• Journal of Information Display
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• v.10 no.1
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• pp.16-18
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• 2009

A three-terminal hybrid-aligned nematic liquid crystal (3T-HAN LC) cell capable of fast turn-off switching is proposed in this paper. By employing the relaxation process initiated by an electric-field pulse, a fast turn-off time of less than 1 ms can be obtained through optically hidden relaxation. A low operating voltage and high transmittance were confirmed through simulations and experiments.

• Proceedings of the KIPE Conference
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• 2000.07a
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• pp.137-140
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• 2000

This paper proposes an improved soft switching two-transistor forward converter which uses a novel lossless snubber circuit to effectively control the turn-off dv/dt rate of the main transistors. In the proposed soft switching implementation the turn-off voltage traces across the main two transistors are almost the same contributing to reduce the total capacitive turn-on loss and the snubber current is divided into the two transistors resulting in distributed thermal stresses

• Nuclear Engineering and Technology
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• v.54 no.2
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• pp.501-506
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• 2022

Long turn-off time limits high frequency operation of Bipolar Junction Transistors (BJTs). Turn-off time decreases with increases in the recombination rate of minority carriers at switching transients. Fast neutron irradiation on a Si BJT incurs lattice damages owing to the displacement of silicon atoms. The lattice damages increase the recombination rate of injected holes with electrons, and decrease the hole lifetime in the base region of pnp Si BJT. Fast neutrons generated from a beryllium target with 30 MeV protons by an MC-50 cyclotron were irradiated onto pnp Si BJTs in experiment. The experimental results show that the turn-off time, including the storage time and fall time, decreases with increases in fast neutron fluence. Additionally, it is confirmed that the base current increases, and the collector current and base-to-collector current amplification ratio decrease due to fast neutron irradiation.

• Journal of Power Electronics
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• v.18 no.3
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• pp.892-901
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• 2018

SiC MOSFETs have been used to improve system efficiency in high frequency converters due to their extremely high switching speed. However, this can result in undesirable parasitic oscillations in practical systems. In this paper, models of the key components are introduced first. Then, theoretical formulas are derived to calculate the switching oscillation frequencies after full turn-on and turn-off in clamped inductive circuits. Analysis indicates that the turn-on oscillation frequency depends on the power loop parasitic inductance and parasitic capacitances of the freewheeling diode and load inductor. On the other hand, the turn-off oscillation frequency is found to be determined by the output parasitic capacitance of the SiC MOSFET and power loop parasitic inductance. Moreover, the shifting regularity of the turn-off maximum peak voltage with a varying switching speed is investigated on the basis of time domain simulation. The distortion of the turn-on current is theoretically analyzed. Finally, experimental results verifying the above calculations and analyses are presented.

• Proceedings of the KIPE Conference
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• 2009.11a
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• pp.155-157
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• 2009

This paper proposed a soft switching boost converter with an auxiliary circuit, and a modified control method for reduction of switch stress. The proposed converter applies an auxiliary circuit, which is added to the conventional boost converter and used to achieve soft switching for both a main switch and an auxiliary switch. The auxiliary circuit consist of a resonant inductor and two capacitors, an auxiliary switch. The main switch is operated ZVS turn-on, turn-off also auxiliary switch is operated ZCS turn-on, ZVS turn-off. The proposed soft switching boost converter has lower switch loss and higher efficiency than conventional soft switching boost converter.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.49 no.8
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• pp.463-467
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• 2000

In this paper, the new LIGBT structures with trap injection are proposed to improve switching characteristics of the conventional SOI LIGBT. The Simulations are performed in order to investigate the effects of the positiion, whidth and concentration of trap injection region with a reduced minority carrier lifetime using 2D device simulator MEDICI. Their electrical characteristics are analyzed and the optimum design parameters are extracted. As a result of simulation, the turn off time for the model A with the trap injection is $0.78\mus$. These results indicate the improvement of about 2 times compared with the conventional SOI LIGBT because trap injection prevents minority carriers which is stored in the n-drift region during turn off switching. The latching current is $1.5\times10^{-4}A/\mum$ and forward blocking voltage is 168V which are superior to those of conventional structure. It is shown that the trap injection is very effective to reduce the turn off time with a little increasing of on-state voltage drop if its design and process parameters are optimized.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.25 no.3
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• pp.40-49
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• 2011

This paper presents novel circuit topology of half-bridge soft-switching PWM inverter type DC-DC high power converter for DC bus feeding power plants. The proposed DC-DC power converter is composed of a typical voltage source-fed, half-bridge high frequency PWM inverter with a high frequency planar transformer link PWM control scheme and parallel capacitive lossless snubbers. The operating principle of the new DC-DC converter treated here is described by using switching mode-equivalent circuits, together with its unique features. All the active power switches in the half-bridge arms and input DC bus lines can achieve ZCS turn-on and ZVS turn-off commutation transitions. The total turn-off switching losses of the power switches can be significantly reduced. As a result, high switching frequency IGBTs can actually be selected in the frequency range of 40[kHz] under the principle of soft-switching. The performance evaluations of the experimental setup are illustrated practically.

• Proceedings of the KIPE Conference
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• 2010.07a
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• pp.487-488
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• 2010

This paper proposes a soft switching boost converter with an auxiliary circuit. This circuit helps a main switch operate as a soft switching. The main switch operates ZVS turn-on and ZVS turn-off. And the auxiliary switch operates ZCS turn-on and ZVS turn-off. In this paper, operation modes are analyzed and soft switching operation is verified through simulations.

• Journal of Power Electronics
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• v.17 no.1
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• pp.41-55
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• 2017

This study proposes a novel zero voltage transition (ZVT) pulse width modulation (PWM) DC-DC interleaved boost converter with an active snubber cell. All the semiconductor devices in the converter turn on and off with soft switching to reduce the switching power losses and improve the overall efficiency. Through the interleaved approach, the current stresses of the main devices and the ripple of the output voltage and input current are reduced. The main switches turn on with ZVT and turn off with zero voltage switching (ZVS). The auxiliary switch turns on with zero current switching (ZCS) and turns off with ZVS. In addition, the snubber cell does not create additional current or voltage stress on the main switches and main diodes. The proposed converter can smoothly achieve soft switching characteristics even under light load conditions. The theoretical analysis and operating stages of the proposed converter are made for the D > 50% and D < 50% modes. Finally, a prototype of the proposed converter is implemented, and the experimental results are given in detail for 500 W and 50 kHz. The overall efficiency of the proposed converter reached 95.5% at nominal output power.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.06a
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• pp.22-23
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• 2006

Proton irradiation technology was used for improvement of switching characteristics of the PT-IGBT. Proton irradiation was carried out at 5.56 MeV energy with $1{\times}10^{12}/cm^2$ doze from the back side of the wafer. Characterization of the device was performed by I-V, breakdown voltage, threshold voltage, and turn-off delay time measurement. For irradiated device by 5.56 MeV energy, the breakdown voltage and the threshold voltage were 730 V and 6.5~6.6 V, respectively. The turn-off time has been reduced to 170 ns, which was original $6\;{\mu}s$ for the un-irradiated device.