• Title/Summary/Keyword: voltage standard

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Low-voltage current-mode filters using complementary current mirrors (상보형 전류미러를 이용한 저전압 전류모드 필터의 설계)

  • 안정철;최석우;윤창훈
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.34C no.11
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    • pp.56-65
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    • 1997
  • In this paper, a design of current-mode continuous-time filters for low voltage and high frequency applictions using complementary bipolar current mirror paris is presented. The proposed current-mode filters consist of simple bipolar current mirrors and capacitors and are quite suitable for monolithic integrtion. Since the design method of the proposed curent-mode filters is based on the integrator type of realization, it can be used for a wide range of applications. And the cutoff frequency of th efilters can be easily changed by the DC cntrolling current. As design examples, the 5th order butterworth filters are designed by cascade and leapfrog methods with tunable cutoff frequencies from 30MHz to 100MHz. The characteristics of the designed current mode filters are simulated and examined by SPICE using standard bipolar transistor parameters.

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Feasibility Study of Non-volatile Memory Device Structure for Nanometer MOSFET (나노미터 MOSFET비휘발성 메모리 소자 구조의 탐색)

  • Jeong, Ju Young
    • Journal of the Semiconductor & Display Technology
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    • v.14 no.2
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    • pp.41-45
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    • 2015
  • From 20nm technology node, the finFET has become standard device for ULSI's. However, the finFET process made stacking gate non-volatile memory obsolete. Some reported capacitor-less DRAM structure by utilizing the FBE. We present possible non-volatile memory device structure similar to the dual gate MOSFET. One of the gates is left floating. Since body of the finFET is only 40nm thick, control gate bias can make electron tunneling through the floating gate oxide which sits across the body. For programming, gate is biased to accumulation mode with few volts. Simulation results show that the programming electron current flows at the interface between floating gate oxide and the body. It also shows that the magnitude of the programming current can be easily controlled by the drain voltage. Injected electrons at the floating gate act similar to the body bias which changes the threshold voltage of the device.

Analysis of Heat Characteristics for Fault Power Utility (전기설비 사고의 열적 특성 분석)

  • 김기화
    • Fire Science and Engineering
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    • v.11 no.4
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    • pp.25-31
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    • 1997
  • In this study, EMTP(Electromagnetic Transients Program) which is one of the most well-known computer simulation methods is used to collect the data for a power plant fault. EMTP is the program for an interpretation of the phenomena of electric transients, and is designed to manifest the data of the electric current and voltage etc. at the time of a power plant fault. By EMTP, I analyze the properties of the heat energy which are transferred from the electrics when a power plant fault brings out. In terms of the results of this study, it is able to measure the heat energy at a power plant fault (power transformer) and to be acquired of the related data. And moreover, these data are expected to be used as a standard for the protection of the fire owing to a high voltage power transformer fault.

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A 2.7Gbps & 1.62Gbps Dual-Mode Clock and Data Recovery for DisplayPort in $0.18{\mu}m$ CMOS

  • Lee, Seung-Won;Kim, Tae-Ho;Lee, Suk-Won;Kang, Jin-Ku
    • Journal of IKEEE
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    • v.14 no.1
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    • pp.40-46
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    • 2010
  • This paper describes a clock and data recovery (CDR) circuit that supports dual data rates of 2.7Gbps and 1.62Gbps for DisplayPort standard. The proposed CDR has a dual mode voltage-controlled oscillator (VCO) that changes the operating frequency with a "Mode" switch control. The chip has been implemented using $0.18{\mu}m$ CMOS process. Measured results show the circuit exhibits peak-to-peak jitters of 37ps(@2.7Gbps) and 27ps(@1.62Gbps) in the recovered data. The power dissipation is 80mW at 2.7Gbps rate from a 1.8V supply.

Development of an Automatic Excitation Characteristics Measurement System of the Protective Relaying CT (보호계전기용 CT의 여자특성 자동측정 시스템 개발)

  • Kwon, Sung-Won;Kim, Mun-Seog;Kim, Jae-Young;Lee, Sung-Ha;Jung, Jae-Kap
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.868-869
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    • 2008
  • An automatic excitation characteristics measurement system for the protective relaying current transformer(CT) with accuracy of about 1 % has been developed. The system can be used up to 2 kV and 10 A at power frequency. The developed system can calculate the voltage and current at knee points of $30^{\circ}$ and $45^{\circ}$ tangents in accordance with IEEE standard by the interpolation in log scale. The excitation curve of the CT is plotted in auto-scale simultaneously with measuring rms voltage and current at the secondary of the CT.

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Protecting electronic equipment against lightning surge (옥외용 전자장비의 낙뢰 서지 대책)

  • 임순재;이주광;이완규;최만용
    • Journal of the Korean Society of Safety
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    • v.12 no.1
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    • pp.29-36
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    • 1997
  • Precision electronic equipments for outdoor use are composed of sophisticated microcircuits that are extremely vulnerable to lightning-caused voltage spike. This transient voltage spike may cause upset, latent failure or Interference on electronic equipments. In order to develop efficient lightning protection measures on AC power lines of a road traffic controller as a electronic equipment for outdoor use, experimental surge immunity tests were conducted according to IEC standard 801-5. The combination of gas tube arrester and metal-oxide varistor was installed at the input of AC power lines and the silicon avalanche suppressor installed at the output of DC power supply for the lightning protection measures.

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A Study on the Accelerated Life-time Test method Of MgO thin film in the AC PDP

  • Park, Chung-Hoo;Choi, Min-Seok;Choi, Joon-Young;Kim, Dong-Hyun;Lee, Ho-Jun
    • 한국정보디스플레이학회:학술대회논문집
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    • 2002.08a
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    • pp.217-220
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    • 2002
  • In this paper, an accelerated lifetime test method of MgO thin film is suggested. The most important test factors are surface temperature of the PDP, gas pressure, the applied voltage and frequency. The standard test conditions are $50^{\circ}C$, 400Torr, 20% over voltage and 300kHz ,respectively. The accelerated lifetime of MgO is significantly varied with the MgO preparing conditions.

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Effect of S on Arc Stability of MAG Welding (MAG용접의 Arc안정성에 미치는 S의 영향)

  • 안영호;이종봉;엄동석
    • Journal of Welding and Joining
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    • v.17 no.1
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    • pp.55-61
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    • 1999
  • The effect of S content in welding wires on the arc stability was investigated, in the region of short circuit transfer and spray transfer. In the region of short circuit transfer, with increasing S content, average arcing time and average short circuit time were decreased. Therefore, droplet transfer frequency was increased, due to the reduction of arcing time and peak current at the moment of arc-reiginition was decreased, due to the decrease of short circuit time. In the region of spray transfer, the fluctuation degree of arc current and arc voltage became more stable, with increasing S content.

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Reliability Evaluation of RF Power Amplifier for Wireless Transmitter

  • Choi, Jin-Ho
    • Journal of information and communication convergence engineering
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    • v.6 no.2
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    • pp.154-157
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    • 2008
  • A class-E RF(Radio Frequency) power amplifier for wireless application is designed using standard CMOS technology. To drive the class-E power amplifier, a class-F RF power amplifier is used and the reliability characteristics are studied with a class-E load network. The reliability characteristic is improved when a finite-DC feed inductor is used instead of an RF choke with the load. After one year of operating, when the load is an RF choke the output current and voltage of the power amplifier decrease about 17% compared to initial values. But when the load is a finite DC-feed inductor the output current and voltage decrease 9.7%. The S-parameter such as input reflection coefficient(S11) and the forward transmission scattering parameter(S21) is simulated with the stress time. In a finite DC-feed inductor the characteristics of S-parameter are changed slightly compared to an RF-choke inductor. From the simulation results, the class-E power amplifier with a finite DC-feed inductor shows superior reliability characteristics compared to power amplifier using an RF choke.

The Optimal Circuit Condition Selection for Cable Charging Current Test by IEC60265-1 (IEC60265-1에 의한 케이블 충전전류 시험을 위한 최적 회로 조건 선정)

  • Kim, K.D.;Hur, Y.S.;Yun, J.H.;Lee, H.C.;Ham, G.H.;Park, J.H.
    • Proceedings of the KIEE Conference
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    • 2001.07a
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    • pp.264-266
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    • 2001
  • We must consider resistance capacitance and their circuit connection condition for cable charging current test by IEC60265-1. According to their values and circuits, the ratio of applied voltage and transient recovery voltage are much different. This paper is convinced of TRV waves and proposes the optical circuit required at the standard via the simulation of all circuit conditions.

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