trapped in vacancies. Lifetime ${\tau}_1$ shows that positrons are trapped in mono vacancies. Lifetime ${\tau}_2$ is not changed according to proton irradiation that indicate the cluster vacancies of the grain structure.

Shear-wave elasticity imaging with axial sub-Nyquist sampling (축방향 서브 나이퀴스트 샘플링 기반의 횡탄성 영상 기법)

  • Woojin Oh;Heechul Yoon
    • The Journal of the Acoustical Society of Korea
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    • v.42 no.5
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    • pp.403-411
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    • 2023
  • Functional ultrasound imaging, such as elasticity imaging and micro-blood flow Doppler imaging, enhances diagnostic capability by providing useful mechanical and functional information about tissues. However, the implementation of functional ultrasound imaging poses limitations such as the storage of vast amounts of data in Radio Frequency (RF) data acquisition and processing. In this paper, we propose a sub-Nyquist approach that reduces the amount of acquired axial samples for efficient shear-wave elasticity imaging. The proposed method acquires data at a sampling rate one-third lower than the conventional Nyquist sampling rate and tracks shear-wave signals through RF signals reconstructed using band-pass filtering-based interpolation. In this approach, the RF signal is assumed to have a fractional bandwidth of 67 %. To validate the approach, we reconstruct the shear-wave velocity images using shear-wave tracking data obtained by conventional and proposed approaches, and compare the group velocity, contrast-to-noise ratio, and structural similarity index measurement. We qualitatively and quantitatively demonstrate the potential of sub-Nyquist sampling-based shear-wave elasticity imaging, indicating that our approach could be practically useful in three-dimensional shear-wave elasticity imaging, where a massive amount of ultrasound data is required.