• International Journal of Reliability and Applications
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• v.13 no.1
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• pp.19-35
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• 2012

This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.

• Industrial Engineering and Management Systems
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• v.14 no.2
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• pp.183-195
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• 2015

In this paper, we propose a two-stage group acceptance sampling plan for generalized inverted exponential distribution under truncated life test. Median life is considered as a quality parameter. Design parameters are obtained to ensure that true median life is longer than a given specified life at certain level of consumer's risk and producer's risk. We also explore situations under which design parameters based on median lifetime can be used for other percentile points. Tables and specific examples are reported to explain the proposed plans. Finally a real data set is analyzed to implement the plans in practical situations and some suggestions are given.

• Communications for Statistical Applications and Methods
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• v.17 no.1
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• pp.89-98
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• 2010

In this paper, a two-stage group sampling plan based on the time truncated life test is proposed for the Weibull distribution. The design parameters such as the number of groups and the acceptance number in each stage are determined by satisfying the producer's and consumer's risks simultaneously when the group size and the test duration are specified. The acceptable reliability level is expressed by the ratio of the true mean life to the specified life. It was demonstrated from the comparison with single-stage group sampling plans that the proposed plan can reduce the average sample number or improve the operating characteristics.

• Communications for Statistical Applications and Methods
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• v.17 no.5
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• pp.725-731
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• 2010

Economic Reliability test plans(ERTP) are proposed considering that the life time of the submitted items follow the Pareto distribution of the second kind. For various specified acceptance number, sample size and producer's risk, a minimum test termination time is obtained. A comparison of proposed plan has been made with the existing plan developed by Aslam et al. (2010). The results are explained by tables and example.

• Communications for Statistical Applications and Methods
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• v.17 no.3
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• pp.319-326
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• 2010

In this paper, a new group sampling plan for the lot acceptance is proposed for the time truncated life test, which can be utilized when multi-item testers are implemented. The design parameters are found using the two-point approach such that the producer's and consumer's risks are satisfied simultaneously at the acceptable reliability level and the lot tolerance reliability level, respectively. The case of Weibull distribution is described to illustrate the procedure that can be used when the quality level is expressed by a multiple of the specified life. The advantage of the proposed plan is demonstrated by comparing with the existing plan in terms of the sample size required. The tables are constructed and some examples are given to illustrate the procedure developed here.

• Communications for Statistical Applications and Methods
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• v.18 no.4
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• pp.403-411
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• 2011

This paper deals with a group acceptance sampling plan for time truncated tests which are based on the total number of failures from the whole group assuming that the life time of an item follows the Dagum (inverse Burr) distribution. This study is developed when a multiple number of items as a group can be tested simultaneously in a tester. The minimum number of groups required for a given group size and acceptance number is determined such that the producer and consumer risks are satisfied simultaneously at the specified quality level, while the termination time and the number of testers are specified. Comparisons are made between the proposed plan and the existing plan on the basis of size of the groups. Two real examples are provided.

• Proceedings of the International Microelectronics And Packaging Society Conference
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• 2002.05a
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• pp.117-120
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• 2002

In this paper, several methods to predict the solder joint shape are studied. Although there are various methods to predict the solder joint shape, such as truncated sphere method, force-bal tranced analytical solution, and energy-based methods like surface evolver developed by Ken Brakke, we calculate solder joint shape of $\mu$BGA by two solder joint shape prediction methods(truncated sphere method and surface evolver) and then compare results of each method. The results in dicate that two methods can accurately predict the solder joint shape in an accurate range. After that, we calculate reliability solder joint shape under thermal cycle test by FEA program ANSYS. As a result, it could be found that optimal solder joint shape calculated by solder joint prediction method has best reliability in thermal cycle test.

• Journal of Applied Reliability
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• v.4 no.1
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• pp.15-26
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• 2004

Life test is performed to set a confidence (lower) limit on the mean or median life of items if the number of failures at the end of the fixed time t does not exceed a given number c. Gupta(1962) propose a sampling plan for truncated life tests when the life distribution of an item is normal or lognormal distribution. In this paper, based on the result of Gupta(1962), we propose a sampling plan for failure rate test when an item has normal or lognormal life distribution. We assume that the shape parameter is known while the location parameter is unknown.

• Industrial Engineering and Management Systems
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• v.11 no.4
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• pp.390-396
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• 2012

The present paper extends the idea of tightened-normal-tightened sampling scheme to group acceptance sampling plans under the time truncated life tests. We consider three famous distributions that are widely used in the area of reliability such as the generalized exponential distribution, the Weibull distribution, and the Birnbaum-Saunders distribution in the proposed sampling plan. The plan parameters are determined such that the producer's risk and the consumer's risk are satisfied at the specified median life. Extensive tables showing plan parameters are provided at various values of the experiment time and the consumer's risk for each of three distributions for the practical use. Some examples are given to illustrate the procedure of the proposed plan.

• Journal of Life Science
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• v.17 no.3 s.83
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• pp.356-361
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• 2007

To investigate the region of ErbB2 for the $ErbB2-{\beta}-catenin$ interaction, a proteasome $resistant-{\beta}-catenin$ and various ErbB2 constructs were transfected in COS7 cells. ErbB2 proteins were immunoprecipitated, and coimmunoprecipitated ${\beta}-catenin$ was examined by Western blotting. ${\beta}-catenin$ coimmunoprecipitated with full length ErbB2. Of the truncated ErbB2 proteins DT (1-1123), DHC (1-1031) and DK (1-750), the ErbB2 constructs containing the kinase domain, DT and DHC, precipitated together with ${\beta}-catenin$ but DK containing no kinase domain did not. To further test the requirement of the kinase domain for ${\beta}-catenin-ErbB2$ interaction, the presence of ${\beta}-catenin$ in the immunocomplex was examined following transfection with an ErbB2 mutant (${\triangle}750-971$) whose kinase domain is internally deleted and subsequent immunoprecipitation of the ErbB2 mutant. ${\beta}-catenin$ was not detected in the immunocomplex. These results suggest that the ErbB2 kinase domain comprises a potential site for ${\beta}-catenin$ binding to the receptor tyrosine kinase.