• Title/Summary/Keyword: vernier

Search Result 113, Processing Time 0.031 seconds

A Time-to-Digital Converter with PVT Variation Compensation Capability (PVT 변화 보상 기능을 가지는 시간-디지털 변환기)

  • Eunho Shin;Jongsun Kim
    • Journal of IKEEE
    • /
    • v.27 no.3
    • /
    • pp.234-238
    • /
    • 2023
  • In this paper, we propose a time-to-digital converter (TDC) with compensation capability for PVT (process, voltage, and temperature) variations. A typical delay line-based TDC measures time based on the inverter's propagation delay, making it fundamentally sensitive to PVT variations. This paper presents a method to minimize the resolution change of TDC by compensating for the propagation delay caused by the PVT variations. Additionally, it dopts Cyclic Vernier TDC (CVTDC) structure to provide a wide input detection range. The proposed CVTDC with PVT compensation function is designed using a 45nm CMOS process, consumes 8mW of power, offers a TDC resolution of 5 ps, and has an input detection range of about 5.1 ns.

Stress Measurement of films using surface micromachined test structures (표면 미세 가공된 구조체를 이용한 박막의 응력 측정)

  • 이창승;정회환;노광수;이종현;유형준
    • Proceedings of the Korean Society of Precision Engineering Conference
    • /
    • 1996.11a
    • /
    • pp.721-725
    • /
    • 1996
  • The microfabricated test structures were used in order to evaluate the stress characteristics in films. The test structures were fabricated using surface micromachining technique, including HF vapor phase etching as an effective release method. The fabricated structures were micro strain gauge, cantilever-type vernier gauge and bridge for stress measurement, and cantilever for stress gradient measurement. The strain was measures by observing the deformation of the structures occurred after release etching and the amount of deformation can be detected by micro vernier gauge, which has gauge resolution of 0.2${\mu}{\textrm}{m}$. The detection principles and the degree of precision for the measured strain were also discussed. The characteristics of residual stress in LPCVD polysilicon films were studied using these test structures. The stress gradient due to the stress variation through the film thickness was calculated by measuring the deflection at the cantilever free end.

  • PDF

The Design of a 0.15 ps High Resolution Time-to-Digital Converter

  • Lee, Jongsuk;Moon, Yong
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.15 no.3
    • /
    • pp.334-341
    • /
    • 2015
  • This research outlines the design of a HR-TDC (High Resolution Time-to-Digital Converter) for high data rate communication systems using a $0.18{\mu}m$ CMOS process. The coarse-fine architecture has been adopted to improve the resolution of the TDC. A two-stage vernier time amplifier (2S-VTA) was used to amplify the time residue, and the gain of the 2S-VTA was larger than 64. The error during time amplification was compensated using two FTDCs (Fine-TDC) with their outputs. The resolution of the HR-TDC was 0.15 ps with a 12-bit output and the power consumption was 4.32 mW with a 1.8-V supply voltage.

Change of Fixation Disparity and Accommodation when the Fusion Contrast Varied (융합대비에 따른 주시시차와 조절의 변화)

  • Seo, Jae-Myoung
    • Journal of Korean Ophthalmic Optics Society
    • /
    • v.14 no.4
    • /
    • pp.77-81
    • /
    • 2009
  • Purpose: To study the change of fixation disparity and accommodation as fusion contrast is deteriorated. Methods: 16 subjects who had above 20/20 and stereopsis took part. Monocular and binocular refraction were done with Zeiss Polatest Classic whereas the critical angle for stereopsis was done with TNO. A computer programmed with Random-Dot stereogram and vernier test managed a precise change of the fusion contrast and exposure time. Results: The fixation disparity was influenced by reduction of fusion contrast and had tendancy to exophoria (p=0.0004), especially it is considerably higher when uncrossed disparity was shown to exophoric subjects. Although accommodation was not influenced by a change of fusion contrast (p=0.803), vernier acuity was influenced (p=0.0000). Conclusions: Exophoric trend arose as the fusion contrast was reduced, nevertheless there was no accommadative change.

  • PDF

Collimation testing of a white light beam and measurement of chromatic aberration of a lens by using vernier Moire fringe patterns (버니어 무아레 무늬를 이용한 백색광의 시준 검사 및 렌즈의 색수차 측정)

  • 송종섭
    • Korean Journal of Optics and Photonics
    • /
    • v.11 no.4
    • /
    • pp.232-238
    • /
    • 2000
  • The new collimation testing technique of a white light beam using vernier Moire fringes of two line or circular gratings with different pitches is presented. We can visually measure the defocusing ($\Deltaf$), the divergence angle ($\theta$), and the longitudinal chromatic aberration $(L_{ch})$ of a collimating lens by using the technique. For example, we obtained $\Deltaf$= 21.9 mm and $\theta=0.0038^{\circ}$ for a testing lens with the focallengthf = 120.0 mm and F-number of F/2.4. The longitudinal chromatic aberration $L_{ch}$ of another testing lens withf = 65.0 mm, F/1.6, and the Abbe number V = 64.1 for the incident wavelengths of $\lambda_1=480 nm and \lambda_2=640 nm$ is easily measured by same technique. It is found that the measured value $L_{ch}=1.59mm(\pm0.01mm)$ is well agreed with $L_{ch}=1.58mm(\pm0.01mm)$ obtained by the autofocus method.

  • PDF

All Digital DLL with Three Phase Tuning Stages (3단 구성의 디지털 DLL 회로)

  • Park, Chul-Woo;Kang, Jin-Ku
    • Journal of IKEEE
    • /
    • v.6 no.1 s.10
    • /
    • pp.21-29
    • /
    • 2002
  • This paper describes a high resolution DLL(Delay Locked Loop) using all digital circuits. The proposed architecture is based on the three stage of coarse, fine and ultra fine phase tuning block which has a phase detector, selection block and delay line respectively. The first stage, the ultra fine phase tuning block, is tune to accomplish high resolution using a vernier delay line. The second and third stage, the coarse and fine tuning block, are tuning the phase margin of Unit Delay using the delay line and are similar to each other. It was simulated in 0.35um CMOS technology under 3.3V supply using HSPICE simulator. The simulation result shows the phase resolution can be down to lops with the operating range of 250MHz to 800MHz.

  • PDF

Design of a 26ps, 8bit Gated-Ring Oscillator Time-to-Digital Converter using Vernier Delay Line (버니어 지연단을 이용한 26ps, 8비트 게이티드 링 오실레이터 시간-디지털 변환기의 설계)

  • Jin, Hyun-Bae;Park, Hyung-Min;Kim, Tae-Ho;Kang, Jin-Ku
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.48 no.2
    • /
    • pp.7-13
    • /
    • 2011
  • This paper presents a Time-to-Digital Converter which is a key block of an All-Digital Phase Locked Loop. In this work, a Vernier Delay Line is added in a conventional Gated Ring Oscillator, so it could get multi-phases and a high resolution. The Gated Ring Oscillator uses 7 unit delay cell, the Vernier Delay Line is used each delay cell. So proposed Time-to-Digital Converter uses total 21 phases. This Time-to-Digital Converter circuit is designed and laid out in $0.13{\mu}m$ 1P-6M CMOS technology. The proposed Time-to-Digital Converter achieves 26ps resolution, maximum input signal frequency is 100MHz and the digital output of proposed Time-to-Digital Converter are 8-bits. The proposed TDC detect 5ns phase difference between Start and Stop signal. A power consumption is 8.4~12.7mW depending on Enable signal width.

Time-Domain Analysis of Coupled-Ring Reflector Laser Diode Including Active Region within Resonators (공진기 내에 이득 영역을 포함하는 Coupled-Ring Reflector 레이저 다이오드의 시 영역 해석)

  • Yun, Pil-Hwan;Kim, Su-Hyeon;Jeong, Yeong-Cheol
    • Proceedings of the Optical Society of Korea Conference
    • /
    • 2006.02a
    • /
    • pp.313-314
    • /
    • 2006
  • We have investigated the wavelength tuning characteristics due to the vernier effect of coupled-ring reflector laser diode including active region within resonators using time-domain modeling. It is shown that the wavelength can be widely tuned with side mode suppression ratio more than 30dB by adjusting the refractive index difference between mismatched rings.

  • PDF

Abutment Sinking and Fitness of Conical Internal Connection Implant System according to Loading Condition (하중조건에 따른 원추형 내측연결 임플랜트 시스템에서 지대주 침하 및 적합에 관한 연구)

  • Lee, Hal-La;Kim, Hee-Jung;Son, Mee-Kyoung;Chung, Chae-Heon
    • Journal of Dental Rehabilitation and Applied Science
    • /
    • v.24 no.1
    • /
    • pp.77-89
    • /
    • 2008
  • The purpose of this study was to evaluate internal conical abutment sinking and fitness according to the loading condition. In this study, Alloden implant fixture and two abutment(conventional, FDI) systems were used. Each abutment was applied 1 time of finger force, 3 times of malleting force, 5 times of 20kg and extra several times to the fixture until the amount of abutment singking showed no change. Then, the length of abutment to fixture which was binding lightly with no pressure state was measured by Vernier caliper. After loading application, the length was remeasured and the amount of sinking was calculated. The implant was buried in unsaturated polyester (Epovia, Cray Valley Inc. Korea) for making a comparison between the change of length and fitness of abutment-fixture connection part. Then All samples were cross-sectioned with high speed precision cut-off(accutom-5, Struers, Denmark). Finally, The result were observed and analyzed using FE-SEM (field emission scanning electron microscopy).