• 제목/요약/키워드: thermal reliability

검색결과 1,065건 처리시간 0.032초

컴플라이언트 메커니즘의 신뢰성 기반 위상최적설계 (Reliability Based Topology Optimization of Compliant Mechanisms)

  • 임민규;박재용;한석영
    • 한국생산제조학회지
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    • 제19권6호
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    • pp.826-833
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    • 2010
  • Electric-thermal-structural actuated compliant mechanisms are mechanisms onto which electric voltage drop is applied as input instead of force. This mechanism is based on thermal expansion of material while being heated. Compliant mechanisms are designed subjected to electric charge input using BESO(bi-directional evolutionary structural optimization) method. Reliability-based topology optimization (RBTO) is applied to the topology design of actuators. performance measure approach (PMA), which has probabilistic constraints that are formulated in terms of the reliability index, is adopted to evaluate the probabilistic constraints. In this study, BESO method is used to obtain optimal topology of compliant mechanisms from initial design domain. PMA approach is used to evaluate reliability index. The procedure has been tested in numerical applications and compared with the results obtained by other methods to validate these approaches.

이방성 전도 필름을 이용한 플립칩 패키지의 열피로 수명 예측 및 강건 설계 (Robust Design and Thermal Fatigue Life Prediction of Anisotropic Conductive Film Flip Chip Package)

  • 남현욱
    • 대한기계학회논문집A
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    • 제28권9호
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    • pp.1408-1414
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    • 2004
  • The use of flip-chip technology has many advantages over other approaches for high-density electronic packaging. ACF (anisotropic conductive film) is one of the major flip-chip technologies, which has short chip-to-chip interconnection length, high productivity, and miniaturization of package. In this study, thermal fatigue lift of ACF bonding flip-chip package has been predicted. Elastic and thermal properties of ACF were measured by using DMA and TMA. Temperature dependent nonlinear hi-thermal analysis was conducted and the result was compared with Moire interferometer experiment. Calculated displacement field was well matched with experimental result. Thermal fatigue analysis was also conducted. The maximum shear strain occurs at the outmost located bump. Shear stress-strain curve was obtained to calculate fatigue life. Fatigue model for electronic adhesives was used to predict thermal fatigue life of ACF bonding flip-chip packaging. DOE (Design of Experiment) technique was used to find important design factors. The results show that PCB CTE (Coefficient of Thermal Expansion) and elastic modulus of ACF material are important material parameters. And as important design parameters, chip width, bump pitch and bump width were chose. 2$^{nd}$ DOE was conducted to obtain RSM equation far the choose 3 design parameter. The coefficient of determination ($R^2$) for the calculated RSM equation is 0.99934. Optimum design is conducted using the RSM equation. MMFD (Modified Method for feasible Direction) algorithm is used to optimum design. The optimum value for chip width, bump pitch and bump width were 7.87mm, 430$\mu$m, and 78$\mu$m, respectively. Approximately, 1400 cycles have been expected under optimum conditions. Reliability analysis was conducted to find out guideline for control range of design parameter. Sigma value was calculated with changing standard deviation of design variable. To acquire 6 sigma level thermal fatigue reliability, the Std. Deviation of design parameter should be controlled within 3% of average value.

언더필이 적용된 $\mu$p BGA 솔더 접합부의 열피로특성 (Thermal Fatigue Characteristics of $\mu$ BGA Solder Joints with Underfill)

  • 고영욱;김종민;이준환;신영의
    • Journal of Welding and Joining
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    • 제21권4호
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    • pp.25-30
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    • 2003
  • There have been many researches for small scale packages such as CSP, BGA, and Flipchip. Underfill encapsulant technology is one of the latest assembly technologies. The underfill encapsulant could enhance the reliability of the packages by flowing into the gap between die and substrate. In this paper, the effects of underfill packages by both aspects of thermal and mechanical reliabilities are studied. Especially, it is focused to value board-level reliability whether by the underfill is applied or not. First of all, The predicted thermal fatigue lifes of underfilled and no underfilled $\mu$ BGA solder joints are performed by Coffin-Manson's equation and FEA program, ANSYS(version 5.62). Also, the thermal fatigue lifes of $\mu$ BGA solder joints are experimented by thermal cycle test during the temperature, 218K to 423k. Consequently, both experimental and numerical study show that $\mu$ BGA with underfill has over ten times better fatigue lift than $\mu$ BGA without underfill.

Thermal cycle하에서의 OSP 표면 처리된 BGA 패키지의 신뢰성 연구 (Reliability of BGA Package with OSP Surface Finish under Thermal Cycle)

  • 이종범;노보인;이영호;정승부
    • 대한용접접합학회:학술대회논문집
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    • 대한용접접합학회 2006년도 춘계 학술대회 개요집
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    • pp.206-208
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    • 2006
  • The reliability of BGA (ball grid array) package with OSP (organic surface preservative) surface finish under thermal cycle was investigated by using SEM (scanning electron microscopy), EDS(energy dispersive spectroscopy), image tool and ball shear test. The IMCs (intermetallic compounds) were increased with increasing number of thermal cycles. However, the shear strengths of solder ball were decreased with increasing number of thermal cycles. The order of solders which had the highest shear strength as follow: Sn-3.5wt%Ag-0.7wt%Cu, Sn-0.7wt%Cu, Sn-37wt%Pb.

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Considerations on the Long-term Reliability of On-line Partial Discharge Ceramic Sensor for Thermal Power Generators and its Demonstration in the Field

  • Sun, Jong-Ho;Youn, Young-Woo;Hwang, Don-Ha;Kang, Dong-Sik
    • Journal of Electrical Engineering and Technology
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    • 제7권1호
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    • pp.103-108
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    • 2012
  • The present study describes the considerations on the long-term reliability of the on-line partial discharge (PD) ceramic sensor for thermal power generators. Voltage acceleration aging tests were carried out under continuous and impulsive thermal aging at more than $100^{\circ}C$, considering the practical service environment. Experimental results show that the sensors have a life that could last for more than 100 years, excellent dielectric characteristics, and insulation strength. In addition, the ceramic on-line PD sensors were installed in a thermal power generator in Korea for demonstration. The results of the PD calibration and test voltage application prove that the on-line ceramic sensors have satisfactory performances for on-line PD measurement.

견인전동기 고정자 코일의 열적 열화특성 (Properties of Thermal Performance on Stator Coil of Traction Motor by Accelerated Test)

  • 박현준;이장무;이한민;장동욱
    • 한국철도학회:학술대회논문집
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    • 한국철도학회 2003년도 추계학술대회 논문집(III)
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    • pp.606-610
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    • 2003
  • The 200 class insulation system which adopted to traction motor have excellent dielectric strength but weaken to thermal stress therefore deterioration phenomena analysis according to thermal stress is necessary. Accelerated thermal aging tests have been used to determine thermal reliability of stator coils used as traction motor in electric multiple unit. The conventional aging test is carried on according to IEC 60034-18-31 and IEEE Std. 275-1992. Variation in insulation resistance, P.I, capacitance, dielectric loss($tan{\delta}$) and partial discharge are measured during the aging cycle. Sample coils for traction motor were tested by accelerated aging test which composed of heat, vibration and moisture. Reliability and expected life were evaluated on the insulation system for traction motor.

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열충격 시험을 통한 LED Package의 박리재현 및 특성에 관한 연구 (A Research on the reappearance of delamination and the characteristic of LED package by thermal shock test)

  • 장인혁;임홍우
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제13권3호
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    • pp.207-216
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    • 2013
  • This paper, we classified LED failure mechanisms that occur due to the delamination and analyzed each of the mechanism that gives the LED PKGs the effect. Usually, the LED is composed of several materials which are LED chips, gold wire, phosphor, epoxy resin, adhesive, reflector and lead frame. These different materials are usually delaminated in trouble conditions which are huge temperature difference, hot and humid or mechanical shocked. When the components are delaminated, a luminance will be lost and moisture be absorbed easily, a thermal resistance be increased attendantly. In this paper, we experimented to investigate failure mechanism of the thermal resistance and failure mechanism of the decrease of luminance that occur due to the delamination. A thermal shock test was performed to reproduce this phenomena by subjecting samples to a cold-hot cyclling process between $-30^{\circ}C$(15min) and $110^{\circ}C$(15min). The samples were inspected at 200, 600 and 1,000 cycles. We measured feature of LED using the spatial analyzer, optical microscope, thermal resistance, photometer, scanning electron microscope (SEM). As a result, the progression of the crack and the thermal resistance and decrease in luminance are proportional to number of thermal shock.

자동차 전장 보드용 고온 무연 솔더의 신뢰성 평가 (Evaluation on Reliability of High Temperature Lead-free Solder for Automotive Electronics)

  • 고용호;유세훈;이창우
    • 마이크로전자및패키징학회지
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    • 제17권4호
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    • pp.35-40
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    • 2010
  • 본 연구에서는 상용 고온 솔더 중 많이 쓰이고 있는 Sn-3.5Ag, Sn-0.7Cu, Sn-5.0Sb 솔더에 대한 열충격 시험, 열싸이클 시험, 고온 진동 복합 시험 신뢰성 평가를 하였다. 테스트 샘플을 제작하기 위해 Sn-3.5Ag, Sn-0.7Cu, Sn-5.0Sb 솔더볼을 ENIG 표면 처리된 BGA에 접합하였으며, 그 후 BGA샘플을 OSP 표면 처리된 PCB에 실장 하였다. 신뢰성평가 동안 저항변화를 측정하였으며 신뢰성 평가 전후 전단강도 시험을 통하여 접합강도의 변화를 평가하였다. Sn-3.5Ag의 솔더인 경우 전기저항과 접합강도의 저하가 비교 평가한 3가지 솔더 중 가장 높은 저하율을 보였으며 Sn-0.7Cu의 솔더가 신뢰성 평가 후에 비교적 높은 안정성을 나타내었다.

NCP 적용 COB 플립칩 패키지의 신뢰성 연구 (Study on the Reliability of COB Flip Chip Package using NCP)

  • 이소정;유세훈;이창우;이지환;김준기
    • 마이크로전자및패키징학회지
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    • 제16권3호
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    • pp.25-29
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    • 2009
  • COB(chip-on-board) 플립칩 패키지에 있어서 NCP(non-conductive paste)의 적용성을 확보하기 위해 자체 포뮬레이션한 NCP와 상용 NCP에 대하여 보드레벨 플립칩 패키지를 제작하고 고온고습 및 열충격 신뢰성을 평가하였다. 실험결과 보다 작은 입도의 용융 실리카를 첨가한 NCP 시제품들이 고온고습 신뢰성에 유리한 것을 알 수 있었다. 또한, NCP 접속부에 있어서 열응력에 의한 피로보다 흡습에 의한 에폭시의 팽창이 접속부 파손에 보다큰 영향을 미치는 것으로 나타났으며, NCP의 접착강도가 높을수록 NCP 플립칩 패키지의 열충격 신뢰성이 향상되는 것을 알 수 있었다.

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용접부 비파괴 검사의 신뢰성 비교: 화력 발전소의 보일러 수냉벽 배관 사례연구 (Comparative Reliability of Nondestructive Testing for Weld: Water Wall Tube in Thermal Power Plant Boiler Case Study)

  • 최창덕;임익성
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제18권3호
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    • pp.240-249
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    • 2018
  • Purpose: The purpose of this research is to find which technique, between the PAUT (Phased array ultrasonic test) that has been used widely in practice and RT (Radiographic test) that was used widely in the past, has the higher reliability as a non-destructive testing of welding points in water wall tubes. Methods: To evaluated the reliability of non-destructive testing, eleven test pieces that were fabricated intentionally, which have the most frequently occurred defect types in water wall tubes and then both the PAUT and RT were performed on those eleven test pieces to compare their reliability. Results: The differences of type of defect, length are occurred due to the characteristics of nondestructive testing. The RT could not detect the lack of fusion defect type in specimen #4 and #8 while PAUT could not detect the lateral crack and 1 mm size small porosity in specimen #11. Conclusion: It is concluded that applying both the RT and PAUT result the best reliability rather than applying only one test method, if it is possible, in nondestructive testing of weld water wall tube in thermal power plant boiler case.