• Title/Summary/Keyword: 노화 센싱 회로

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Design and Implementation of a new aging sensing circuit based on Flip-Flops (플립플롭 기반의 새로운 노화 센싱 회로의 설계 및 구현)

  • Lee, Jin-Kyung;Kim, Kyung Ki
    • Journal of Korea Society of Industrial Information Systems
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    • v.19 no.4
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    • pp.33-39
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    • 2014
  • In this paper, a new on-chip aging sensing circuit based on flip-flops is proposed to detect a circuit failure of MOSFET digital circuits casued by aging phenomenon such as HCI and BTI. The proposed circuit uses timing windows to warn against a guardband violation of sequential circuits, and generates three warning bits right before circuit failures occur. The generated bits can apply to an adaptive self-tuning method for reliable system design as control signals. The aging sensor circuit has been implemented using 0.11um CMOS technology and evaluated by $4{\times}4$ multiplier with power gating structure.

Header-Based Power Gating Structure Considering NBTI Aging Effect (NBTI 노화 효과를 고려한 헤더 기반의 파워게이팅 구조)

  • Kim, Kyung-Ki
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.49 no.2
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    • pp.23-30
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    • 2012
  • This paper proposes a novel adaptive header-based power gating structure to compensate for the performance loss and the increased wake-up time of the power gating structures induced by the negative bias temperature instability (NBTI) effect. The proposed structure consists of variable width footers based on the two-pass power gating and a new NBTI sensing circuit for an adaptive control. The simulation results of the proposed structure are compared to those of power gating without the adaptive control and show that both the circuit-delay and wake-up time dependence of the power gating structure on the NBTI stress is minimized with only 3% and 4% increase, respectively while keeping small leakage power and rush-current. In this paper, a 45 nm CMOS technology and predictive NBTI model have been used to implement the proposed circuits.