• Transactions of the Korean Society of Mechanical Engineers B
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• v.35 no.6
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• pp.569-575
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• 2011

Since the high heat generation of LED chips can cause a reduction in lifetime, degradation of luminous efficiency, and variation of color temperature, studies have been carried out on the optimization of LED packaging and heat sinks. Recently, LED packages have been applied to high-power lights such as car headlamps or street lights, and it is known that cooling using only free convection is not at all efficient. Thus, in this study, a heat pipe with forced convection was examined for the optimization of the cooling performance in high-power LED lights. In addition, optimal on-off control of a fan was adopted to increase the fan lifetime, since the lifetime of the fan is generally shorter than that of the LEDs.

• Journal of Drive and Control
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• v.12 no.1
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• pp.21-27
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• 2015

Pneumatic cylinders are classified into rod-type pneumatic cylinders and rodless pneumatic cylinders depending on the presence of the rod. Rodless cylinders have a constant area and have no deflection. Rodless cylinders are widely used in automatic systems requiring high-speed performance and high-precision transportation. However, the research of the pneumatic cylinder has been focused on the structure and life characteristics. In this research, aging characteristics and shape parameter analysis which are related to the lifetime were investigated. By conducting the lifetime tests with two different materials for the transfer plate, the failure mode and lifetime characteristics were analyzed. By the Anderson-Darling (A-D) verification based on the complete data set, the analysis results of lifetime distribution, shape parameter, and scale parameter were provided.

• Nuclear Engineering and Technology
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• v.55 no.3
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• pp.919-926
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• 2023

To analyze the cause of the destruction of thin, carbon-backed lithium fluoride targets during a measurement of the fusion of ⁷Li and ¹⁷O, we estimate theoretically the lifetimes of carbon and LiF films due to sputtering, thermal evaporation, and lattice damage and compare them with the lifetime observed in the experiment. Sputtering yields and thermal evaporation rates in carbon and LiF films are too low to play significant roles in the destruction of the targets. We estimate the lifetime of the target due to lattice damage of the carbon backing and the LiF film using a previously reported model. In the experiment, elastically scattered target and beam ions were detected by surface silicon barrier (SSB) detectors so that the product of the beam flux and the target density could be monitored during the experiment. The areas of the targets exposed to different beam intensities and fluences were degraded and then perforated, forming holes with a diameter around the beam spot size. Overall, the target thickness tends to decrease linearly as a function of the beam fluence. However, the thickness also exhibits an increasing interval after SSB counts per beam ion decreases linearly, extending the target lifetime. The lifetime of thin LiF film as determined by lattice damage is calculated for the first time using a lattice damage model, and the calculated lifetime agrees well with the observed target lifetime during the experiment. In experiments using a thin LiF target to induce nuclear reactions, this study suggests methods to predict the lifetime of the LiF film and arrange the experimental plan for maximum efficiency.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.429-429
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• 2012

To investigate the gettering effect of B-doped n-type monocrystalline silicon wafer, we made the p-n junction by diffusing boron into n-type monocrystalline Si substrate and then oxidized the boron doped n-type monocrystalline silicon wafer by in-situ wet and dry oxidation. After oxidation, the minority carrier lifetime was measured by using microwave photoconductance and the sheet resistance by 4-point probe, respectively. The junction depth was analyzed by Secondary Ion Mass Spectrometry (SIMS). Boron diffusion reduced the metal impurities in the bulk of silicon wafer and increased the minority carrier lifetime. In the case of wet oxidation, the sheet resistance value of ${\sim}46{\Omega}/{\Box}$ was obtained at $900^{\circ}C$, depostion time 50 min, and drive-in time 10 min. Uniformity was ~7% at $925^{\circ}C$, deposition time 30 min, and drive-in time 10 min. Finally, the minority carrier lifetime was shown to be increased from $3.3{\mu}s$ for bare wafer to $21.6{\mu}s$ for $900^{\circ}C$, deposition 40 min, and drive-in 10 min condition. In the case of dry oxidation, for the condition of 50 min deposition, 10 min drive-in, and O2 flow of 2000 SCCM, the minority carrier lifetime of 16.3us, the sheet resistance of ${\sim}48{\Omega}/{\Box}$, and uniformity of 2% were measured.

• Journal of Applied Reliability
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• v.6 no.1
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• pp.37-50
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• 2006

The accelerated life tests of the catalytic gas sensor were performed at three different gas concentration conditions. From the test data, the power-Weibull model was estimated and the acceleration factor between test condition 25%LEL(Lowe Explosive Limit) and use condition 5%LEL was about 3 according to this acceleration model. Using this acceleration factor, life test specification for qualifying that B10 lifetime of the catalytic gas sensor meets the goal lifetime (5 years) was designed.

• Journal of the Microelectronics and Packaging Society
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• v.15 no.2
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• pp.55-61
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• 2008

This paper shows quantitative reliability evaluations of a Bluetooth module through extending previous qualitative methods limited to structure reliability tests and solder joint reliability tests for Bluetooth modules. Accelerated Life Testing (ALT) of the modules using temperature difference in temperature cycling as an accelerated stress was conducted for quantitative reliability evaluation under field environment conditions. Lifetime distribution parameters were estimated using the failure times obtained through the ALT, and then Coffin-Manson model was implemented. Results of the ALT showed that the failure mode of the modules was open and the failure mechanisms are both crack and delamination. The ALT reproduced the failure mode and mechanisms of failed Bluetooth modules collected from the field. Further, a quantitative reliability evaluation method with respect to various temperature differences in temperature cycling was proposed in this paper. $B_{10}$ lifetime of the module for the temperature difference $70^{\circ}C$ using the proposed method would be estimated as about 4 years.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.27 no.11
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• pp.1595-1603
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• 2003

Droplet combustion at high ambient pressures is studied numerically by formulating one dimensional combustion model in the mixture of n-heptane fuel and air. The ambient pressure is supercritical conditions. The modified Soave-Redlich-Kwong state equation is used in the evaluation of thermophysical properties to account for the real gas effect on fluid p-v-T properties in high pressure conditions. Non-ideal thermodynamic and transport property at near critical and supercritical conditions are also considered. Several parametric studies are performed by changing ambient pressure and initial droplet diameter. Droplet lifetime decreased with increasing pressure. Surface temperature increased with increasing pressure. Ignition time increased with increasing initial droplet diameter. Temporal or spatial distribution of mass fraction, mass diffusivity, Lewis number, thermal conductivity, and specific heat were presented.

• Structural Engineering and Mechanics
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• v.60 no.1
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• pp.71-90
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• 2016

In this paper, the normalized variable V=(log N-B)(log ${\Delta}{\sigma}-C$-C), as derived from the probabilistic S-N field of Castillo and Canteli, is taken as a reference for calculation of damage accumulation and probability of failure using the Miner number in scenarios of variable amplitude loading. Alternative damage measures, such as the classical Miner and logarithmic Miner, are also considered for comparison between theoretical lifetime prediction and experimental data. The suitability of this approach is confirmed for it provides safe lifetime prediction when applied to fatigue data obtained for riveted joints made of a puddle iron original from the Fao bridge, as well as for data from experimental programs published elsewhere carried out for different materials (aluminium and concrete specimens) under distinct variable loading histories.

• Current Photovoltaic Research
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• v.7 no.3
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• pp.55-60
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• 2019

Polymer:nonfullerene solar cells with an inverted-type device structure were fabricated by employing the bulk heterojunction (BHJ) active layers, which are composed of poly[(2,6-(4,8-bis(5-(2-ethylhexyl)thiophene-2-yl)-benzo[1,2-b:4,5-b']dithiophene))-alt-(5,5-(1',3'-di-2-thienyl-5',7-bis(2-ethylhexyl)benzo[1',2'-c:4',5'-c']dithiophene-4,8-dione))] (PBDB-T) and 3,9-bis(6-methyl-2-methylene-(3-(1,1-dicyanomethylene)-indanone))-5,5,11,11-tetrakis(4-hexylphenyl)-dithieno[2,3-d:2',3-d']-s-indaceno[1,2-b:5,6-b']dithiophene (IT-M). The BHJ layers were formed on a pre-patterned indium-tin oxide (ITO)-coated glass substrate by spin-coating using the blend solutions of PBDB-T and IT-M. The solar cell performances were investigated with respect to the cell position on the ITO-glass substrates. In addition, the short-term shelf lifetime of solar cells was tested by storing the PBDB-T:IT-M solar cells in a glovebox filled with inert gas. The results showed that the performance of solar cells was relatively higher for the cells close to the center of substrates, which was maintained even after storage for 24 h. In particular, the PCE of PBDB-T:IT-M solar cells was marginally decreased after storage for 24 h owing to the slightly reduced fill factor, even though the open circuit voltage was unchanged after 24 h.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.36 no.4B
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• pp.346-353
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• 2011

Routing schemes that service applications with various delay times, maintaining the long network life time are required in wireless sensor & actor networks. However, it is known that network lifetime and hop count of trees used in routing methods have the tradeoff between them. In this paper, we propose a Pareto Ant Colony Optimization algorithm to find the Pareto tree set such that it optimizes these both tradeoff objectives. As it enables applications which have different delay times to select appropriate routing trees, not only satisfies the requirements of various multiple applications but also guarantees long network lifetime. We show that the Pareto tree set found by proposed algorithm consists of trees that are closer to the Pareto optimal points in terms of hop count and network lifetime than minimum spanning tree which is a representative routing tree.