• Journal of KIISE:Databases
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• v.34 no.2
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• pp.99-108
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• 2007

In this paper, we design and implement the Film Defect Inspection System (FDIS) that detects film defects and determines their types which can be used for producing polarized films of TFT-LCD. The proposed system is designed to detect film defects from polarized film images using image segmentation techniques and to determine defect types through the image analysis of detected defects. To determine defect types, we extract features such as shape and texture of defects, and compare those features with corresponding features of referential images stored in a template database. Experimental results using FDIS show that the proposed system detects all defects of test images effectively (Precision 1.0, Recall 1.0) and efficiently (within 0.64 second in average), and achieves the considerably high correctness in determining defect types (Precision 0.96 and Recall 0.95 in average). In addition, our system shows the high robustness for rotated transformation of images, achieving Precision 0.95 and Recall 0.89 in average.

• The KIPS Transactions:PartD
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• v.15D no.3
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• pp.321-326
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• 2008

The software defects that are not found in the course of a project frequently appear during the conduct of the maintenance procedure after the complete development of the software. As the frequency of surfacing of defects during the maintenance procedure increases, the cost likewise increases, and the quality and customer reliability decreases. The defect rate will go down only if cause analysis and process improvement are constantly performed. This study embodies the defect tracking system (DTS) by considering the Pareto principle: that most defects are repetitions of defects that have previously occurred. Based on the records of previously occurring defects found during the conduct of a maintenance procedure, DTS tracks the causes of the software defects and provides the developer, operator, and maintenance engineer with the basic data for the improvement of the software concerned so that the defect will no longer be manifested or repeated. The basic function of DTS is to analyze the defect type, provide the measurement index for it, and aggregate the program defect type. Doing these will pave the way for the full correction of all the defects of a software as it will enable the defect correction team to check the measured defect type. When DTS was applied in the software configuration management system of the W company, around 65% of all its software defects were corrected.

• Journal of KIISE
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• v.42 no.11
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• pp.1349-1360
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• 2015

In order to improve software quality, it is necessary to efficiently and effectively remove software defects in source codes. In the development field, defects are removed according to removal ratio or severity of defects. There are several studies on the removal of defects based on software quality attributes, and several other studies have been done to improve the software quality using classification of the severity of defects, when working on projects. These studies have thus far been insufficient in terms of identifying if there exists relationships between defects or whether any type of defect is more important than others. Therefore, in this study, we collected various types of software defects, standards organization, companies, and researchers. We modeled the defects types using an ANP model, and developed the weighted severities of the defects types, with respect to the general application software, using the ANP model. When general application software is developed, we will be able to use the weight for each severity of defect type, and we expect to be able to remove defects efficiently and effectively.

• Journal of the Korean Society for Nondestructive Testing
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• v.21 no.6
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• pp.658-662
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• 2001

The classification of surface flaw types was performed on the basis of angular dependence of backscattered ultrasound. The copper line adhered on the surface, cower line filled in groove, pure groove and the normal edge were adopted as various surface flaw patterns of glass specimen. A backward longitudinal profile was formed probably by the longitudinal wane scattering at and near 1st critical angle. The wave trains at the peak angles of the backward radiation profiles showed different shapes according to the superposition ratio of scattered and leaky waves. The asymmetry of the backward radiation profile arose due to the scattering effect of flaw. The additive resonance effect of copper line appeared in the left side of the profile. The peak angles of both the longitudinal and radiation profiles were shifted toward small angle by the scattering effect.

• Journal of Korea Multimedia Society
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• v.13 no.8
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• pp.1115-1127
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• 2010

In order to increase the productivity in manufacturing TFT-LCD(thin film transistor-liquid crystal display), it is essential to classify defects that occur during the production and make an appropriate decision on whether the product with defects is scrapped or not. The decision mainly depends on classifying the defects accurately. In this paper, we present an effective classification method for film defects acquired in the panel production line by analyzing the intensity distribution and shape feature of the defects. We first generate a binary image for each defect by separating defect regions from background (non-defect) regions. Then, we extract various features from the defect regions such as the linearity of the defect, the intensity distribution, and the shape characteristics considering intensity, and construct a referential image database that stores those feature values. Finally, we determine the type of a defect by matching a defect image with a referential image in the database through the matching cost function between the two images. To verify the effectiveness of our method, we conducted a classification experiment using defect images acquired from real TFT-LCD production lines. Experimental results show that our method has achieved highly effective classification enough to be used in the production line.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.371-371
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• 2013

사파이어 단결정 웨이퍼는 제조과정에서 결정 성장 조건 및 기계적 연마에 의하여 내부적인 결함이 발생할 수 있다. 사파이어 단결정은 일반적으로 LED용 기판 재료로 사용되며, 내부결함이 발생 시 기판 위의 GaN 등 layer의 결함도 함께 증가하므로 기판의 결함을 줄이는 과정이 중요한 이슈이다. 이 과정에 X-선 토포그래피는 단결정의 내부 결함을 모니터링 하는데 있어서 매우 유용한 방법이다. 이에 본 연구에서는 사파이어 단결정 웨이퍼에 내재하는 결함 형태를 X-선 Lang 토포그래피 방법(X-ray Lang Topography)으로 이미징하여 관찰, 분석하였다. Lang 토포그래피 방법은 X-선 투과법으로 넓은 부분을 우수한 강도와 분해능으로 내부 결함을 관찰할 수 있는 장점을 지니고 있다. X-선 source는 Mo $k{\alpha}$ 1을 사용하였으며, 시료는 c-plane 사파이어 웨이퍼를 사용하였다. 사파이어 웨이퍼의 (110), (102) 회절면의 X-선 토포그래피 이미지를 통해 전위 결함의 유형에 따른 이미지 패턴의 형성 메커니즘에 대해 연구하였고, 측정 회절면과 두께, 표면 데미지에 따른 전위 결함 이미지의 변화를 확인하였다. X-선 토포그래피 이미지를 통해 단결정 c-plane 사파이어 웨이퍼의 전위 결함의 형성 메카니즘 연구와 유형별 이미지와 회절면, 두께, 표면 데미지에 따른 이미지 변화 등을 확인하였다.

• The Journal of the Korea institute of electronic communication sciences
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• v.18 no.5
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• pp.785-796
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• 2023

In this study, a methodology for real-time classification and prediction of defects that may appear in PVDF(Polyvinylidene fluoride) sensors, which are widely used for structural integrity monitoring, is proposed. The types of sensor defects appearing according to the sensor attachment environment were classified, and an impact test using an impact hammer was performed to obtain an output signal according to the defect type. In order to cleary identify the difference between the output signal according to the defect types, the time domain statistical features were extracted and a data set was constructed. Among the machine learning based classification algorithms, the learning of the acquired data set and the result were analyzed to select the most suitable algorithm for detecting sensor defect types, and among them, it was confirmed that the highest optimization was performed to show SVM(Support Vector Machine). As a result, sensor defect types were classified with an accuracy of 92.5%, which was up to 13.95% higher than other classification algorithms. It is believed that the sensor defect prediction technique proposed in this study can be used as a base technology to secure the reliability of not only PVDF sensors but also various sensors for real time structural health monitoring.

• Journal of the Korean Geotechnical Society
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• v.17 no.5
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• pp.97-105
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• 2001

현장타설말뚝의 건전도 평가에서 충격반향, 충격응답기법과 같은 비검측공 시험법을 적용하는 사례가 점차로 증가되는 추세에 있다. 비검측공시험법의 적용성을 체계적으로 평가하기 위해 수행된 일련의 연구결과 중에서 본 논문에서는 시험법의 결함탐지 능력을 평가하기 위해 수행된 해석적 연구결과에 관해 논한다. 이 연구에서는 시험법의 결함탐지능력에 대한 제반 영향인자 중에서 결함의 유형, 위치 및 크기의 영향을 평가하고자 하였다. 이를 위해서 여러 가지 조건에서 말뚝머리에 작용하는 충격하중에 대한 흙-말뚝 구조의 동적응답을 ABAQUS를 이용한 유한요소법으로 해석하였다. 이로부터 얻은 신호를 충격반향 혹은 충격응답기법으로 처리.분석하여 각 시험법의 결함탐지 능력을 평가해 보았다. 연구결과 이들 두 기법 모두 결함의 위치와 유형은 비교적 정확하게 탐지하는 것으로 나타났다. 그러나 충격응답기법을 이용하여 추정한 결함 크기는 신뢰도가 매우 낮았다. 이 문제를 해소하여 시험법의 적용성을 향상시키기 위해서는 측정된 동적응답신호를 이용하여 적절한 역계산 기법을 개발하여 적용할 필요가 있다는 결론을 얻었다.

• Proceedings of the Korea Information Processing Society Conference
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• 2005.11a
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• pp.365-368
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• 2005

최근 소프트웨어 산업에서 소프트웨어 품질이 화두가 되고 있으며 소프트웨어 제품 개발 시 소프트웨어 품질 및 시험 개념을 적용하지 않으면 소프트웨어 시장에서 외면될 가망성이 높아지고 있다. 그로 인해 TTA SW 시험인증 센터에서 소프트웨어 품질을 높이기 위해 GS 시험인증을 서비스 하고 있다. 소프트웨어 시험을 통한 결함 분석을 통해 소프트웨어 제품 개발 시 개발 프로세스에 반영하고 개발자가 소프트웨어 제품을 구현 시 결함에 대한 분석정보를 활용할 수 있도록 소프트웨어 품질특성 중 결함이 많이 발생하는 부분에 결함 유형을 정의하고 사전에 방지할 수 있는 해결방법을 제시한다.

• Communications for Statistical Applications and Methods
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• v.18 no.6
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• pp.741-750
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• 2011

In this paper, we derive an software mixed debugging model based on a Markov process, assuming that the length of time to perform the debugging is random and its distribution may depend on the fault type causing the failure. We assume that the debugging process starts as soon as a software failure occurs, and either a perfect debugging or an imperfect debugging is performed upon each fault type. One type is caused by a fault that is easily corrected and in this case, the perfect debugging process is performed. An Imperfect debugging process is performed to fix the failure caused by a fault that is difficult to correct. Distribution of the first passage time and working probability of the software system are obtained; in addition, an availability function of a software system which is the probability that the software is in working at a given time, is derived. Numerical examples are provided for illustrative purposes.