• Journal of the Korean Ceramic Society
• /
• v.40 no.2
• /
• pp.206-211
• /
• 2003

Effects of substrates and buffer layer upon the formation of crystalline phases and ferroelectricity of $YMnO_3$ thin films were investigated. The hexagonal $YMnO_3$ was easily formed on Si(100) while the mixed phases, hexagonal and orthorhombic $YMnO_3$, on $Pt(111)/TiO_2/SiO_2/Si$ substrate. When the $Y_2O_3$ buffer layer of 70 nm thick was inserted between the substrates and the $YMnO_3,$ the c-axis oriented hexagonal single phase formed on both substrates, Si(100) and $Pt(111)/TiO_2/SiO_2/Si$. The leakage current density of the hexagonal $YMnO_3$ thin films was lower than that consisting of mixed phases, hexagonal and orthorhombic. Furthermore the hexagonal $YMnO_3$ with c-axis preferred orientation showed the lowest leakage current density. The remnant polarization from a P-E hysteresis curve for the $YMnO_3$ formed on Si(100) was 0.14 without buffer layer and $0.24_{mu}C/cm^2$ for that with buffer layer. For the $Pt(111)/TiO_3/SiO_3/Si$ substrates, the specimen without $Y_2O_3$buffer layer did not show the hysteresis curve, while the buffer-layered has the remnant polarization of $1.14_{mu}C/cm^2$. It was concluded that the leakage current density and the ferroelectricity for the $YMnO_3$ thin films could be controlled by varying crystalline phases and their preferred orientation which depend on the kind of substrates and whether the $Y_2O_3$buffer layer exist or not.

• Journal of the Korean Crystal Growth and Crystal Technology
• /
• v.4 no.1
• /
• pp.11-20
• /
• 1994

GaAs and AlGaAs epi-layers were grown on semi-insulating (100) GaAs substrate by molecular beam epitaxy (MBE) and their electrical and optical properties have been investigated by several measurements. In undoped GaAs, the p-type GaAs layers with the good surface morphology were obtained under the growth conditions of the substrate temperatures ranging from 570 to $585^{\circ}C$ and the $As_4$/Ga ratios from 17 to 22. In the samples with the growth rates of the ranges of $0.9~1.1 {\mu}m/h$, the impurity concentrations were in the ranges of $1.5{\times}10^{14}~5.6{\times}10^{14}cm^{-3}$ with the Hall mobilities of $590~410cm^2/V-s$. In the Si-doped GaAs, the n-type GaAs layers with low electro trap, only two hole deep levels were observed with uniform doping profiles (<1%). AlGaAs layers with good surface morphology and crystallinity were grown under an optimum condition of the substrate temperature, $600^{\circ}C $. 8 deep level defects were observed between 0.17~0.85eV in undoped AlGaAs layers.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2009.06a
• /
• pp.235-235
• /
• 2009

This paper describes the influence of a polycrystalline (poly) 3C-SiC buffer layer on the surface acoustic wave (SAW) properties of poly aluminum nitride (AlN) thin films by comparing the center frequency, insertion loss, the electromechanical coupling coefficient ($k^2$), andthetemperaturecoefficientoffrequency(TCF) of an IDT/AlN/3C-SiC structure with those of an IDT/AlN/Si structure, The poly-AlN thin films with an (0002)-preferred orientation were deposited on a silicon (Si) substrate using a pulsed reactive magnetron sputtering system. Results show that the insertion loss (21.92 dB) and TCF (-18 ppm/$^{\circ}C$) of the IDT/AlN/3C-SiC structure were improved by a closely matched coefficient of thermal expansion (CTE) and small lattice mismatch (1 %) between the AlN and 3C-SiC. However, a drawback is that the $k^2(0.79%)$ and SAW velocity(5020m/s) of the AlN/3C-SiC SAW device were reduced by appearing in some non-(0002)AlN planes such as the (10 $\bar{1}$ 2) and (10 $\bar{1}$ 3) AlN planes in the AlN/SiC film. Although disadvantages were shown to exist, the use of the AlN/3C-SiC structure for SAW applications at high temperatures is possible. The characteristics of the AlN thin films were also evaluated using FT-IR spectra, XRD, and AFM images.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2014.02a
• /
• pp.334.2-334.2
• /
• 2014

본 연구에서는 a-InGaZnO (IGZO) 활성층에 대기분위기에서 열처리 온도를 각각 $150^{\circ}C$, $250^{\circ}C$, $350^{\circ}C$ 실시하여 전자구조와 광학적 특성분석 및 화학적 결합 상태의 변화를 알아보고, 이러한 물성 변화에 따른 소자의 특성을 알아 보았다. 박막 트랜지스터 소자의 전기적 특성은, IGZO 박막에 후 열처리 공정온도 후 제작한 박막 트랜지스터는 $150^{\circ}C$에서 3.1 cm2/Vs의 전계 효과 이동도와 0.38 V/decade의 문턱전압 이하 기울기를 보였으나, $350^{\circ}C$에서는 8.8 cm2/Vs의 전계 효과 이동도와 0.20 V/decade의 문턱전압 이하 기울기로 더 향상된 박막 트랜지스터의 전기적 특성 결과를 관측하였다. 전기적 소자 특성의 변화와 활성층 IGZO 박막 특성 변화와의 상관관계를 조사하기 위하여 X-ray Absorption Spectroscopy (XAS)과 Spectroscopy Ellipsometry (SE)로 측정된 흡수 스펙트럼을 통하여 3 eV 이상의 광학적 밴드 갭은 기존에 보고 되었던 a-IGZO와 유사한 특성을 보이고 있음을 확인하였고, 이러한 측정, 분석법들을 통해 후 열처리 공정 온도에 따른 밴드 갭 부근의 결함준위의 양 변화와 가전자대의 전자구조의 변화에 따라 전기적 특성이 달라짐을 확인 할 수 있었다. 또한, X-ray Photoemission Spectroscopy (XPS)를 통해 측정한 O-1s를 통해 Oxygen deficient state와 밴드 갭 부근의 결함준위와의 상관관계를 도출해낼 수 있었다. 이는 a-IGZO 활성층에 후 열처리 공정 온도 변화에 따라서 전자구조의 혼성변화와 밴드 갭 부근의 결함준위의 양의 변화, 에너지 준위의 변화 및 이와 연관된 화학적 상태 변화가 박막 트랜지스터의 특성 변화를 예상할 수 있다는 결과를 도출하였다.

• Applied Chemistry for Engineering
• /
• v.9 no.1
• /
• pp.101-106
• /
• 1998

Two types of CoMo/zeolite as well as $NiMo/{\gamma}-Al_2O_3$ were prepared and their activities and selectivities of low-temperature dibenzothiophene(DBT) hydrodesulfurization(HDS) were studied in high pressure fixed bed reactor. The HDS activities of CoMo/zeolites were higher than that of $NiMo/{\gamma}-Al_2O_3$ at temperatures below $225^{\circ}C$ while they were lower than that of $NiMo/{\gamma}-Al_2O_3$ at temperatures higher than $275^{\circ}C$. The main products from $NiMo/{\gamma}-Al_2O_3$ were biphenyl and cyclohexylbenzene. The product distribution of CoMo/zeolite catalysts was different from that of $NiMo/{\gamma}-Al_2O_3$. It is speculated that DBT is converted to alkylcyclohexane over zeolite based catalysts through both alkylation and hydrogenation reactions. The crystal structure of molybdenum was $MoO_3$ in fresh zeolite support while mixtures of $MoO_3$ and $MoS_2$ were observed in the aged catalyst.

• Clean Technology
• /
• v.3 no.1
• /
• pp.96-105
• /
• 1997

The objectives of this study were to investigate $SO_2$ removal efficiency of anthracite - bituminous coal blend combustion in a fludized bed coal combustor with Ca/S, anthracite ratio, bed temperature, and waste paper sludge particle size. The experimental results were presented as follow ; the effect of the desulfurization by the particle size of waste paper sludge was a great and $SO_2$ removal efficiency was heigest in paper sludge dia $1016{\mu}m$. And the difference of $SO_2$ removal efficiency according to air velocity was not too large. As Ca/S mole ratio incresed, $SO_2$ removal efficiency incresed rapidly up to Ca/S mole ratio 3 while the desulfurization rates did not increse too largely in the range of more than the level. The bed temperature had a great deal of effect on the desulfurization rate. So the $SO_2$ removal efficiency was a graet using waste paper sludge that the properbility of paper sludge as sorbent was conformed.

• Journal of the Korean Vacuum Society
• /
• v.16 no.3
• /
• pp.187-191
• /
• 2007

In this paper, the catalyst layer is deposited on silicon substrate using magnetron sputtering system and carbon nanotubes(CNTs) were grown in $NH_3\;and\; C_2H_2$ gas by hot-filament plasma enhanced chemical vapor deposition (HFPECVD) system. A growth temperature of carbon nanotubes was changed from $350^{\circ}C\;to\;650^{\circ}C\;by\;100^{\circ}C$. We observed the shape of CNTs by a field-emission scanning electron microscope(FE-SEM) measurement and analyzed the surface characteristic of CNTs layer by contact angle measurement. That is, the growth temperature of CNTs is the important factor leads to the variation of the properties.

• Journal of Sensor Science and Technology
• /
• v.10 no.6
• /
• pp.295-303
• /
• 2001

White emission thin film electroluminecent device was fabricated with ZnS for phosphor layers and BST ferroelectric thin film for insulating layers. The ZnS:Mn and $ZnS:SmF_3$ layers were used for emission of red color. Also the $ZnS:TbF_3$ and $ZnS:AgF_3$ layers were used to emission of green and blue color, respectively. And the fabrication conditions of the BST insulating layers were followings, that is, the composition ratio of target, substrate temperature, working pressure and operating gas ratio were $Ba_{0.5}Sr_{0.5}Ti_{0.3}$, $400^{\circ}C$, 30 mTorr and 9:1, respectively. The thickness of phosphor were 150 nm for each layers and the insulating layers of upper and bottom were 400 nm and 200 nm, respectively. The luminesence threshold voltage was $75\;V_{rms}$ and the maximum brightness of the thin film electroluminecent device was $3200\;cd/m^2$ at $100\;V_{rms}$.

• Journal of Korea Soil Environment Society
• /
• v.3 no.3
• /
• pp.75-86
• /
• 1998

This paper is going to show the way we can sample the landfill gases flowing out to the air through final cover soil by using an closed chamber in the field for a short time. In addition, we came to the following results through the application of model with actual measurements. 1) Analyzing changes of concentration in the chamber(H: 10-30cm) every 5 minutes, considering analysis time of gas chromatograph for an half hour. 2) The proportion of $CE_4$to $CO_2$changes rapidly near the surface of final cover soil by the influence of methane oxidation reaction. 3) When flux of landfill gas is F=$10^{-5}$mol/$\textrm{m}^2$.s), methane oxidation reaction has an influence on composition of gases, however there is little influence when F=$10^{-6}$ mol/($\textrm{m}^2$.s).

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.25 no.8
• /
• pp.575-579
• /
• 2012

Heteroepitaxial InP films have been grown on GaAs substrates to study the effects of the nucleation layer's surface roughness on the epitaxial layer's quality. For this, InP nucleation layers were grown at $400^{\circ}C$ with various ethyldimethylindium (EDMIn) flow rates and durations of growth, annealed at $6200^{\circ}C$ for 10 minutes and then InP epitaxial layers were grown at $550^{\circ}C$. It has been found that the nucleation layer's surface roughness is a critical factor on the epitaxial layer's quality. When a nucleation layer is grown with an EDMIn flow rate of 2.3 ${\mu}mole/min$ for 12 minutes, the surface roughness of the nucleation layer is minimum and the successively grown epitaxial layer's qualities are comparable to those of the homoepitaxial InP layers reported. The minimum full width at half maximum of InP (200) x-ray diffraction peak and that of near-band-edge peak from a 4.4 K photoluminescence are 60 arcmin and 6.33 meV, respectively.