• Journal of the Korean Solar Energy Society
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• v.37 no.1
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• pp.15-23
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• 2017

Critical heat flux refers to the sudden decrease in boiling heat transfer coefficient between a heated surface and fluid, which occurs when the phase of the fluid near the heated surface changes from liquid to vapor. For this reason, critical heat flux is an important factor for determining the maximum limit and safety of a boiling heat transfer. Recently, it is reported that the nanofluid is used as a working fluid for the critical heat flux enhancement. However, it could be occurred nano-flouling phenomena on the heat transfer surface due to nanoparticles deposition, when the nanofluid is applied in a heat transfer system. In this study, we experimentally carried out the effects of the nano-fouling phenomena in oxidized multi-wall carbon nanotube and oxidized graphene nanofluid systems. It was found that the boiling heat flux decreased by hourly 0.04 and $0.03kW/m^2$, also the boiling heat transfer coefficient decreased by hourly 11.56 and $10.72W/m^2{\cdot}K$, respectively, in the thermal fluid system using oxidized multi-wall carbon nanotube or oxidized graphene nanofluid.

• Proceedings of the Korean Vacuum Society Conference
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• 2015.08a
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• pp.239.1-239.1
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• 2015

1차원 탄소나노재료이며 한 겹의 흑연을 말아 놓은 형태인 단일벽 탄소나노튜브(Single-walled carbon nanotubes, SWNTs)는 감긴 형태에 따라 반도체성, 금속성 성질을 나타내는 특이성과 우수한 기계적 성질을 지니고 있어 광범위한 분야로 응용이 기대되어왔다. 이러한 SWNTs의 응용가능성을 실현시키기 위해서는 보다 경제적, 산업적인 면에서 손쉬운 합성방법의 개발이 필요한 실정이다. SWNTs의 합성 방법들로는 아크방전법과 레이저 증발법, 그리고 열화학기상증착법(Thermal chemical vapor deposition, TCVD) 등이 이용되었다. 이 중 TCVD법은 대면적의 균일한 CNTs를 합성할 수 있다는 장점이 있다. 그러나 탄화수소가스를 효율적으로 분해하기 위하여 $800^{\circ}C$ 이상의 고온 공정이 요구되며, 이는 경제적, 산업적인 면에서 사용이 제한적이다. 따라서 저결함, 고수율의 SWNTs를 저온합성 할 수 있는 공정의 개발이 지속적으로 필요하다. 본 연구에서는, TCVD법을 이용하여 에틸렌 원료가스로 SWNTs의 저온합성 가능성을 확인하였다. 합성을 위한 기판과 촉매로는 실리콘 산화막 기판(SiO2/Si wafer)에 철 나노입자를 지닌 ferritin을 스핀코팅 후 산화하여 이용하였다. 저온합성 공정의 변수로는 합성온도와 원료가스인 에틸렌의 분율을 설정하여, 변수가 SWNTs의 결정성과 수율에 미치는 영향을 고찰하였다. 합성된 SWNTs의 분석의 용이함과 손지기(Chirality)의 제어를 위하여 나노 다공성 물질인 제올라이트(Zeolite)를 보조 기판으로 사용하였다. 실험결과 에틸렌 원료가스로 합성한 SWNTs는 $700^{\circ}C$ 부근의 저온에서도 합성이 가능함을 확인하였다. 또한 에틸렌 원료가스의 분율과 합성시간의 정밀한 제어를 통해 SWNTs의 합성온도를 더욱 감소시키는 것도 가능할 것으로 예상된다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.05d
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• pp.65-68
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• 2003

Recently, there is a growing concern on the photovoltaic effects using organic materials. This is a phenomena which converts the solar energy into the electrical one. We have fabricated a device structure of ITO/PEDOT:PSS/CuPc/$C_{60}$/BCP/Al. The PEDOT:PSS layer is made by spin coating. and the other organic layers are made by thermal vapor deposition. By measuring the current-voltage characteristics with an illumination of light. we have obtained a value of $V_{oc}$=0.358V and $J_{sc}$=0.338mA/$cm^2$. A fill factor and efficiency are about 0.271 and 0.033%, respectively. A 500W xenon lamp(ORIEL) was used for a light source, and the light intensity illuminated into the device was about 10mW.

• Journal of the Korea Computer Industry Society
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• v.8 no.1
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• pp.17-22
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• 2007

Carbon nanotubes (CNTs) were grown by a thermal chemical vapor deposition (CVD) method, which has been regarded as one of the most promising candidates for the synthesis of CNTs due to low cost and high growth yield. The Ethylene $(C_2H_4)$, hydrogen $(H_2)$ and Argon(Ar) gases were used for the growth of CNTs at $700^{\circ}C$. As a catalyst for CNTs growth, Fe thin film and Iron nitrate and Molybdenyl acetylacetonate solution with alumina nano-particle were prepared on $SiO_2/Si$ substrate. The growth properties of CNTs were analyzed by SEM and AFM.

• Korean Journal of Materials Research
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• v.6 no.5
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• pp.483-488
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• 1996

InP 기판위에 InP와 격자정합된 undoped-InGaAs에서 zine의 확산 특성을 Electrochemical Capacitance-Voltage 법(polaron)과 Secondary Ion Mass Spectrometry(SIMS)로 조사하였다. Metallorganic Chemical Vapor Deposition (MOCVD)를 이용하여 undoped-InGaAs 층을 성장시켰으며 확산방법으로는 Zn3P2 확산원 박막과 Rapid Thermal Annealing (RTA)를 이용하였다. 450-55$0^{\circ}C$온도범위에서 30-300초 동안 확산을 수행한 결과 zinc의 확산계수는 D=Doexp(-$\Delta$E/kT)의 특성을 만족하였으며, Do와 $\Delta$E는 각각 1.3x105$\textrm{cm}^2$/sec와 2.3eV였다. 얻어진 확산계수는 다른 확산방법을 이용한 값들에 비해 매우 큰 값인데, 이것은 RTA 처리시 빠른 온도 증가에 의한 확산원 박막, 보호막, 그리고 InGaAs 에피층이 가지는 열팽창계수의 차이로인한 응력의 효과에 의한 것으로 생각되며, 이를 sealed-ampoule 법을 사용한 경우의 확산특성과 비교를 통하여 확인할 수 있었다.

• Transactions on Electrical and Electronic Materials
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• v.6 no.5
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• pp.198-201
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• 2005

Photocurrent of a single-crystalline Si nanowire is investigated in this paper. Single-crystalline Si nanowires with amorphous $SiO_2$ shells were first synthesized from ball-milled SiO powders by thermal chemical vapor deposition, and then the amorphous $SiO_2$ shells were etched out from the as-synthesized Si nanowires. For a single-crystalline Si nanowire, photocurrent-voltage curves taken in air at room temperature were non-linear, and rapid photoresponses were observed when the light was switched on and off. The photocurrent was not changed in intensity under the illumination. Photocurrent mechanism in the single-crystalline Si nanowire is discussed in this paper.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.07a
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• pp.470-473
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• 2001

In this study, 70/30 mol% P(VDF-TrFE) copolymer thin films were prepared by physical vapor deposition, and dielectric properties with frequency were investigated. From results of TA(Thermal Analysis), the Curie transition temperature and melting temperature were observed at 118.8$^{\circ}C$ and 146$^{\circ}C$, respectively. Therefore, while thin films were prepared, the substrate temperature was varied from 30$^{\circ}C$ to 90$^{\circ}C$. The dielectric constant decreased with increasing frequency. At measuring frequency of 1kHz, the relative dielectric constant increased from 3.643 to 23.998 with increasing substrate temperature from 30$^{\circ}C$ to 90$^{\circ}C$. As a result of dielectric loss factor, ${\alpha}$-relaxation and ${\beta}$-relaxation were observed near at 100Hz and 1MHz, respectively. And the magnitude of ${\alpha}$-relaxation decreased and that of ${\beta}$-relaxation increased with increasing substrate temperature.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.09a
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• pp.52-59
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• 2001

The photoluminescence and the photo-current from p-type GaN films were investigated on both room- and low-temperatures for various Mg doping concentrations. At a low Mg doping level, there exists a photoluminescence center of the donor and the acceptor pair transition of the 3.28-eV band. This center is correlated with the defects for a shallow donor of the VGa and for an acceptor of MgGa. The acceptor level shows the binding energy of 0.2-0.25 eV, which was observed by the photon energy of the photo-current signal of 3.02-3.31 eV. At a high Mg doping level, there is a photoluminescence center of a deep donor and an acceptor pair transition of the 2.76-eV blue band. This center is attributed to the defect structures of MgGa-VN for the deep donor and MgGa for the acceptor. For low. doped samples, thermal annealing provides an additional photo-current signal for an unoccupied deep acceptor levels of 0.87-1.35 eV above valence band, indicating the p-type activation.

• Journal of the Korean institute of surface engineering
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• v.36 no.2
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• pp.135-140
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• 2003

The difference in lattice parameter and thermal expansion coefficient between GaN and Si which results in many defects into the grown GaN is larger than that between GaN and sapphire. In order to obtain high quality GaN films on Si substrate, it is essential to understand growth characteristics of GaN. In this study, GaN layers were grown on Si(111) substrates by MOCVD at three different GaN growth temperatures ($900^{\circ}C$, $1,000^{\circ}C$ and $1,100^{\circ}C$), using AlN and LT-GaN buffer layers. Using TEM, we carried out the comparative investigation of growth characteristics of GaN by characterizing lattice coherency, crystallinity, orientation relationship and defects formed (transition region, stacking fault, dislocation, etc). The localized region with high defect density was formed due to the lattice mismatch between AlN buffer layer and GaN. As the growth temperature of GaN increases, the defect density and surface roughness of GaN are decreased. In the case of GaN grown at $1,100^{\circ}$, growth thickness is decreased, and columns with out-plane misorientation are formed.

• Korean Journal of Materials Research
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• v.13 no.7
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• pp.442-446
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• 2003

Tin dioxide ($SnO _2$) thin films were deposited at $375^{\circ}C$ on alumina substrate by metal-organic chemical vapor deposition. A few hillocks like a cauliflower were observed and the number of hillock on thin film surface increased with annealing temperature in air atmosphere. The oxygen content and the binding energy during air annealing at$ 500^{\circ}C$ came to close the stoichiometric $SnO_2$. The cauliflower hillocks seem to be the result of the continuous migration of the tiny grains to release the stress of an expanded grain. Sensitivity of CO gas depended on annealing temperature and increased with increasing annealing temperature.