• Journal of the Korean Electrochemical Society
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• v.13 no.4
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• pp.270-276
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• 2010

Nickel-copper foam electrodes with pore gradient micro framework and nano-ramified wall have been prepared by using an electrochemical deposition process. Growth habit of nickel-copper co-deposits was quite different from that of pure nickel deposit. In particular, the ramified structure of the individual particles was getting clear with chloride ion content in the electrolyte. The ratio of nickel to copper in the deposits decreased with the distance away from the substrate and the more chloride ions in the electrolyte led to the more nickel content throughout the deposits. Compositional analysis for the cross section of a ramified branch, together with tactical selective copper etching, proved that the copper content increased with approaching central region of the cross section. Such a composition gradient actually disappeared after heat treatment. It is anticipated that the pore gradient nickel-copper nanostructured foams presented in this work might be a promising option for the high-performance electrode in functional electrochemical devices.

• Korean Chemical Engineering Research
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• v.47 no.2
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• pp.141-149
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• 2009

The Cu thin film material and process, which have been already used for metallization of CMOS(Complementary Metal Oxide Semiconductor), has been highlighted as the Cu metallization is introduced to the metallization process for giga - level memory devices. The recent progresses in the development of key elements in electrochemical processes like surface pretreatment or electrolyte composition are summarized in the paper, because the semiconductor metallization by electrochemical processes such as electrodeposition and electroless deposition controls the thickness of Cu film in a few nm scales. The technologies in electrodeposition and electroless deposition are described in the viewpoint of process compatibility between copper electrodeposition and damascene process, because a Cu metal line is fabricated from the Cu thin film. Silver metallization, which may be expected to be the next generation metallization material due to its lowest resistivity, is also introduced with its electrochemical fabrication methods.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2009.10a
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• pp.168-168
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• 2009

핸드폰, 노트북과 같이 최신경량 전자재료로 만들어지는 전자제품의 수요가 급증함에 따라 반도체 배선의 폭이 점점 작아지고, 이로 인해 프린팅공정을 이용한 미세 배선기술이 활발히 개발되고 있다. 이에 본 연구는 미세배선에 높은 전기전도도를 부여하기 위하여 전기도금을 실시하였으며, 균일한 도금층을 얻기 위하여 첨가제에 따른 분극거동을 분석하고 이를 바탕으로 양극 및 음극 형상에 따른 구리의 성장 거동을 시뮬레이션을 통하여 분석하였다. 균일한 증착을 위해서는 첨가제의 역할도 중요하지만 양극과 음극의 형상에 따라서도 구리성장 거동에 영향을 미치는 것을 알 수 있었다.

• Korean Chemical Engineering Research
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• v.55 no.2
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• pp.264-269
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• 2017

To improve heating characteristics of graphite fibers, graphite fibers were copper-plated by electroless plating. The Cu-plated graphite fibers were investigated by thermos-gravimetric analysis in air to calculate quantities of copper on surface of graphite fiber according to plating time. Also, the surface temperature with applied voltage was observed by thermos-graphic camera using a strand of graphite fiber. According to the increment of plating time, the higher quantities of plated copper on graphite fiber were obtained. The electric conductivity of plated graphite fiber for 20 minutes was resulted in 1594.3 S/cm, and surface temperature of this sample showed the maximum temperature $57.2^{\circ}C$. These result could be attributed that copper having great electric conductivity are growing on graphite fiber and followed improving heating characteristics.

• Proceedings of the International Microelectronics And Packaging Society Conference
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• 2002.11a
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• pp.7-12
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• 2002

반도체 공정에서 구리(Cu) 배선의 미세구조와 신뢰성에 대해 연구하였는데, 특히 CVD Cu와 전기도금 Cu를 사용하여 신뢰성에 대한 texture와 결정 구조의 영향을 연구하였다 CVD Cu의 경우 여러 가지 시드층(seed layer)을 사용함으로서, 결정입자의 크기는 비슷하지만 texture가 전혀 다른 Cu 박막을 얻을 수 있었는데, 신뢰성 검사결과 (111) texture를 가진 Cu 배선의 수명이 (200) texture를 가진 Cu 배선의 수명보다 약 4배 가량 길게 나왔다. 전기도금 Cu 박막의 경우 항상 (111) texture를 갖고 있었으며 결정립의 크기도 CVD Cu의 것보다 더 컸다. Damascene 공법으로 회로 형성한 Cu 배선의 경우에도 전기도금 Cu의 결정립 크기가 CVD Cu의 것보다 더 크게 나타났으며, 신뢰성 검사결과 배선의 수명도 더 길게 나타났는데 그 차이는 0.4 $\mu\textrm{m}$ 이하의 미세선폭 영역에서 더욱 현저했다. 따라서 전기도금 Cu가 CVD Cu보다 신뢰성 측면에서 더 우수한 것으로 판명되었다.

• Korean Chemical Engineering Research
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• v.43 no.4
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• pp.495-502
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• 2005

Copper was plated on the tungsten substrate by use of a direct copper electroless plating. The optimum deposition conditions were found to be with a concentration of $CuSO_4$ 7.615 g/L, EDTA of 10.258 g/L, and glyoxylic acid of 7 g/L, respectively. The solution temperature was maintained at $60^{\circ}C$. The pH was varied from 11.0 to 12.8. After the deposition, the properties of the copper film were investigated with X-ray diffractometer (XRD), Field emission secondary electron microscope (FESEM), Atomic force microscope (AFM), X-ray photoelectron spectroscope (XPS), and Rutherford backscattering spectroscope (RBS). The best deposition condition was founded to be the solution pH of 11.8. In the case of 10 min deposition at the pH of 11.8, the grain shape was spherical, Cu phase was pure without impurity peak ($Cu_2O$ peak), and the surface root mean square roughness was about 11 nm. The thickness of the film turned out to be 140 nm after deposition for 12 min and the deposition rate was found to be about 12 nm/min. Increase in pH induced a formation of $Cu_2O$ phase with a long rectangular grain shape. The pH control seems to play an important role for the orientation of Cu in electroless deposition. The deposited copper concentration was 99 atomic percent according to RBS. The resulting Cu/W film yielded a good adhesive strength, because Cu/W alloy forms during electroless deposition.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.35 no.1
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• pp.43-51
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• 2011

Natural convection heat transfer phenomena on a horizontal cylinder have been studied experimentally in order to investigate the applicability of analogy experimental methodology using a copper electroplating system and to visualize the local heat transfer rates depending on the angular position and the diameter of the horizontal cylinder. In the copper electroplating system, the copper ion produced at the anode moves by convection and diffusion to the cathode and reduces at the cathode, representing the heat transfer. By using aluminum cathode with a distinguishable color, the amount of copper plated could visualize the amount of heat transferred depending on the angular position of the cylinder. The diameter of the cylinder is varied from 0.01m to 0.15m, which correspond to Rayleigh numbers in the range of $1.73{\times}10^7$ to $5.69{\times}10^{11}$. The test results are in good agreement with existing heat transfer correlations.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2015.05a
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• pp.148-149
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• 2015

본 연구에서는 전기 도금법을 이용하여 수 마이크로미터(${\mu}m$)에서 수십 마이크로미터 크기의 수지상(dendrite) 구리분말을 제조하였다. 구리 도금욕의 종류($Cu_2P_2O_7$, $CuSO_4$, $CuCl_2$), 인가 전위(E, Volt) 및 기판에 따른 수지상(Dendrite)의 형상적인 특성이 비교되었으며, 형상에 따른 겉보기밀도와 비표면적 측정(BET)이 진행되었다. 수지상의 2차 가지길이와 주축길이의 비(ratio)를 형상의 차이로 분류한 결과 염화구리 도금욕에서 0.14 로서 가장 큰 값을 가지며 겉보기 밀도는 $1.04g/cm^3$로 가장 낮은 값을 보였다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2011.05a
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• pp.137-138
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• 2011

구리 이온은 -0.40V (vs. SCE)에서 전기화학적 환원이 일어나는 반면, 니켈 이온은 -1.19V (vs. SCE)에서 전착이 발생한다. 따라서, 단일 도금욕조 내에서 Ni-Cu 합금도금층을 제조하기 위해서는 두 금속 이온종 간의 전위차를 줄여주어야 하는데, 이를 위해 본 연구에서는 $Na_3C_6H_5O_7{\cdot}2H_2O$를 착화제로 사용하였다. 다양한 Ni-Cu 합금 도금층의 조성을 얻기 위하여 기본 도금욕 내 황산니켈과 황산구리의 비율을 10:1로 설정하였다. 도금 공정 조건에 따른 합금 도금층 조성 변화를 관찰하기 위하여 도금액 pH와 교반 속도에 따른 도금층 조성 변화를 분석하였으며, 도금액의 UV-VIS과 도금층의 XRD 와 SEM 측정을 통하여 도금욕과 도금층 간의 상관 관계를 유추하였다. 본 도금액에 사용된 $Na_3C_6H_5O_7{\cdot}2H_2O$ 착화제의 효과는 pH3에서 가장 현저하였으며, pH 변화 및 교반 속도 변화를 이용하여 다양한 합금 조성을 얻을 수 있었다.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.16 no.4
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• pp.759-764
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• 2012

Copper Pillar Tin Bump (CPTB) was investigated for high density chip interconnect technology development, which was prepared by electroplating and electro-less plating methods. Copper pillar tin bumps that have $100{\mu}m$ pitch were introduced with fabrication process using a KM-1250 dry film photoresist (DFR), with copper electroplating for Copper Pillar Bump (CPB) formation firstly, and then tin electro-less plating on it for control oxidation. Electric resistivity and mechanical shear strength measurements were introduced to characterize the oxidation effects and bonding process as a function of thermo-compression. Electrical resistivity increased with increasing oxidation thickness, and shear strength had maximum value with $330^{\circ}C$ and 500 N at thermo-compression process. Through the simulation work, it was proved that the CPTB decreased in its size of conduction area as time passes, however it was largely affected by the copper oxidation.